A multiplexer selects one of a first to a fourth data signal in response to a first to a fourth pulse. The first to fourth pulses respectively correspond to the first to fourth data signals and sequentially toggle. The multiplexer includes: (1) a NAND gate that receives the first data signal, a fourth complementary data signal that is a complementary signal of the fourth data signal, and the first pulse and outputs a first gate signal and (2) a NOR gate that receives the first data signal, the fourth complementary data signal, and a first complementary pulse that is complementary to the first pulse and outputs a second gate signal. The first data signal corresponds to a rising edge of the first pulse, and the fourth complementary data signal corresponds to a rising edge of the fourth pulse.

An apparatus includes a first group of memory units and a second group of memory units coupled to a first data path and a second data path coupled to a controller, a first delay element on the first data path coupled to the second group of memory units and configured to send, from the controller to the second group of memory units, signals for write and read operations in a sequence of time cycles delayed by a time cycle with respect to the first group of memory units, and a second delay element on the second data path and coupled to the first group of memory units and configured to send, from the first group of memory units to the controller, test result signals delayed by a time cycle, the delayed test result signals having a matching delay to the delayed write and read operations.

The disclosure relates to a method and system for memory testing to detect memory errors during operation of a memory module. Example embodiments include a method of detecting an error in a memory module (101), the method comprising the sequential steps of: i) receiving (302) a request from a processor executing an application for a read or write operation at a location of the memory module (101) identified by an address; ii) outputting data (304) from, or writing to, the location of the memory module (101); iii) generating (306) by an error detection module (102) a further read request for the location of the memory module (101) identified by the address; iv) receiving (307) at the error detection module (102) an error correction code from the memory module (101) for the location identified by the address; and vi) providing (311) by the error detection module (102) an alert output for the address if the error correction code indicates an error.

A single-phase clocked data multiplexer (MUX-D) scan capable flipflop (FF) design that improves over existing transmission-gate (t-gate) based master-slave flipflops in terms of dynamic capacitance (Cdyn) as well as performance while remaining comparable in area. Unique features of the design are a complementary metal oxide semiconductor (non-t-gate) style structure with an improvement in circuit parameters achieved by eliminating clock inversions and maximally sharing NMOS devices across NAND structures. The core of the flipflop adopts an all CMOS NAND, And-OR-Inverter (AOI) complex logic structure to implement a true edge-triggered flip-flop functionality.

A renaming unit configured to rename source operands of instructions in a group. A renaming register maintains architectural to physical register mappings. Architectural to physical register mappings propagate from the renaming register through a chain of update units (U) over bus lines denoted with the architectural registers 0 to L. Update units (U) sequentially, in program order, insert physical register identifiers PR(i) allocated to instructions I(i) with destination operands DOP(i) on bus lines denoted with the destination operands DOP(i). Source operands of an instruction I(i) may be renamed to physical register identifiers after physical register identifiers allocated to instructions older than I(i) are sequentially, in program order, inserted on the bus lines, but before physical register identifiers allocated to I(i) and younger instructions are inserted on the bus lines. A source operand SOP(i) is renamed to a physical register identifier that propagates on a bus line denoted with SOP(i).

A fixed time-delay circuit of a high-speed interface is disclosed. The fixed time-delay circuit comprises: a counter circuit for generating a shift selection signal of any bit; a data selector circuit for receiving first parallel data signals and rearranging the first parallel data signals according to the shift selection signal and a first low-speed clock to obtain second parallel data signals; a clock selector circuit for selecting, according to the shift selection signal, one clock from multiple input clocks having different phases, for outputting, to form a second low-speed clock; and a synchronization circuit for synchronizing the second parallel data signals according to the second low-speed clock. According to the circuit, initialization alignment among multichannel data of the high-speed interface can be achieved.

A transmitter circuit that receives parallel signals and outputs a serial signal in response to the parallel signals may include; a clock generator generating first clock signals having different respective phases, a multiplexer including selection circuits respectively configured to selectively provide at least two of the parallel signals to an output node in response to at least two of the first clock signals, and an output driver generating the serial signal by amplifying a signal at the output node.

A serializer clock delay optimization system comprising a multiplexer configured to receive two or more low-rate data signals and a multiplexer control signal. The multiplexer generates a full-rate data signal by combining the two or more low-rate data signals such that the multiplexer control signal determines sampling time of the low-rate data signals. A data monitor monitors and evaluates the full-rate data signal to generate a quality value representing the quality of the full-rate data signal. The quality of the full-rate data signal is based on the accuracy of the sampling time of the low-rate data signals. A delay controller processes the quality value to generate a delay control signal or value. A delay receives a clock signal and the delay control signal or value. Responsive to the delay control signal or value, the delay modifies the timing of the clock signal to create the multiplexer control signal.

A pin state configuration circuit, a method for configuring pin states and an electronic device for configuring pin states are provided. The pin state configuration circuit includes a configured resistor load, a voltage sampling unit, and a comparator. The voltage sampling unit supplies a reference voltage to the configured resistor load by using a first or second configuration pin, and respectively samples voltages of the first and second configuration pins. The comparator calculates a first voltage ratio based on the voltage of the first configuration pin and the voltage of the second configuration pin, calculates a second voltage ratio based on the voltage of the first configuration pin and the voltage of the second configuration pin, and determines a corresponding pin configuration state based on the first and second voltage ratios. In this way, N×N pin configuration states may be obtained by configuring two configuration pins.

In examples, a system includes a differential input device having a first input and a second input. The system includes a window generator configured to output, at a first output, a first voltage above a reference voltage and a second voltage, at a second output, below the reference voltage. The system includes a multiplexer coupled to the first output and the second output, the multiplexer configured to receive the first voltage, the second voltage, and an input voltage. The system includes a selector coupled to the multiplexer and configured to select the first voltage, the second voltage, or the input voltage based on a value of the input voltage, where the selector is configured to cause the multiplexer to provide the selected voltage to the first input of the differential input device, where a voltage source provides the reference voltage to the second input of the differential input device.