In an example embodiment, a circuit is provided that includes a current source with a calibrated trim circuit whose output current varies with transconductance of the current source, and tracks a current mismatch between the current source and another current source under varying bias currents and temperatures. The trim circuit may include at least one calibration digital to analog converter (CAL DAC), which may be driven by a bias circuit generating current proportional to the transconductance of the current source. In an example embodiment, the trim circuit may include at least two CAL DACs, whose output current may vary with bias current only, and with bias current and temperature. A method to calibrate the CAL DACs includes varying calibration settings of the CAL DACs under different bias currents until the output current of the trim circuit substantially accurately tracks the current mismatch under disparate bias currents and temperatures.

Techniques for facilitating analog-to-digital converter calibrations are provided. In one example, a method includes, for each of a plurality of time instances, generating a first ramp signal started at the time instance relative to a respective start of a first counter signal and generating a respective comparator output signal based on the first ramp signal and a first threshold signal. The method further includes capturing a respective first value of the first ramp signal in response to a transition of the respective comparator output signal. The method further includes determining a respective second counter value of a second counter signal based on the respective first value. The method further includes determining a scaling factor based on the second counter values and the time instances. Each of the first values is associated with the same counter value of the first counter signal. Related devices and systems are also provided.

Approaches provide for calibrating high speed analog-to-digital converters (ADCs). For example, a calibration signal can be applied to parallel ADCs. The output of the parallel ADCs can be analyzed using a set of filtering components configured to at least filter image components and cause a phase shift in the output signals. One or more delay adjustment components can cause a delay to at least the output of the parallel ADCs and the set of filtering components. A cross-correlating component can be utilized to cross-correlate the output of the parallel ADCs with an output signal of at least one filtering component of the set of filtering components and an output signal of at least one delay adjustment component of the set of delay adjustment components. A conversion component determines polar coordinates from rectangular coordinates from the output of the cross-correlating component. Thereafter, a time-offset and gain estimator component can determine one of gain error calibration data or time-offset calibration data based at least in part on an output signal of the conversion component, which can be stored and/or used to calibrate individual time-interleaved ADCs.

A time-interleaved analogue-to-digital converter including a first analogue-to-digital converter and a second analogue-to-digital converter, each arranged to sample a respective analogue input periodically and produce a respective digital output based on the sampled analogue input, and also including a signal interleaving portion, arranged to combine the digital outputs to produce a digital output signal. The time-interleaved analogue-to-digital converter is configured for operation both in an operational mode and a calibration mode. In the operational mode, the second analogue-to-digital converter is arranged to sample the analogue input a first time period after the first analogue-to-digital converter samples the analogue input. In the calibration mode, the second analogue-to-digital converter is arranged to sample the analogue input simultaneously with the first analogue-to-digital converter, or a second time period apart from a time at which the first analogue-to-digital converter samples the analogue input. The second time period is shorter than the first time period.

A transition state acquisition device includes an oscillator that includes a tapped delay line and a combination circuit provided on a signal path from one end to the other end of the tapped delay line, and oscillates based on a first signal, and a latch that captures and holds an output signal of the tapped delay line in synchronization with a second signal. The oscillator starts a transition of a state of the tapped delay line based on the first signal. An interval between timings at which the latch captures the output signals of the tapped delay line is shorter than a time during which the state transition of the tapped delay line makes one round.

An electronic device may include a ramp signal generator suitable for generating a ramp signal having a slope corresponding to an analog gain, and a slope correction circuit suitable for correcting the slope based on a correction code signal.

An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code.

A sensor circuit includes at least one ring oscillator having a supply port supplied by at least one current source and a reference frequency. A comparator compares a frequency output of the at least one ring oscillator with the reference frequency to yield a measurement, such as a temperature measurement.

According to various embodiments, a multi-slope converter can have the following: an integrator circuit having a charge store; a clocked comparator; a sensor circuit having a capacitor arrangement and a charging circuit for pre-charging the capacitor arrangement, a discharging circuit; a switch arrangement and a controller circuit for actuating the switch arrangement based on a clock signal; wherein the controller circuit is set up to actuate the switch arrangement such that, alternately: in an integration cycle electrical charge is transferred from the capacitor arrangement of the sensor circuit to the charge store of the integrator circuit, and in a deintegration cycle the charge store of the integrator circuit is discharged by means of the discharging circuit, wherein after the integration cycle a residual charge remains stored in the charge store of the integrator circuit and is taken into consideration during a subsequent integration cycle.

A circuit device includes a code data generation circuit that generates code data which changes with time, and a successive approximation type A/D conversion circuit that performs code shift based on the code data and performs A/D conversion of an input signal. The code data generation circuit generates error data of which a frequency characteristic has a shaping characteristic and converts the error data into the code data.