An image pickup apparatus comprising a pixel configured to convert optical signal into an electrical signal, a comparison unit configured to compare a pixel signal from the pixel with a reference voltage, an A/D conversion unit configured to analog/digital (A/D)-convert the pixel signal in a conversion mode selected based on a comparison result of the comparison unit, and a correction unit configured to correct at least one of an offset and a gain generated by the A/D conversion for an output data of the A/D conversion unit, wherein a value for offset correction or gain correction performed by the correction unit is changed according to the selected conversion mode.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into first digital codes. A first converter circuitry in the converter circuitries performs a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate first and second valid signals, and determines whether to set the second digital code to be a first predetermined digital code or a second predetermined digital code according to the first and the second valid signals. The second valid signal is a delay signal of the first valid signal.

An analog-to-digital converter system includes a digital-to-analog converter for generating calibration voltages based on digital input codes, and an analog-to-digital converter, connected to the digital-to-analog converter, for receiving the calibration voltages from the digital-to-analog converter, for receiving sampled voltages, for generating digital output codes based on the calibration voltages, and for generating digital output codes based on the sampled voltages. The analog-to-digital converter system may have a lookup table, connected to the analog-to-digital converter, for storing the first digital output codes in association with the digital input codes. A method of calibrating an analog-to-digital converter system is also disclosed.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into a plurality of first digital codes, in which a first converter circuitry in the converter circuitries is configured to perform a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate control signals, and determines whether to set the second digital code to be a second corresponding digital code in predetermined digital codes according to the control signals.

Disclosed herein are related to systems and methods for a successive approximation analog to digital converter (SAR ADC). In one aspect, the SAR ADC includes a calibration circuit configured to receive some or all of the plurality of bits corresponding to the input voltage and accumulates or averages at least some of the bits corresponding to the input voltage. The calibration circuit is configured to provide a first offset signal to control a first offset associated with a first comparator, a second offset signal to control a second offset associated with a second comparator, or reduce an offset difference associated with the first offset and the second offset.

An electronic device may include an electronic display having multiple display pixels to display an image based on analog voltage signals. The electronic device may also include optical calibration circuitry to generate digital-to-analog converter (DAC) data based on image data associated with the image and dither circuitry to reduce a bit-depth of the DAC data, generating dithered DAC data. Additionally, the electronic device may include a gamma generator having one or more DACs to generate the analog voltage signals based on the dithered DAC data, which may instruct the gamma generator to generate the analog voltage signals indicative of the image data.

Described are apparatus and methods for fractional synchronization using direct digital frequency synthesis (DDFS). A DDFS device includes a memory with N address spaces, a write port circuit configured to sequentially write a digital desired pattern into the N address spaces, a read port circuit configured to readout the digital desired pattern from the N address spaces using continuous sequential automatic addressing from 0 to N−1 at a memory operating frequency clock, where the memory operating frequency clock is based on a sampling frequency clock used for high-speed data processing, and an analog signal processing circuit configured to process a readout digital desired pattern into an analog representation; and output a synthesized frequency clock from the analog representation to a digital core, where the synthesized frequency clock is fractionally synchronized with the sampling frequency clock.

An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.

In described examples, a circuit includes a calibration engine. The calibration engine generates multiple input codes. A digital to analog converter (DAC) is coupled to the calibration engine, and generates a first calibration signal in response to a first input code of the multiple input codes. An analog to digital converter (ADC) is coupled to the DAC, and generates multiple raw codes responsive to the first calibration signal. A storage circuit is coupled to the ADC and stores a first output code corresponding to the first input code. The first output code is obtained using the multiple raw codes generated by the ADC.

Described are apparatus and methods for fractional synchronization using direct digital frequency synthesis (DDFS). A DDFS device includes a memory with N address spaces, a write port circuit configured to sequentially write a digital desired pattern into the N address spaces, a read port circuit configured to readout the digital desired pattern from the N address spaces using continuous sequential automatic addressing from 0 to N−1 at a memory operating frequency clock, where the memory operating frequency clock is based on a sampling frequency clock used for high-speed data processing, and an analog signal processing circuit configured to process a readout digital desired pattern into an analog representation; and output a synthesized frequency clock from the analog representation to a digital core, where the synthesized frequency clock is fractionally synchronized with the sampling frequency clock.