A multi-level signal generator includes a receiving circuit, a setting circuit, a data bit generating circuit and a digital-to-analog converter. The receiving circuit generates a first data bit based on an input data signal having two voltage levels that are different from each other. The setting circuit generates a flag signal based on a command signal. The flag signal is changed depending on an operation mode. The data bit generating circuit generates a plurality of internal bits based on the first data bit, selects at least one of the plurality of internal bits based on the flag signal, and outputs the selected internal bit as at least one additional data bit. The digital-to-analog converter generates an output data signal that is a multi-level signal having three or more voltage levels different from each other based on the first data bit and the at least one additional data bit.

A digitizing circuit includes a port connectable to a device under test (DUT), an integrating analog-to-digital converter (ADC), a high-speed ADC, one or more processors to apply a digital filter to output samples of the high-speed ADC to produce filtered samples, find differences between the filtered samples and samples from the integrating ADC to produce error values, and add the error values to the output samples of the high-speed ADC. A method of producing a digital signal includes receiving an input analog signal at an integrating analog-to-digital converter (ADC) and a high-speed ADC, applying a digital filter to output samples of the high-speed ADC to produce filtered samples, the digital filter matched to timing and filtering of the integrating ADC, finding differences between the filtered samples to output samples of the integrating ADC to produce error values, and adding the error values to the output samples of the high-speed ADC.

A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the data rate of the receiver. For example, more portions of each time-interleaved ADC may be enabled to support a higher data rate of the receiver and less portions of the ADCs may be used to support a lower data rate of the receiver.

Systems and methods directed to a quantum processing apparatus are provided. The apparatus comprises M solid-state qubits, where M>1, and control electronics, which are connected to the solid-state qubits. The control electronics comprise one or more qubit readout circuits, where each of the qubit readout circuits is connected to at least one of the solid-state qubits and comprises a downsampling analog-to-digital converter (hereafter DSADC). Each DSADC is configured to downsample analog signals obtained from the at least one of the solid-state qubits. Such a DSADC operates in the n.sup.th Nyquist zone of the spectrum of the analog signals obtained, so as to down-convert such analog signals from the n.sup.th Nyquist zone to the m.sup.th Nyquist zone of the spectrum, where n>m≥1, prior to sampling the analog signals to convert them into digital signals, in operation. One or more embodiments of the invention are further directed to a related method of operating such a quantum processing apparatus.

An integrated circuit includes an analog-to-digital converter (ADC) having selectable first and second analog channel inputs and a digital output. A window comparator coupled to the digital output. The window comparator configured to compare a digital value on the digital output to first and second threshold values. A programmable clock circuit configured to provide a clock signal to the ADC. A controller that, response to assertion of the trigger signal, is configured to generate a sample rate control signal to the clock circuit to cause the clock circuit to increase the frequency of the clock signal and toggle selection between the first and second analog channel inputs. A result comparison circuit having a comparison input coupled to the digital output. The result comparison circuit is configured to compare a first digital conversion output from the ADC toa second digital conversion output from the ADC.

A multi-level signal generator includes a receiving circuit, a setting circuit, a data bit generating circuit and a digital-to-analog converter. The receiving circuit generates a first data bit based on an input data signal having two voltage levels that are different from each other. The setting circuit generates a flag signal based on a command signal. The flag signal is changed depending on an operation mode. The data bit generating circuit generates a plurality of internal bits based on the first data bit, selects at least one of the plurality of internal bits based on the flag signal, and outputs the selected internal bit as at least one additional data bit. The digital-to-analog converter generates an output data signal that is a multi-level signal having three or more voltage levels different from each other based on the first data bit and the at least one additional data bit.

A light detection and ranging (lidar) receiver may include a first frequency filter to pass a first range of frequencies of an analog signal. The lidar receiver may include a second frequency filter to pass a second range of frequencies of the analog signal that is different from the first range of frequencies of the analog signal. The lidar receiver may include a first analog-to-digital converter (ADC) to derive a first digital signal based on the first range of frequencies of the analog signal using a first sampling rate. The lidar receiver may include a second ADC to derive a second digital signal based on the second range of frequencies of the analog signal using a second sampling rate that is different from the first sampling rate.

A sampling circuit includes: a first transmission line that transmits an input signal; a second transmission line that transmits a clock signal; and a plurality of sample-hold circuits that are connected to the first and second transmission lines at a constant line distance, wherein the first transmission line transmits the input signal at a first propagation time for each of the line distances, and the second transmission line transmits the clock signal at a second propagation time that is a sum of a preset sampling interval and the first propagation time for each of the line distances.

A Bluetooth receiver has an RF front end which has a gain control input, the RF front end converting wireless packets into a baseband signal which is coupled to the input of an analog to digital converter (ADC). A clock generator provides a clock coupled to the ADC, and an AGC processor performs an AGC process to provide a gain which places the baseband symbols in a range that is less than 90% of the input dynamic range of the ADC. When in a connected state, the clock generator provides a clock which is slower than is required to complete the AGC process during a preamble interval, and the AGC process uses a few initial bits of the address field. The remaining bits of the address field is compared with the corresponding address bits of the receiver to determine whether to receive the packet.

A circuit includes an amplifier having first and second inputs and an output, and a feedback circuit configured to generate a feedback voltage in response to a voltage at the output of the amplifier. The feedback circuit is coupled to the first input of the amplifier to provide the feedback voltage to the first input of the amplifier. An output circuit is configured to generate a variable bias current in response to the voltage at the output of the amplifier. A switch circuit is configured to switch the second input of the amplifier from receiving a first reference voltage during a first mode of operation to receiving a second reference voltage during a second mode of operation.