An analog-to-digital circuit that digitizes an analog voltage. The analog-to-digital circuit includes plural comparators functionally connected to form a tree that has levels i, and each level i has branches j, and an encoder connected to the plural comparators and configured to generate a digitized value of an input analog voltage. Each comparator from a level i has first and second outputs, and each of the first and second outputs is electrically connected to an input of different comparators from a next level i+1 of the tree.

Provided is an AD converter, including: an analog signal input circuit, configured to be input with an analog input signal, and output a first analog output signal based on the analog input signal and a second analog output signal based on the analog input signal at different timing; an integral circuit, configured to integrate the first analog output signal and the second analog output signal and output the first integral signal and the second integral signal; a predictive circuit, configured to predict an integral signal output after the output by the integral circuit based on the first integral signal and the second integral signal output by the integral circuit, and output a predictive integral signal; and a quantization circuit, configured to generate a digital signal with the predictive integral signal quantized.

An ADC circuit (50) is disclosed. It comprises a global input configured to receive an input voltage (V.sub.in) and a plurality of converter circuits (105.sub.1-105.sub.N). Each converter circuit (105.sub.j) comprises a comparator circuit (70.sub.j) having a first input connected to the global input, a second input, and an output configured to output a one-bit output signal of the comparator circuit (70.sub.j). Furthermore, each converter circuit (105.sub.j) comprises a one-bit current-output DAC (110.sub.j) having an input directly controlled from the output of the comparator circuit (70.sub.j) and an output connected to the second input of the comparator circuit (70.sub.j). The second inputs of all comparator circuits are interconnected. The ADC circuit (50) further comprises a digital output circuit (130) configured to generate an output signal z[n] of the ADC circuit (50) in response to the one-bit output signals of the comparator circuits

A computing device in some examples includes an array of memory cells, such as 8-transistor SRAM cells, in which the read bit-lines are isolated from the nodes storing the memory states such that simultaneous read activation of memory cells sharing a respective read bit-line would not upset the memory state of any of the memory cells. The computing device also includes an output interface having capacitors connected to respective read bit-lines and have capacitance that differ, such as by factors of powers of 2, from each other. The output interface is configured to charge or discharge the capacitors from the respective read bit-lines and to permit the capacitors to share charge with each other to generate an analog output signal, in which the signal from each read bit-line is weighted by the capacitance of the capacitor connected to the read bit-line. The computing device can be used to compute, for example, sum of input weighted by multi-bit weights.

An analog to digital converter comprises an input for receiving an analog input signal; a plurality of outputs for outputting parallel bits of a digital signal that represents said analog input signal; and a neural network layer providing connections between each of said outputs respectively, each connection having an adjustable weighting. The synapses of the neural networks may be memristors and training may use online gradient descent.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

An embodiment target time comparison circuit corresponding to a target approximate voltage range among 2.sup.K time comparison circuits in a second comparison circuit compares a comparison operation time difference included in voltage comparison results regarding two adjacent approximate voltage ranges that are vertically adjacent to the target approximate voltage range with 2.sup.L reference times corresponding to 2.sup.L specific voltage ranges and generates a target binary code of L bits indicating a target specific voltage range including the held voltage from the obtained time comparison results.

A comparator configured to calibrate an offset according to a control signal, including an input circuit configured to receive a first input signal and a second input signal, and to generate a first internal signal corresponding to the first input signal and a second internal signal corresponding to the second input signal; a differential amplification circuit configured to consume a supply current flowing from a positive voltage node having a positive supply voltage to a negative voltage node having a negative supply voltage, and to generate an output signal by amplifying a difference between the first internal signal and the second internal signal; and a current valve configured to adjust at least a portion of the supply current based on the control signal.

A touch processing circuit includes: a front-end circuit including an amplifier, a first capacitor, a second capacitor, a third capacitor, and a plurality of switches each having two ends that are selectively connected each other, the front-end circuit being configured to process an input signal varying according to a touch; and a controller controlling the plurality of switches so that the front-end circuit is configured as a first circuit that accumulates deviation of the input signal between a first phase and a second phase during an integration period and a second circuit that converts the accumulated deviation into a digital signal during a conversion period.

Disclosed herein are related to systems and methods for a successive approximation analog to digital converter (SAR ADC). In one aspect, the SAR ADC includes a calibration circuit configured to receive some or all of the plurality of bits corresponding to the input voltage and accumulates or averages at least some of the bits corresponding to the input voltage. The calibration circuit is configured to provide a first offset signal to control a first offset associated with a first comparator, a second offset signal to control a second offset associated with a second comparator, or reduce an offset difference associated with the first offset and the second offset.