An open-loop digital-to-analog converter (DAC) circuit may include a delta-sigma modulator, a decode block responsive to the delta-sigma modulator configured to perform a DAC decode operation, a plurality of DAC elements responsive to the DAC decode operation, an analog output driver responsive to the plurality of DAC elements, a test signal generator configured to generate a test signal that is responsive to inputs of the plurality of DAC elements, and a synchronizer configured to enable replication of the test signal at an external test system coupled to the open-loop DAC circuit in order to generate a matching test signal at the external test system that matches the test signal generated by the test signal generator.

A first calibration measures capacitor array mis-match and updates a Look-Up Table (LUT) with calibrated weights that are copied to both a positive LUT and a negative LUT, and then adjusted for non-linearity errors by a second calibration using a Least Mean-Square (LMS) method. The binary code in the Successive-Approximation Register (SAR) is complemented to generate a complement code with a sign bit. When the sign bit is positive, entries for complement code bits=1 are read from the positive LUT and summed, a first offset added, and the sum normalized to get a corrected code. When the sign bit is negative, entries for complement code bits=0 are read from the negative LUT and summed, a second offset added, and the sum normalized to get the corrected code. A Multi-Variable Stochastic Gradient Descent method generates polynomial coefficients that further correct the corrected code.

A residue transfer loop, a successive approximation register analog-to-digital converter and a gain calibration method are disclosed. In particular, the residue transfer loop includes a sampling switch module, a logic controlling circuit, a residue holding capacitor module, a DAC capacitor array, a residue transfer module, a current rudder, a reset switch module and a charge sharing switch module. The logic controlling circuit sequentially outputs control signals according to preset time intervals in a preset period to control the reset switch module, the residue transfer module, the sampling switch module and the charge sharing switch module to work sequentially, thereby realizing a residue transfer.

The present application discloses an ADC (10). The ADC has an A/D conversion operation mode and a measurement operation mode. The ADC includes an input terminal (100), a DAC (104), and an output terminal (102). The input terminal is configured to receive an analog signal. The output terminal is configured to output a digital signal. The DAC includes a plurality of D/A conversion units. When the ADC operates in the A/D conversion operation mode, the ADC is configured to convert the analog signal into the digital signal, and when the ADC operates in the measurement operation mode, the digital signal related to a ratio of a capacitance of the D/A conversion unit to be measured to a total capacitance of the plurality of D/A conversion units.

An open-loop digital-to-analog converter (DAC) circuit may include a delta-sigma modulator, a decode block responsive to the delta-sigma modulator configured to perform a DAC decode operation, a plurality of DAC elements responsive to the DAC decode operation, an analog output driver responsive to the plurality of DAC elements, a test signal generator configured to generate a test signal that is responsive to inputs of the plurality of DAC elements, and a synchronizer configured to enable replication of the test signal at an external test system coupled to the open-loop DAC circuit in order to generate a matching test signal at the external test system that matches the test signal generated by the test signal generator.

A non-linearity correction circuit includes a non-linearity coefficient estimation circuit. The non-linearity coefficient estimation circuit includes a data capture circuit, a non-linearity term generation circuit, a time-to-frequency conversion circuit, a bin identification circuit, a residual non-linearity conversion circuit, and a non-linearity coefficient generation circuit. The non-linearity term generation circuit is coupled to the data capture circuit. The time-to-frequency conversion circuit is coupled to the data capture circuit and the non-linearity term generation circuit. The bin identification circuit is coupled to the time-to-frequency conversion circuit. The residual non-linearity conversion circuit is coupled to the bin identification circuit. The non-linearity coefficient generation circuit is coupled to the bin identification circuit and the residual non-linearity conversion circuit.

A method for calibrating a successive-approximation analog-to-digital converter (ADC) includes configuring the successive-approximation ADC in a calibration mode of operation. The method includes, while in the calibration mode of operation: determining a digital code corresponding to a programmable capacitance of the successive-approximation analog-to-digital converter, and storing the digital code corresponding to the programmable capacitance in a storage element of an integrated circuit die including the successive-approximation ADC. The programmable capacitance may be a gain tuning capacitance, a bridge tuning capacitance, an offset capacitance, or a monotonicity tuning capacitance.

An electronic circuit comprises an input voltage circuit, an analog-to-digital converter (ADC) circuit, and logic circuitry. The input voltage circuit is configured to generate multiple input voltages. The ADC circuit is configured to convert the multiple input voltages to first digital values using the first longer ADC acquisition time and convert the multiple input voltages to second digital values using the second shorter ADC acquisition time. The logic circuitry is configured to determine calibration information for the ADC circuit using the first digital values and the second digital values, and scale analog-to-digital (A/D) conversion results of the ADC circuit using the calibration information.

The present application discloses an ADC (10). The ADC has an A/D conversion operation mode and a measurement operation mode. The ADC includes an input terminal (100), a DAC (104), and an output terminal (102). The input terminal is configured to receive an analog signal. The output terminal is configured to output a digital signal. The DAC includes a plurality of D/A conversion units. When the ADC operates in the A/D conversion operation mode, the ADC is configured to convert the analog signal into the digital signal, and when the ADC operates in the measurement operation mode, the digital signal related to a ratio of a capacitance of the D/A conversion unit to be measured to a total capacitance of the plurality of D/A conversion units.

It is provided a provided a time-interleaved analog-to-digital converter (ADC) system comprising an input port configured to receive an analog signal, an ADC-array comprising M, M2, ADCs arranged in parallel. Each ADC is configured to receive and to convert a portion of the analog signal into a digital signal at a sample rate f.sub.s. The ADC-system further comprises a reference ADC configured to receive and to convert the analog signal into a digital reference signal at an average sampling rate f.sub.ref lower than f.sub.s. Each sampling instant of the reference ADC corresponds to a sampling instant of an ADC in the array of ADCs, and the ADC to select for each reference ADC sampling instant is randomized over time. The ADC-system also comprises a correction module configured to adjust the digital signal outputs of the ADC-array into a corrected digital output signal based on samples of the digital reference signal and the digital signals from the corresponding selected ADCs. It is also provided a method for time-interleaved analog-to-digital conversion.