A method, apparatus and system are described providing a high dynamic range pixel. An integration period has multiple sub-integration periods during which charges are accumulated in a photosensor and repeatedly transferred to a storage node, where the charges are accumulated for later transfer to another storage node for output.

The present invention relates to a pixel sensor cell (1) for a CMOS sensor device comprising: —a photodiode (11) for generating photoelectrons; —a first transfer transistor (12) coupling the photodiode (11) with an intermediate node (IN) and configured to be controlled by a first control signal (TX.sub.1); —a gain reducing capacitance (C.sub.HD) applied on the intermediate node (IN); —a second transfer transistor (14) coupling the intermediate node (IN) with a sense node (SN) and configured to be controlled by a second control signal (TX.sub.2); —an output buffer (15) coupled with the sense node (SN) and configured to amplify a potential on the sense node (SN).

Imaging apparatus (2000, 2100, 2200) includes a photosensitive medium (2004, 2204) and an array of pixel circuits (302), which are arranged in a regular grid on a semiconductor substrate (2002) and define respective pixels (2006, 2106) of the apparatus. Pixel electrodes (2012, 2112, 2212) are connected respectively to the pixel circuits in the array and coupled to read out photocharge from respective areas of the photosensitive medium to the pixel circuits. The pixel electrodes in a peripheral region of the array are spatially offset, relative to the regular grid, in respective directions away from a center of the array.

An imaging device including a photoelectric converter including a first electrode, a second electrode, and a photoelectric conversion layer; a voltage supply circuit that applies a bias voltage between the first electrode and the second electrode; an amplifier transistor including a gate electrically connected to the second electrode, the amplifier transistor being configured to output a signal that corresponds to a potential of the gate; and a detection circuit that is configured to detect a level of the signal from the amplifier transistor. The voltage supply circuit applies the bias voltage in a first voltage range, in a case where the level detected by the detection circuit is less than a first threshold value, and applies the bias voltage in a second voltage range that is greater than the first voltage range, in a case where the level detected by the detection circuit is greater than a second threshold value.

A control method of an infrared detector, for obtaining a wider dynamic range and preventing an over-range, is disclosed. The method includes: monitoring a value acquired in response to an electric current flowing in each of a plurality of infrared detection elements configuring the infrared detector, and lowering, when the value acquired in response to the electric current flowing in the infrared detection element reaches a threshold value within a detection time, sensitivity of the infrared detection element within the detection time.

The present invention provides a solid state image sensor, an image capturing apparatus, and an image capturing method that can realize a wide dynamic range while suppressing an increase in a signal amount. A solid state image sensor includes a sensor that issues pulses at a frequency corresponding to a frequency at which photons are incident; and a counter circuit that thins out the pulses issued from the sensor at a thinning ratio corresponding to the number of pulses issued from the sensor, and counts the pulses.

Provided is a solid-state imaging device that includes a high sensitivity floating diffusion (FD) and a low sensitivity FD that hold a charge generated in a photodiode PD of a pixel, an FD coupling transistor that turns on and off coupling of the high sensitivity FD and the low sensitivity FD, and a saturation sensing circuit that performs a control that couples the high sensitivity FD and the low sensitivity FD, when a voltage of a pixel signal outputted from the pixel matches a voltage of a ramp signal. A level of the ramp signal varies in accordance with elapsed time.

A method, apparatus and system are described providing a high dynamic range pixel. An integration period has multiple sub-integration periods during which charges are accumulated in a photosensor and repeatedly transferred to a storage node, where the charges are accumulated for later transfer to another storage node for output.

A method, apparatus and system are described providing a high dynamic range pixel. An integration period has multiple sub-integration periods during which charges are accumulated in a photosensor and repeatedly transferred to a storage node, where the charges are accumulated for later transfer to another storage node for output.

An imaging device including a pixel that includes: a photoelectric converter that converts light into a charge; a charge accumulation region to which the charge is input; and an amplifier transistor that includes a gate electrically connected to the charge accumulation region. The amplifier transistor being configured to output a signal that corresponds to a potential of the charge accumulation region. The imaging device further including a detection circuit that is configured to detect a level of the signal from the amplifier transistor, wherein a sensitivity of the pixel is caused to be increased, in a case where the level detected by the detection circuit is greater than a first threshold value.