A comparator circuit includes a zeroth capacitor having a first terminal fed with an input voltage, a zeroth inverter having an input terminal connected to a second terminal of the zeroth capacitor at a zeroth node, a first capacitor having a first terminal connected to the output terminal of the zeroth inverter at a first node, a first inverter having an input terminal connected to a second terminal of the first capacitor at a second node, a second inverter having an input terminal connected to the output terminal of the first inverter at a third node, a zeroth switch switching conduction between the zeroth and first nodes, a first switch switching conduction between the second and third nodes, a second switch switching conduction between the first and third nodes, and a third switch switching conduction between the third node and the output terminal of the second inverter.

Certain aspects of the present disclosure provide a digital-to-analog converter (DAC) system. The DAC system generally includes a plurality of current steering cells, each comprising a current source coupled to at least two current steering switches, wherein control inputs of the at least two current steering switches are coupled to an input path of the DAC system. The DAC system may also include a current source toggle circuit configured to selectively disable the current source of at least one of the plurality of current steering cells, and a feedforward path coupled between the input path and at least one control input of the current source toggle circuit.

Herein disclosed are some examples of metastability detectors and compensator circuitry for successive-approximation-register (SAR) analog-to-digital converters (ADCs) within delta sigma modulator (DSM) loops. A metastability detector may detect metastability at an output of a SAR ADC and compensator circuitry may implement a compensation scheme to compensate for the metastability. The identification of the metastability and/or compensation for the metastability can avoid detrimental effects and/or errors to the DSM loops that may be caused by the metastability of the SAR ADCS.

Methods, apparatuses, and systems for in-or near-memory processing are described. Bits of a first number may be stored on a number of memory elements, wherein each memory element of the number of memory elements intersects a bit line and a word line of a number of word lines. A number of signals corresponding to bits of a second number may be driven on the number of word lines to generate a number of output signals. A value equal to a product of the first number and the second number may be generated based on the number of output signals.

Methods, apparatuses, and systems for in-or near-memory processing are described. Bits of a first number may be stored on a number of memory elements, wherein each memory element of the number of memory elements intersects a bit line and a word line of a number of word lines. A number of signals corresponding to bits of a second number may be driven on the number of word lines to generate a number of output signals. A value equal to a product of the first number and the second number may be generated based on the number of output signals.

An analog-to-digital converter of successive approximation register (SAR) type includes a comparator, a SAR logic circuit, and a capacitor digital-to-analog converter. The capacitor digital-to-analog converter includes a plurality of drivers. Each driver includes a capacitor and a split inverter. A first capacitor node of the capacitor is connected to one of comparison input terminals. The split inverter includes a pull-up unit connected to a first reference voltage and a pull-down unit connected to a second reference voltage. The split inverter drives a second capacitor node of the capacitor by selectively turning on one of the pull-up unit and the pull-down unit. A first one of the pull-up unit and the pull-down unit includes a full transistor, and a second one of the pull-up unit and the pull-down unit includes a first split transistor and a second split transistor. A short current is reduced using the split inverter.

An analog-to-digital converting device configured to convert an analog signal into a digital signal, including a meta-stability detection unit configured to output a meta-stability signal based on a comparison result, wherein the comparison result is determined by comparing a comparison voltage of each bit of the digital signal with the analog signal; a counter configured to count a number of times that the comparison voltage of each bit of the digital signal is compared with the analog signal; and a control logic configured to detect a bit at which meta-stability has occurred from among bits of the digital signal based on the meta-stability signal and the counted number.

A successive-approximation analog-to-digital converter includes a sampling circuit for sampling an analog input signal to acquire a sampled voltage, and a regenerative comparator for comparing the sampled voltage with a succession of reference voltages to generate, for each reference voltage, a decision bit indicating the comparison result. The converter also includes a digital-to-analog converter which is adapted to generate the succession of reference voltages, in dependence on successive comparison results in the comparator, to progressively approximate the sampled voltage. The regenerative comparator comprises an integration circuit for generating output signals defining the decision bits, and a plurality of regeneration circuits for receiving these output signals. The regeneration circuits are operable, in response to respective control signals, to store respective decision bits defined by successive output signals from the integration circuit.

An analog-to-digital converter, including a sample/hold circuit; a reference voltage driver; a digital-to-analog converter; a comparator; and a logic circuit, wherein the reference voltage driver includes: a first voltage supplier circuit configured to output an external supply voltage provided from outside of the analog-to-digital converter; a second voltage supplier circuit configured to output a sampled reference voltage that is obtained during a sampling phase based on control signals received from the logic circuit; and a switching driver configured to electrically connect the first voltage supplier circuit to the digital-to-analog converter during a first conversion phase after the sampling phase based on the control signals received from the logic circuit, and to electrically connect the second voltage supplier circuit to the digital-to-analog converter during a second conversion phase based on the control signals received from the logic circuit.

A successive approximation register analog to digital converter includes a sampling circuitry, a comparator circuit, and a controller circuitry. The sampling circuitry generates first and second signals according to a sampled signal. The comparator circuit compares the first signal with the second signal to generate first decision signals. The controller circuitry generates digital codes according to the first decision signals, and controls the comparator circuit to perform comparisons repeatedly to generate second decision signals, in order to generate a digital output according to the digital codes, a statistical noise value, and the second decision signals. The controller circuitry further controls the sampling circuitry and the comparator circuit to perform comparisons repeatedly according to the sampled signal having an initial level during an initial phase, in order to generate third decision signals, and performs a statistical calculation to obtain the statistical noise value according to the third decision signals.