The disclosure provides a circuit structure including a first flexible insulating layer, a plurality of wires, and a second flexible insulating layer. The wires are stacked in parallel on the first flexible insulating layer. The second flexible insulating layer is stacked on the wires and has at least one insulating-layer opening from which a part of at least one of the wires is exposed.

A method for manufacturing a light-emitting module includes a step of providing a bonded board including a board including, on a first surface, a circuit pattern and wiring pads that are continuous with the circuit pattern and each have bottomed holes and light-emitting segments connected on a second surface of the board with an adhesive sheet interposed therebetween and including an array of light-emitting devices; a step of supplying electrically conductive paste inside the bottomed holes and on portions of the surface of the wiring pad around the bottomed holes through openings of a mask; and a step of performing thermal compression to harden the electrically conductive paste such that the thickness of the electrically conductive paste on the portions of the surface of the wiring pad is smaller than the electrically conductive paste at the timing of being disposed through the openings of the mask.

An IGBT module, a conductor installing structure for the IGBT module and an inverter are provided. The conductor installing structure for the IGBT module includes a substrate, a conductor and an insulation sleeve sleeved on the conductor and insulatedly isolating the conductor from the substrate. In the conductor installing structure for the IGBT module according to the present disclosure, by using the insulation sleeve sleeved on the conductor to insulatedly isolating the conductor from the substrate, the comparative tracking index of the IGBT module is improved, thereby improving the creepage distance of the IGBT module. In addition, compared with conventional technologies of spraying insulation varnish or insulation paste, the insulating property of the insulation sleeve can be better detected and guaranteed, and the bounding between the insulation sleeve and the substrate can be better enhanced, improving the insulation reliability.

A power supply apparatus includes: a detection circuit configured to feed back a voltage to a generation circuit. The detection circuit includes: a first resistor, a second resistor connected in series with the first resistor, a first conductive pattern configured to connect the first resistor and the second resistor in series, a first capacitor connected in parallel to the first resistor, a second capacitor connected in parallel to the second resistor and connected in series with the first capacitor, a second conductive pattern configured to connect the first capacitor and the second capacitor in series, and a third conductive pattern configured to electrically connect the first conductive pattern and the second conductive pattern. A thermal resistance of the third conductive pattern is greater than a thermal resistance of the first conductive pattern.

A mouse including a main body, a switch module and a pressing component is provided. The switch module includes a switch member. The pressing component is disposed on the main body. The pressing component includes a pivot member, a key portion and an abutting member. The key portion is rotatable with respect to the main body through the pivot member. The abutting member is configured to provide a force for pushing the key portion to abut against the switch member.

According to one embodiment, a detection device includes a substrate, detection electrode, terminal formed of a metal material, lead, coating layer, conductive adhesion layer, and circuit board. The lead connects the electrode and the terminal. The coating layer covers the electrode and the lead, and partly covers the terminal. The adhesion layer covers a part of the terminal exposed from the coating layer and covers a part of the coating layer. The circuit board is connected to the terminal with the adhesion layer interposed therebetween. At least in an overlapping area where the adhesion layer covers the coating layer, an area of the metal material per unit area is smaller than that of the other area of the terminal.

A microcomputer provided on a rectangular semiconductor board has memory interface circuits. The memory interface circuits are separately disposed in such positions as to extend along the peripheries of the semiconductor board on both sides from one corner as a reference position. In this case, limitations to size reduction imposed on the semiconductor board can be reduced compared with a semiconductor board having memory interface circuits only on one side. Respective partial circuits on each of the separated memory interface circuits have equal data units associated with data and data strobe signals. Thus, the microcomputer has simplified line design on a mother board and on a module board.

Some embodiments of the present invention are generally directed to testing connections of a memory device to a circuit board or other device. In one embodiment, a memory device that is configured to facilitate continuity testing between the device and a printed circuit board or other device is disclosed. The memory device includes a substrate and two connection pads that are electrically coupled to one another via a test path. A system and method for testing the connections between a memory device and a circuit board or other device are also disclosed, as are additional techniques for detecting excess temperature and enabling special functionalities using multi-stage connection pads.

One or more channels are provided in the surface of a conductive layer of a PCB substrate in an area on which a component is to be placed. The channels can help reduce or prevent shifting of the component during reflow soldering through surface tension/capillary forces of the solder paste material in the channels. Such channels also can be used, for example, by an image processing system to facilitate accurate positioning and/or alignment of the component. The image processing system can use the location of the channels alone, or in combination with other features such as a solder mask or other alignment marks, to position and/or align the component with high accuracy.

Systems and methods for providing a PWB. The methods comprise: forming a Core Substrate (CS) a First Via (FV) formed therethrough; disposing a First Trace (FT) on an exposed surface of CS that is in electrical contact with FV; laminating a first HDI substrate to CS such that FT electrically connects FV via with a Second Via (SV) formed through the first HDI substrate; disposing a Second Trace (ST) on an exposed surface of the first HDI substrate that is in electrical contact with SV; and laminating a second HDI substrate to the first HDI substrate such that ST electrically connects SV to a Third Via (TV) formed through the second HDI substrate. SV comprises a buried via with a central axis spatially offset from central axis of FV and SV. FV and SV have diameters which are smaller than TV's diameter.