An apparatus for reducing or removing a direct current (DC) offset voltage from one or more analog signals is disclosed. An analog signal may be received by an integrator. The integrator may integrate the analog signal to determine a DC offset error signal. The apparatus may integrate, invert, and amplify the DC offset error signal to provide an analog correction signal. The analog correction signal may be inverted and subtracted from the analog signal. In some implementations, the apparatus may include multiple, independent circuits to reduce or remove DC offset voltages from differential signals.

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

A first calibration measures capacitor array mis-match and updates a Look-Up Table (LUT) with calibrated weights that are copied to both a positive LUT and a negative LUT, and then adjusted for non-linearity errors by a second calibration using a Least Mean-Square (LMS) method. The binary code in the Successive-Approximation Register (SAR) is complemented to generate a complement code with a sign bit. When the sign bit is positive, entries for complement code bits=1 are read from the positive LUT and summed, a first offset added, and the sum normalized to get a corrected code. When the sign bit is negative, entries for complement code bits=0 are read from the negative LUT and summed, a second offset added, and the sum normalized to get the corrected code. A Multi-Variable Stochastic Gradient Descent method generates polynomial coefficients that further correct the corrected code.

An electronic device includes a precision reference circuit, which contains a bandgap reference circuit and an offset-correction circuit. The bandgap reference circuit has an output that is coupled to provide a bandgap reference voltage and an intermediate node that is separated from the output by a transimpedance resistor. The offset-correction circuit is coupled to the bandgap reference circuit and includes a DAC. The DAC is coupled to the intermediate node and is also coupled to receive an external digital value. The external digital value determines a fraction of a correction current that will be passed by the DAC.

A sigma-delta modulator includes an N-bit quantization circuit that generates a stream of N-bit code words and a feedback signal path with an N-bit DAC circuit, having a non-ideal operation due to mismatch error, that converts the stream of N-bit code words to generate a feedback signal. A digital DAC copy circuit provides a digital replication of the N-bit DAC circuit. The digital replication accounts for the non-ideal operation of the N-bit DAC circuit 126 due to mismatch error, and converts the stream of N-bit code words to generate a stream of P-bit code words, where P>N, that are functionally equivalent to the feedback signal output from the N-bit DAC circuit.

A method for analog-to-digital conversion with reconfigurable function mapping for acceleration of calculating an activation function of a neural network system includes determining, by a shared circuit, a set of voltage intervals using digital bits in a look-up table to define a shape of the activation function being mapped. The shared circuit determines a set of most significant bits (MSBs) for each voltage interval by storing additional bits in the look-up table corresponding to each voltage interval entry. Further, each of several per-neuron circuits determines whether its accumulated input voltage is in a received voltage interval, and if so, causing the set of MSBs to be stored. Each of the per-neuron circuits determines a set of least significant bits (LSBs) by performing a linear interpolation over the voltage interval. The set of MSBs and the set of LSBs are output as a result of the activation function with analog-to-digital conversion.

A sensor circuit includes at least one ring oscillator having a supply port supplied by at least one current source and a reference frequency. A comparator compares a frequency output of the at least one ring oscillator with the reference frequency to yield a measurement, such as a temperature measurement.

A sigma-delta modulator includes an N-bit quantization circuit that generates a stream of N-bit code words and a feedback signal path with an N-bit DAC circuit, having a non-ideal operation due to mismatch error, that converts the stream of N-bit code words to generate a feedback signal. A digital DAC copy circuit provides a digital replication of the N-bit DAC circuit. The digital replication accounts for the non-ideal operation of the N-bit DAC circuit 126 due to mismatch error, and converts the stream of N-bit code words to generate a stream of P-bit code words, where P>N, that are functionally equivalent to the feedback signal output from the N-bit DAC circuit.

A transition state acquisition device includes an oscillator that includes a tapped delay line and a combination circuit provided on a signal path from one end to the other end of the tapped delay line, and oscillates based on a first signal, and a latch that captures and holds an output signal of the tapped delay line in synchronization with a second signal. The oscillator starts a transition of a state of the tapped delay line based on the first signal. An interval between timings at which the latch captures the output signals of the tapped delay line is shorter than a time during which the state transition of the tapped delay line makes one round.

In described examples, a circuit includes a calibration engine. The calibration engine generates multiple input codes. A digital to analog converter (DAC) is coupled to the calibration engine, and generates a first calibration signal in response to a first input code of the multiple input codes. An analog to digital converter (ADC) is coupled to the DAC, and generates multiple raw codes responsive to the first calibration signal. A storage circuit is coupled to the ADC and stores a first output code corresponding to the first input code. The first output code is obtained using the multiple raw codes generated by the ADC.