A self-calibration-function-equipped AD converter that does not require a measurement device for calibration includes: a control unit including a calibration control unit configured to control an operation of calibrating the self-calibration-function-equipped AD converter, and a conversion control unit configured to control an operation of converting an input voltage to be subjected to conversion into a digital signal; a reference voltage unit configured to output a reference voltage; and an integration/conversion unit including an integrating unit configured to generate an integration voltage obtained by integrating two or more types of unit voltages, a comparator that has two inputs and is configured to compare the integration voltage and the input voltage or the reference voltage, and a crossbar switch configured to switch a connection depending on whether the integration voltage is to be input to one input of the comparator and the input voltage or the reference voltage is to be input to another input, or the input voltage or the reference voltage is to be input to the one input of the comparator and the integration voltage is to be input to the other input.

A fingerprint signal processing system for a fingerprint sensor includes a calibration control circuit, a register circuit, a decode circuit and a normalization circuit. The calibration control circuit is configured to receive a background calibration control signal and an image signal from the fingerprint sensor, and convert the image signal into a plurality of digital signals according to a plurality of offsets. When the background calibration control signal is at a high level, the calibration control circuit is configured to read a plurality of calibration parameters from the register circuit.

In one aspect, an integrated circuit (IC) includes a magnetic-field sensor. The magnetic-field sensor includes digital circuitry that includes a first and second analog-to-digital converter (ADC). The digital circuitry is configured to receive a first and second analog output signals and, using the first and second ADC, configured to convert the first and second analog output signals to a first and second digital signals. The magnetic-field sensor also includes diagnostic circuitry configured to receive, from the digital circuitry, an input signal related to the first and/or the second digital signals and configured to provide a test signal at a pin of the IC. In response to a range parameter, the diagnostic circuitry is further configured to provide the test signal comprising a range of codes from the first and/or the second ADC corresponding to the range parameter.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. An auto-correlator generates a sign of a correlation error for a pair of ADC digital outputs. SAR bits are tested with the correlation sign bit determining when to add or subtract SAR bits. First all pairs are calibrated in a first level of a binary tree of mux-correlators. Then skews between remote pairs and groups are calibrated in upper levels of the binary tree using auto-correlators with inputs muxed from groups of ADC outputs input to the binary tree of mux-correlators. The binary tree of mux-correlators can include bypasses for odd and non-binary values of N. Sampling clock and component timing skews are reduced to one LSB among both adjacent channels and remote channels.

An analog-to-digital converter, configured to convert an input signal into an n bits digital output signal, includes a capacitor module, a control signal generation unit, a comparator, and a register. The capacitor module is configured to receive the input signal at a sampling phase in a normal mode, and to generate a first sampling signal and a second sampling signal according to the input signal in a conversion phase. The control signal generation unit is configured to adjust the first sampling signal or the second sampling signal in the conversion phase. In the normal mode, the comparator is configured to compare the first sampling signal and the second sampling signal in the conversion phase to generate n comparison signals. The register is configured to store the n comparison signals as the digital output signal, and output the digital output signal in the normal mode.

A successive-approximation register analog-to-digital converter (SAR ADC), a correction method and a correction system are provided. The SAR ADC generates an original weight value sequence according to multiple original weight values. The SAR ADC converts an analog time-varying signal to establish a transforming curve corresponding to the original weight values. In addition, the SAR ADC generates an offset value sequence according to an offset of the transforming curve, uses the offset value sequence to correct the original weight value sequence to generate a corrected weight value sequence, and uses multiple corrected weight values of the corrected weight sequence to improve linearity of the transforming curve.

A successive-approximation register analog-to-digital converter (SAR ADC), a correction method and a correction system are provided. The SAR ADC generates an original weight value sequence according to multiple original weight values. The SAR ADC converts an analog time-varying signal to establish a transforming curve corresponding to the original weight values. In addition, the SAR ADC generates an offset value sequence according to an offset of the transforming curve, uses the offset value sequence to correct the original weight value sequence to generate a corrected weight value sequence, and uses multiple corrected weight values of the corrected weight sequence to improve linearity of the transforming curve.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

A successive approximation register (SAR) analog-to-digital converter (ADC) includes a plurality of differential capacitive digital-to-analog converters (C-DACs), comparators, and an SAR controller. Each differential C-DAC comprises a pair of C-DACs for positive and negative polarities and each C-DAC comprises a capacitor array. A capacitor for each bit position may include a pair of equal-sized capacitors. Each outer comparator is coupled to one of the differential C-DACs and the middle comparator is coupled to a differential output node pair of C-DACs from two differential C-DACs. The SAR controller generates a control signal for the differential C-DACs for each conversion step based on outputs of the comparators. The outputs of the comparators are provided to the differential C-DACs as the control signal without encoding. Single-bit/cycle shorting switches for shorting top plates of capacitors of the C-DACs of same polarity may be closed during a single-bit/cycle conversion.