The present invention discloses a DAC method having signal calibration mechanism. A first conversion circuit generates a first analog signal according to an input digital signal. A second conversion circuit generates a second analog signal according to the input digital signal and a pseudo-noise digital signal. An echo transmission circuit processes a signal on an echo path to generate an echo signal. A first and a second calibration circuits generate a first and a second calibration signals. A calibration parameter calculation circuit performs calculation according to a difference between the echo signal and a sum of the first and the second calibration signals and related path information to generate a first and a second offsets. The first and the second calibration circuits converge first and second response coefficients and update a first and a second codeword offset tables according to the first and the second offsets.

An example apparatus includes: an analog input; a resistor circuit including a first reference output and a second reference output; a first amplifier including a first analog input, a first reference input, and a first amplifier output, the first analog input coupled to the analog input, the first reference input coupled to the first reference output; a second amplifier including a second analog input, a second reference input, and a second amplifier output, the second analog input coupled to the analog input, the second reference input coupled to the second reference output; a first comparator including a first comparator input, the first comparator input coupled to the first amplifier output; and a second comparator including a second comparator input, the second comparator input coupled to the second amplifier output; a first multiplexer including a first multiplexer input and a first residue output, the first multiplexer input coupled to the first amplifier output; and a second multiplexer including a second multiplexer input and a second residue output, the second multiplexer input coupled to the second amplifier output.

An electronic device may include an electronic display having multiple display pixels to display an image based on analog voltage signals. The electronic device may also include optical calibration circuitry to generate digital-to-analog converter (DAC) data based on image data associated with the image and dither circuitry to reduce a bit-depth of the DAC data, generating dithered DAC data. Additionally, the electronic device may include a gamma generator having one or more DACs to generate the analog voltage signals based on the dithered DAC data, which may instruct the gamma generator to generate the analog voltage signals indicative of the image data.

The present disclosure relates generally to techniques for linearizing a digital-to-analog converter (DAC) in a continuous-time sigma-delta ADC. A sigma-delta ADC may be configured with a multibit quantizer for various applications. These applications may require wide-bandwidth high-resolution high-linearity power-efficient ADCs. In some embodiments, a mismatch of a multibit DAC might result in a bottleneck for achieving high linearity performance. Some linearization techniques may achieve high linearity performance. However, for a high-speed sigma-delta ADC, the DAC is configured to be part of a feedback loop. Existing linearization techniques often increase the delay in the feedback loop, which is not desired. Various aspects of the present disclosure provide improvement to linearization techniques by changing the references of the multibit quantizer. As a result, this reduces delay in the feedback loop of the sigma-delta modulator, which is beneficial for high-speed sigma-delta ADCs.

The present disclosure relates generally to techniques for linearizing a digital-to-analog converter (DAC) in a continuous-time sigma-delta ADC. A sigma-delta ADC may be configured with a multibit quantizer for various applications. These applications may require wide-bandwidth high-resolution high-linearity power-efficient ADCs. In some embodiments, a mismatch of a multibit DAC might result in a bottleneck for achieving high linearity performance. Some linearization techniques may achieve high linearity performance. However, for a high-speed sigma-delta ADC, the DAC is configured to be part of a feedback loop. Existing linearization techniques often increase the delay in the feedback loop, which is not desired. Various aspects of the present disclosure provide improvement to linearization techniques by changing the references of the multibit quantizer. As a result, this reduces delay in the feedback loop of the sigma-delta modulator, which is beneficial for high-speed sigma-delta ADCs.

In described examples, a circuit includes a multiplexer. The multiplexer receives an input voltage and a calibration signal. An analog-to-digital converter (ADC) is coupled to the multiplexer and generates an output code in response to the calibration signal. A storage circuit is coupled to the ADC and stores the input code representative of the calibration signal at an address corresponding to the output code. The stored input code includes an index value and a coarse value.

An analog-to-digital converter (ADC) is described. This ADC includes a conversion circuit with multiple bit-conversion circuits. During operation, the ADC may receive an input signal. Then, the conversion circuit may asynchronously perform successive-approximation-register (SAR) analog-to-digital conversion of the input signal using the bit-conversion circuits, where the bit-conversion circuits to provide a quantized representation of the input signal. For example, the bit-conversion circuits may asynchronously and sequentially perform the SAR analog-to-digital conversion to determine different bits in the quantized representation of the input signal. Moreover, the ADC may selectively perform self-calibration of a global delay of the bit-conversions circuits. Note that the timing self-calibration may be iterative and subject to a constraint that a maximum conversion time is less than a target conversion time.

A residue transfer loop, a successive approximation register analog-to-digital converter and a gain calibration method are disclosed. In particular, the residue transfer loop includes a sampling switch module, a logic controlling circuit, a residue holding capacitor module, a DAC capacitor array, a residue transfer module, a current rudder, a reset switch module and a charge sharing switch module. The logic controlling circuit sequentially outputs control signals according to preset time intervals in a preset period to control the reset switch module, the residue transfer module, the sampling switch module and the charge sharing switch module to work sequentially, thereby realizing a residue transfer.

A time-interleaved Analog-to-Digital Converter, ADC, system is provided. The time-inter-leaved ADC system includes time-interleaved first and second ADC circuits and a switching circuit. The switching circuit is configured to selectively supply an analog input signal for digitization to at least one of the first ADC circuit, the second ADC circuit or ground, and to selectively supply an analog calibration signal to at least one of the first ADC circuit, the second ADC circuit or ground. Further, the time-interleaved ADC system includes an output circuit configured to selectively generate, based on least one of a first digital signal output by the first ADC circuit and a second digital signal output by the second ADC circuit, a digital output signal.

A non-linearity correction circuit includes a non-linearity coefficient estimation circuit. The non-linearity coefficient estimation circuit includes a data capture circuit, a non-linearity term generation circuit, a time-to-frequency conversion circuit, a bin identification circuit, a residual non-linearity conversion circuit, and a non-linearity coefficient generation circuit. The non-linearity term generation circuit is coupled to the data capture circuit. The time-to-frequency conversion circuit is coupled to the data capture circuit and the non-linearity term generation circuit. The bin identification circuit is coupled to the time-to-frequency conversion circuit. The residual non-linearity conversion circuit is coupled to the bin identification circuit. The non-linearity coefficient generation circuit is coupled to the bin identification circuit and the residual non-linearity conversion circuit.