H03M1/1225

Phase aligned interleaved sampling of multiple data channels

Provided is a method for processing data samples from a plurality of data channels. The method may include obtaining a plurality of data samples from the plurality of data channels. Obtaining the plurality of data samples may involve successively obtaining a data sample from each data channel of the plurality of data channels. Successively obtaining a data sample from each data channel may be performed a plurality of times during a specified time period. Each data sample of the plurality of data samples may be associated with a respective sample time, and each respective sample time may be relative to a single specified reference point in time. The method may further include, for each data sample of the plurality of data samples, determining a time-dependent coefficient value that may correspond to the sample time associated with the data sample, and applying the determined time-dependent coefficient value to the data sample.

A/D CONVERSION CIRCUIT
20170338831 · 2017-11-23 ·

An A/D conversion circuit includes a reference voltage source to generate a calibration voltage, a multiplexer to receive an analog signal and the calibration voltage, and output the analog signal selected in a normal mode and the calibration voltage selected in a calibration mode or a self-diagnosis mode, an A/D converter to convert an output signal from the multiplexer into a digital signal, a non-volatile memory to hold the digital signal and calibration data, a digital calibration part to calibrate the digital signal in case of inputting the analog signal to the A/D converter in the normal mode based on the calibration data, and a self-diagnosis circuit to diagnose the A/D converter based on the digital signal in case of inputting the calibration voltage to the A/D converter in the self-diagnosis mode, and the digital signal stored in the non-volatile memory.

UNCALIBRATED THERMOCOUPLE SYSTEM
20170290616 · 2017-10-12 ·

Apparatus, including a multiplexer, having a first output and multiple first inputs receiving analog input signals and an analog feedback signal and cycling through and selecting the signals for transfer in sequential signal groupings to the first output. The apparatus also includes an amplification circuit, having a second output and a second input connected to the multiplexer first output, that amplifies signals corresponding to the analog input signals with a selected gain so as to generate respective amplified analog signals at the second output. Circuitry selects a characteristic of the respective amplified analog signals from an initial signal grouping, feeds the characteristic back for input to the multiplexer as the analog feedback signal, selects a subsequent characteristic of the respective amplified analog signals from a subsequent signal grouping, and adjusts the amplification circuit gain so that the analog feedback signal and the subsequent characteristic have the same amplitude.

SIGNAL PROCESSING DEVICE, PHOTOELECTRIC CONVERSION ELEMENT, IMAGE SCANNING DEVICE, IMAGE FORMING APPARATUS, AND METHOD OF PROCESSING SIGNAL
20170295298 · 2017-10-12 · ·

A signal processing device includes a first adjuster, a second adjuster, and a digitizer. The first adjuster coarsely adjusts an output range of a signal input to the first adjuster to output a first signal. The second adjuster adjusts an output range of a signal more finely than the first adjuster adjusts to output a second signal. The digitizer digitizes the first signal or the second signal to output a digital signal. The digital signal has an output range of a signal that is finely adjusted with the second adjuster after being coarsely adjusted with the first adjuster.

COMPUTE-IN-MEMORY DEVICES, SYSTEMS AND METHODS OF OPERATION THEREOF

A method can include, for each row of a nonvolatile memory (NVM) cell array, generating a multiply-accumulate (MAC) result for the row by applying input values on bit lines. Each MAC result comprising a summation of an analog current or voltage that is a function of each input value modified by a corresponding weight value stored by the NVM cells of the row. By operation of at least one multiplexer, one of the rows can be connected to an analog-to-digital converter (ADC) circuit to convert the analog current or voltage of the row into a digital MAC value. A storage element of each NVM cell can be configured to store a weight value that can vary between no less than three different values. Corresponding devices and systems are also disclosed.

Dynamic triggering and sampling engine (DTSE) for low-latency and cost effective control systems
09774341 · 2017-09-26 · ·

A Dynamic Triggering and Sample Engine (DTSE) that detects a first trigger received on a trigger input terminal that triggers a series of analog-to-digital conversions to be completed by an analog-to-digital converter circuit. The DTSE then determines a first sequence configuration stored in a sequence configuration table that is associated with the first trigger, causes a first analog-to-digital conversion to be performed using the first sequence configuration; causes a first analog-to-digital conversion result value to be stored in a sequence result table; and outputs an interrupt to a processor indicating that the first analog-to-digital conversion result value is available in the sequence result table. The interrupt is output from the DTSE before all remaining analog-to-digital conversions in the series are completed. In response to receiving the interrupt, the processor reads the analog-to-digital result value from the sequence result table via a bus.

TIME REGISTER
20170322520 · 2017-11-09 ·

A time register includes: a pair of inputs coupled to a pair of input clocks; a pair of tri-state inverters for producing a pair of level signals; and a pair of outputs coupled to the level signals for producing a pair of output clocks, wherein the tri-state inverters are responsive to a pair of state signals and the pair of input clocks for holding or discharging the level signals.

ANALOGUE-TO-DIGITAL CONVERSION

There is disclosed herein analogue-to-digital converter circuitry, comprising a set of sub-ADC units each for carrying out analogue-to-digital conversion operations, the set comprising a given number of core sub-ADC units for carrying out said given number of core conversion operations. Also provided is control circuitry operable, when a said sub-ADC unit is determined to be a defective sub-ADC unit, to cause the core conversion operations to be carried by the sub-ADC units of the set sub-ADC units other than the defective sub-ADC unit.

READOUT CIRCUIT, SIGNAL QUANTIZING METHOD AND DEVICE, AND COMPUTER DEVICE

Disclosed are a readout circuit, a signal quantizing method, a signal quantizing device, and a computer device. The readout circuit includes: a signal sampler, including a plurality of channels; a plurality of integrators, connected to the plurality of channels and having a one-to-one releationship with the plurality of channels; a signal processor, including a first operational amplifier, a sampling input of the first operational amplifier being connected to outputs of the plurality of integrators, respectively; and an analog-digital converter. An input of the analog-digital converter is connected to an output of the first operational amplifier.

Configuration of ADC Data Rates Across Multiple Physical Channels

An integrated circuit includes a set of N unit analog-to-digital converters (ADCs) having a common architecture, and which provide an aggregate data rate. Moreover, the integrated circuit includes control logic that selects subsets of the set of N unit ADCs in order to realize sub-ADCs of different data rates that can each be an arbitrary integer multiple of an inverse of N times the aggregate data rate of the N unit ADCs. Furthermore, the control logic may dynamically select the subsets on the fly or on a frame-by-frame basis. This dynamically selection may occur at boot time and/or a runtime. Additionally, the given different data rate may correspond to one or more phases of a multi-phase clock in the integrated circuit, where the multiphase clock may include a number of phases corresponding to a number of possible subsets, and given selected subsets may not use all of the available phases.