A digital-to-analog converter (DAC)-based voltage-mode transmit driver architecture. One example transmit driver circuit generally includes an impedance control circuit coupled to a plurality of DAC driver slices. The impedance control circuit generally includes a tunable impedance configured to be adjusted to match a load impedance for the transmit driver circuit. Another example transmit driver circuit generally has an output impedance that is smaller than the load impedance for the transmit driver circuit, such that an output voltage swing at differential output nodes of the transmit driver circuit is greater than a voltage of a power supply rail. Another example transmit driver circuit generally includes a predriver circuit with a first inverter coupled to a first output of the predriver circuit and a second inverter coupled to a second output of the predriver circuit, the transistors in at least one of the first inverter or the second inverter having different strengths.

The systems and methods discussed herein utilized a wireless or wired transceiver having a transmitter and a receiver. The transceiver is configured to reduce distortion contributions associated with echo cancelling. The transmitter provides a replica signal and a transmit signal. The replica signal and the transmit signal can be provided using a common switch.

A digital-to-analog converter for generating an analog output voltage in response to a digital value comprising a plurality of bits, the converter including: (i) a first switched resistor network having a first configuration and for converting a first input differential signal into a first analog output in response to a first set of bits in the plurality of bits; and (ii) a second switched resistor network, coupled to the first switched resistor network, having a second configuration, differing from the first configuration, and for converting a second input differential signal into a second analog output in response to a second set of bits in the plurality of bits.

The present invention provides a reference voltage buffer comprises a reference voltage generator, a first operational amplifier, a first transistor, a first group of resistors, a first load, a second transistor, a second group of resistors and a second load. In the reference voltage buffer, the first load and the second load use active device to increase the settling time, and the first load, the second load and the reference voltage generator of the reference voltage buffer are resigned to have the same characteristics in response to the temperature variation to overcome the PVT issue, and the first load and the second load of the reference voltage buffer use the open-loop design to have large full-scale of the output reference voltages.

An analog-to-digital converter may comprise a code voltage generating part that generates a conversion code voltage according to the conversion digital code; a voltage comparing part that generates a comparison result signal by comparing the input analog voltage and the conversion code voltage; a shifting register that receives a clock signal and generates a 1-st to a n-th control pulse signals; and a code generating part that generates the conversion digital code with receiving by comparison result signal and the 1-st to the n-th control pulse signals.

A method of expanding current steering Digital-to-Analog Converter (DAC) output amplitude and enhancing linearity performance. Level shifters with regulated supply and ground voltage are inserted before current source latches. Extra devices and small current are placed between switches and resistor load to enhance the linearity of current steering DAC.

A method of expanding current steering Digital-to-Analog Converter (DAC) output amplitude and enhancing linearity performance. Level shifters with regulated supply and ground voltage are inserted before current source latches. Extra devices and small current are placed between switches and resistor load to enhance the linearity of current steering DAC.

A digital-to-analog converter (DAC) for converting a digital input word to an analog output signal includes a string DAC, a first interpolator and a second interpolator. The string DAC outputs a first voltage and a second voltage in response to M most significant bits of the digital input word. The first interpolator interpolates between the first and second voltages in response to middle Q least significant bits of the digital input word and provides a first interpolated voltage. The second interpolator interpolates between the first interpolated voltage and the second voltage in response to lower P least significant bits of the digital input word.

An analog-to-digital conversion device and analog-to-digital conversion method thereof are provided. The analog-to-digital conversion device includes an analog circuit configured to output an analog input signal, and an analog-to-digital converter configured to receive the analog input signal and configured to outputting a digital output signal corresponding to the analog input signal with the use of first and second capacitor arrays, each of the first and second capacitor arrays including a first capacitor having a calibration capacitor connected thereto and a second capacitor having no calibration capacitor connected thereto, wherein the analog-to-digital converter is configured to calibrate the capacitance of the first capacitor by providing a first calibration voltage to the calibration capacitor and is configured to output the digital output signal corresponding to the analog input signal with the use of the calibrated capacitance of the first capacitor.

A voltage ladder is used to generate reference voltages. The voltage ladder is used by multiple digital-to-analog converters (DACs). In particular, the voltage ladder is used by multiple pulse-width modulation (PWM) DACs. Having multiple DACs utilize a common voltage ladder for their reference voltages reduces mismatched output voltages between DACs. Having multiple DACs utilize the common voltage ladder helps ensure that the reference voltages used by different DACs are not affected by process, voltage, and/or temperature variations in the reference voltages that would occur when using different voltage ladders for each DAC.