A multi-stage switched capacitor circuit and an operation method thereof are provided. The multi-stage switched capacitor circuit includes a first operational stage, a second operational stage and a third operational stage that are serially connected in order. Each operational stage operates in a sample phase or a hold phase and generates a detection signal indicating an end of the hold phase. The operation method of the multi-stage switched capacitor circuit includes: controlling the second operational stage to operate in the hold phase when the detection signal of the first operational stage indicates the end of the hold phase of the first operational stage, and the detection signal of the third operational stage indicates the end of the hold phase of the third operational stage.

Disclosed herein are some examples of algorithmic analog-to-digital converters (AADCs) that perform noise shaping. In particular, an AADC disclosed herein includes circuitry that can store residue(s) of one or more conversion cycles produced by the AADC and apply a value corresponding to the residue(s) to a subsequent conversion cycle. The AADC may perform a filtering procedure with the residue(s) to produce the value applied to the subsequent conversion. Applying the value to the subsequent conversion cycle can increase a signal-to-noise ratio of the signal that the AADC is converting in the subsequent conversion cycle.

Disclosed herein are some examples of algorithmic analog-to-digital converters (AADCs) that perform noise shaping. In particular, an AADC disclosed herein includes circuitry that can store residue(s) of one or more conversion cycles produced by the AADC and apply a value corresponding to the residue(s) to a subsequent conversion cycle. The AADC may perform a filtering procedure with the residue(s) to produce the value applied to the subsequent conversion. Applying the value to the subsequent conversion cycle can increase a signal-to-noise ratio of the signal that the AADC is converting in the subsequent conversion cycle.

A pipelined ADC system comprising: a first ADC stage comprising a trainable neural network layer and configured to receive an analog input signal, and convert it into a first n-bit digital output representing said analog input signal; a DAC circuit comprising a trainable neural network layer and configured to receive said first n-bit digital output, and convert it into an analog output signal representing said first n-bit digital output; and a second ADC stage comprising a trainable neural network layer and configured to receive a residue analog input signal of said analog input signal, and convert it into a second n-bit digital output representing said residue analog input signal; wherein said first and second n-bit digital outputs are combined to generate a combined digital output representing said analog input signal.

A pipelined ADC system comprising: a first ADC stage comprising a trainable neural network layer and configured to receive an analog input signal, and convert it into a first n-bit digital output representing said analog input signal; a DAC circuit comprising a trainable neural network layer and configured to receive said first n-bit digital output, and convert it into an analog output signal representing said first n-bit digital output; and a second ADC stage comprising a trainable neural network layer and configured to receive a residue analog input signal of said analog input signal, and convert it into a second n-bit digital output representing said residue analog input signal; wherein said first and second n-bit digital outputs are combined to generate a combined digital output representing said analog input signal.

A method for testing an A/D converter with a built-in diagnostic circuit with a user supplied variable input voltage includes generating a charge by a binary-weighted capacitor array responsive to an external voltage and a user specified code. The method further includes applying the charge to a first input of a voltage comparator and applying a bias voltage to a second input of the voltage comparator, and generating, by the voltage comparator, a comparison voltage responsive to the applied charge and the bias voltage. The method also includes applying the comparison voltage to an input of a successive approximation register and generating, by the successive approximation register, an approximate digital code responsive to the comparison voltage. The method also includes determining if at least one bit of the approximate digital code fails to toggle independent of adjacent bits.

An analog-to-digital converting system and a method with offset correction mechanisms are provided. The method includes steps of: obtaining a direct current offset of an output voltage of a digital analog conversion unit in a system; obtaining first capacitance weights and second capacitance weights sequentially from small to large; subtracting the direct current offset from a digital signal; and multiplying bit values of the digital signal respectively by the corresponding first capacitance weight value or second capacitance weight value to output a decode signal.

An apparatus comprises a plurality of analog front ends (AFEs) adapted to be coupled to a plurality of battery cells and configured to decrease voltages received from the plurality of battery cells to produce a plurality of AFE voltages. The apparatus further comprises at least one analog-to-digital converter (ADC) coupled to the plurality of AFEs and configured to convert the plurality of AFE voltages to a plurality of corresponding digital signals. The apparatus also comprises a plurality of digital channel registers coupled to the at least one ADC and configured to store the plurality of digital signals, and a processor coupled to the at least one ADC and configured to adjust, in a round-robin calculation scheme, the plurality of digital signals based on a plurality of common mode voltage values and a plurality of common mode to differential gain values associated with the plurality of AFEs.

An apparatus comprises a plurality of analog front ends (AFEs) adapted to be coupled to a plurality of battery cells and configured to decrease voltages received from the plurality of battery cells to produce a plurality of AFE voltages. The apparatus further comprises at least one analog-to-digital converter (ADC) coupled to the plurality of AFEs and configured to convert the plurality of AFE voltages to a plurality of corresponding digital signals. The apparatus also comprises a plurality of digital channel registers coupled to the at least one ADC and configured to store the plurality of digital signals, and a processor coupled to the at least one ADC and configured to adjust, in a round-robin calculation scheme, the plurality of digital signals based on a plurality of common mode voltage values and a plurality of common mode to differential gain values associated with the plurality of AFEs.

A pipelined ADC that does not wait for the residue of a signal to settle to be delivered to the next stage of the pipeline, and thus passes signals to subsequent stages at faster than conventional speeds is described. A pipelined ADC is used that processes signals representing the boundaries of the search space. Thus, each stage does not necessarily receive the signal as pre-processed by the prior stage, but rather the search space boundaries as pre-processed by the prior stage. Reducing the “search space” of the ADC is equivalent to creating the residues in each step of a pipeline as in the prior art. An ADC operating in this fashion operates without error even if the residual search space boundary outputs from one state are presented to the next stage before the outputs have settled, and can run faster for a given power and bandwidth.