Systems and methods are disclosed for magnetoresistive asymmetry (MRA) compensation using a digital compensation scheme. In certain embodiments, a method may comprise receiving an analog signal at a continuous-time front end (CTFE) circuit, and performing analog offset compensation to constrain an extremum of the analog signal to adjust a dynamic range based on an input range of an analog-to-digital converter (ADC), rather than to modify the analog signal to have a zero mean. The method may further comprise converting the analog signal to a digital sample sequence via the ADC; performing, via a digital MRA compensation circuit, digital MRA compensation on the digital sample sequence; receiving, via a digital backend (DBE) subsystem, the digital sample sequence prior to digital MRA compensation; and generating, via a DBE, a bit sequence corresponding to the analog signal based on an output of the DBE subsystem and an output of the digital MRA compensation circuit.

A system suitable for reducing static or slow moving echoes from acoustic boundaries in a system such as pipe walls, blood vessels, tissue structures so that an image from flowing or time varying media such as water, oil, blood etc may be imaged more clearly, the system including an analog-to-digital converter for digitizing a received analog signal from a detector, means for digitally separating static or slow moving components of the digital signal, a digital-to-analog converter to provide an analog version of the separated static or slow moving components of the signal, and a subtractor to subtract the analog version of the static or the slow moving components of the signal from an analog signal received from a detector to produce an analog signal corresponding to the remaining flow components of the signal.

One example includes a voltage clamp circuit. The voltage clamp circuit includes a comparator loop circuit. The comparator loop circuit includes a comparator configured to compare an input voltage provided at an input node with a clamping voltage. The comparator loop circuit also includes a transistor network interconnecting a voltage rail and the input node. The comparator can be configured to activate the transistor network to set the input voltage to be approximately equal to the clamping voltage in response to the input voltage exceeding the corresponding clamping voltage.

An AD conversion circuit includes a comparator configured to compare an analog signal with a ramp signal and output a comparison result signal indicating a result of the comparison, and performs an AD conversion using the comparison result signal. In the comparison, a potential of the ramp signal changes with a lapse of time from a first potential to a second potential. Before the comparison, the potential of the ramp signal changes at a first change rate and then changes at a second change rate smaller than the first change rate, the potential of the ramp signal changes from the first potential to a third potential between the first potential and the second potential, and the comparator is reset in a state where the third potential is input to the comparator.

The present technology relates to signal processing device and method, an imaging element, and an electronic device capable of reducing a rise of costs. A signal processing device according to the present technology includes a measurement unit that performs measurement of a length of a period from an input start of a signal to a change of a value of the signal a plurality of times, retains measured values obtained by the measurement performed the plurality of times, sets an initial value of the measurement on the basis of any one of a plurality of the retained measured values, and performs the measurement by using the initial value. The present technology is applicable to an electronic circuit such as a flip-flop circuit and an A/D conversion unit, an imaging element such as a CMOS image sensor, and an electronic device such as a digital still camera, for example.

The present disclosure relates to a solid state image sensor and an electronic apparatus capable of performing a gain transition at high speed. A ramp generation circuit includes sample hold circuits and ramp generation DACs, the number of which depends on kinds of required gains (for example, two kinds, i.e. a low gain and a high gain). Then, the two sample hold circuits can individually hold gain DAC output voltages at the different gains. This enables a switch to the ramp generation DAC holding the required gain voltage by means of a ramp selection signal. The present disclosure can be applied, for example, to a CMOS solid state image sensor that is used for an imaging device.

Apparatuses and methods for image sensors with increased analog to digital conversion range are described herein. An example method may include disabling a first auto-zero switch of a comparator, the first auto-zero switch coupled to a ramp voltage input of the comparator, increasing, by a ramp generator, an auto-zero voltage level of a ramp voltage provided to the ramp voltage input of the comparator, and disabling a second auto-zero switch of the comparator, the second auto-zero switch coupled to a bitline input of the comparator.

A readout circuit includes a ramp generator for generating a plurality of first short ramps having a first level in a reset conversion phase and a plurality of second short ramps having a second level greater than the first level and a full-scale ramp having a third level greater than the second level in a signal conversion phase, a comparator for comparing a first analog signal with each one of the first short ramps to obtain a plurality of first comparison results in the reset conversion phase, and comparing a second analog signal with each one of the second short ramps and the full-scale ramp in the signal conversion phase to generate a plurality of second comparison results and a third comparison result, and a controller configured to determine an output signal value of the second analog signal according to the plurality of second comparison results and the third result.

A comparator includes a second stage coupled between a first stage and a third stage. The second stage includes a first transistor coupled to be switched in response to a first output signal coupled to be received from the first stage. The first transistor is coupled generate a second output signal coupled to be received by the third stage. A second transistor is coupled to the first transistor. The first and second transistors are coupled between a first supply voltage and a reference voltage. A second stage current of the second stage is conducted through the first transistor and the second transistor. The second transistor is coupled to be switched in response to a third output signal coupled to be received from the third stage in response to the second output signal.

An image sensor includes; a pixel array disposed in a Bayer pattern and including pixels which respectively generate electrical charge according to received light incident, and an analog logic configured to convert an analog signal output from at least one pixel among the pixels into a first digital code using analog-to-digital conversion, and convert the first digital code into a second digital code by adjusting low-order bits of the first digital code in response to a control signal.