A package structure includes a bottom plate, a semiconductor package, a top plate, a screw and an anti-loosening coating. The semiconductor package is disposed over the bottom plate. The top plate is disposed over the semiconductor package, and includes an internal thread in a screw hole of the top plate. The screw penetrates through the bottom plate, the semiconductor package and the top plate, and includes an external thread. The external thread of the screw is engaged to the internal thread of the top plate, and the anti-loosening coating is adhered between the external thread and the internal thread.

Semiconductor die assemblies having high efficiency thermal paths and molded underfill material. In one embodiment, a semiconductor die assembly comprises a first die and a plurality of second dies. The first die has a first functionality, a lateral region, and a stacking site. The second dies have a different functionality than the first die, and the second dies are in a die stack including a bottom second die mounted to the stacking site of the first die and a top second die defining a top surface of the die stack. A thermal transfer structure is attached to at least the lateral region of the first die and has a cavity in which the second dies are positioned. An underfill material is in the cavity between the second dies and the thermal transfer structure, and the underfill material covers the top surface of the die stack.

Semiconductor die assemblies having high efficiency thermal paths and molded underfill material. In one embodiment, a semiconductor die assembly comprises a first die and a plurality of second dies. The first die has a first functionality, a lateral region, and a stacking site. The second dies have a different functionality than the first die, and the second dies are in a die stack including a bottom second die mounted to the stacking site of the first die and a top second die defining a top surface of the die stack. A thermal transfer structure is attached to at least the lateral region of the first die and has a cavity in which the second dies are positioned. An underfill material is in the cavity between the second dies and the thermal transfer structure, and the underfill material covers the top surface of the die stack.

A three dimensional integrated circuit (3DIC) includes a first substrate and a heat spreading structure embedded in the first substrate. The 3DIC further includes a die electrically connected to the first substrate, wherein the die is thermally connected to the heat spreading structure. The 3DIC further includes a plurality of memory units on the die, wherein the die is between the plurality of memory units and the first substrate, and the plurality of memory units is thermally connected to the heat spreading structure by the die. The 3DIC further includes an external cooling unit on the plurality of memory units, wherein the plurality of memory units is between the die and the external cooling unit, and the die is thermally connected to the external cooling unit by the plurality of memory units.

A semiconductor module includes an insulation circuit substrate in which circuit patterns are formed on an upper surface of an insulation plate, switching elements that are arranged on an upper surface of the circuit patterns, a first heat dissipation plate that is arranged on a lower surface of the insulation plate, a casing member that surrounds a periphery of the insulation circuit substrate, the switching elements, and the first heat dissipation plate such that a lower surface of the first heat dissipation plate is exposed, and a second heat dissipation plate that is arranged on an upper surface side of the switching elements such that a prescribed gap is provided. The casing member has notch portions having a depth corresponding to a thickness of the second heat dissipation plate. At least a portion of the second heat dissipation plate engages with the notch portions.

A module. In some embodiments, the module includes a substrate; a plurality of electronic components, secured to an upper surface of the substrate; a thermally conductive heat spreader, on the electronic components and in thermal contact with an electronic component of the plurality of electronic components; a standoff, between the substrate and the heat spreader; an alignment element, extending into the substrate; a hard stop, under the substrate; and a plurality of compressible interconnects, under the substrate, and extending through the hard stop. The electronic components may be within a sight area of the substrate. The module may be configured to transmit a compressive load from an upper surface of the standoff to a lower surface of the substrate through a load path not including any of the electronic components.

There are provided a substrate on which a first integrated circuit, a first transistor, and a first inductor element are disposed, and which has a first side and a second side facing each other; a heat sink having a fifth side and a sixth side along the first side; the first integrated circuit, the first transistor, and the first inductor element are positioned in order of the first integrated circuit, the first transistor, and the first inductor element from the first side toward the second side, and the heat sink is fixed to the substrate such that a shortest distance between the fifth side and the first side is shorter than a shortest distance between the sixth side and the first side, and a shortest distance between the first integrated circuit and the fifth side is longer than a shortest distance between the first transistor and the sixth side.

There are provided a first fixing section to a third fixing section that fix a heat sink to a substrate on which a first driving circuit and a second driving circuit are disposed; the first drive circuit includes first transistor and first integrated circuit, and the second drive circuit includes second transistor and second integrated circuit, lengths of the first transistor and the second transistor in the normal direction of the substrate are longer than lengths of the first integrated circuit and the second integrated circuit, the first fixing section and the second fixing section overlap a first virtual straight line that connects the first transistor and the second transistor, and the third fixing section overlaps a second virtual straight line that connects the first integrated circuit and the second integrated circuit to each other.

Semiconductor die assemblies having high efficiency thermal paths and molded underfill material. In one embodiment, a semiconductor die assembly comprises a first die and a plurality of second dies. The first die has a first functionality, a lateral region, and a stacking site. The second dies have a different functionality than the first die, and the second dies are in a die stack including a bottom second die mounted to the stacking site of the first die and a top second die defining a top surface of the die stack. A thermal transfer structure is attached to at least the lateral region of the first die and has a cavity in which the second dies are positioned. An underfill material is in the cavity between the second dies and the thermal transfer structure, and the underfill material covers the top surface of the die stack.

Semiconductor die assemblies having high efficiency thermal paths and molded underfill material. In one embodiment, a semiconductor die assembly comprises a first die and a plurality of second dies. The first die has a first functionality, a lateral region, and a stacking site. The second dies have a different functionality than the first die, and the second dies are in a die stack including a bottom second die mounted to the stacking site of the first die and a top second die defining a top surface of the die stack. A thermal transfer structure is attached to at least the lateral region of the first die and has a cavity in which the second dies are positioned. An underfill material is in the cavity between the second dies and the thermal transfer structure, and the underfill material covers the top surface of the die stack.