An infrared (IR) detection sensor for detecting IR radiation. The IR detection sensor including a plurality of nanowires positioned adjacent to each other so as to define a layer. The layer has an outer surface directable towards a source of IR radiation. First and second terminals are electrically coupled to the layer and a circuit is electrically coupled to the first and second terminals. The circuit is configured to determine a value of an electrical property, such as the resistance, of the layer in response to the IR radiation absorbed by the layer.

A device includes a substrate, and a first semiconductor channel over the substrate. The first semiconductor channel includes a first nanosheet of a first semiconductor material, a second nanosheet of a second semiconductor material in physical contact with a topside surface of the first nanosheet, and a third nanosheet of the second semiconductor material in physical contact with an underside surface of the first nanosheet. The first gate structure is over and laterally surrounding the first semiconductor channel, and in physical contact with the second nanosheet and the third nanosheet.

Embodiments of the present disclosure includes a semiconductor device. The semiconductor device includes first suspended nanostructures vertically stacked over one another and disposed on a substrate, a first gate stack engaging the first suspended nanostructures, a first gate spacer disposed on sidewalls of the first gate stack, second suspended nanostructures vertically stacked over one another and disposed on the substrate, a second gate stack engaging the second suspended nanostructures, and a second gate spacer disposed on sidewalls of the second gate stack. A middle portion of the first suspended nanostructures has a first thickness measured in a direction perpendicular to a top surface of the substrate. A middle portion of the second suspended nanostructures has a second thickness measured in the direction. The second thickness is smaller than the first thickness.

A semiconductor device and a fabricating method thereof are provided. The semiconductor device includes a substrate, a first nanowire spaced apart from a first region of the substrate, a first gate electrode surrounding a periphery of the first nanowire, a second nanowire spaced apart from a second region of the substrate and extending in a first direction and having a first width in a second direction intersecting the first direction, a supporting pattern contacting the second nanowire and positioned under the second nanowire, and a second gate electrode extending in the second direction and surrounding the second nanowire and the supporting pattern.

A method for depositing nanostructures on a substrate comprises: forming a patterned alignment layer on a surface of the substrate, wherein the patterned alignment layer has one or more cavities each having a main region for accommodating at least one template nanostructure therein and a plurality of extension regions extending from the main region and in fluid communication with the main region, and wherein the plurality of extension regions are sized and shaped to not accommodate the at least one template nanostructure; and diffusing template nanostructures into the one or more cavities of the patterned alignment layer.

A semiconductor device includes a substrate, a first shallow trench isolation (STI) liner disposed above and in contact with the substrate, a bottom dielectric isolation (BDI) region disposed above the substate and in contact with the STI liner, a device channel disposed above the BDI region, and a gate stack disposed above and in contact with the device channel.

Fins for use in gate all-around field effect transistors (GAAFETs) can be manufactured to have substantially uniform profiles, so the shapes of the fins are independent of size and pitch. Fin profile optimization from a tapered profile to a substantially uniform profile can be achieved via fin height control modulation using additional physical shaping operations to reduce pattern loading. These improvements in the fin profile can be accomplished by stacking and refilling a flowable chemical vapor deposition (FCVD) film multiple times and by using composition tuning during the FCVD process to further modulate fin profiles.

A nanowire array structure having an array of nanopillars located in a well in a material layer. The nanopillars of the array extend in the direction from the well floor towards the well mouth. A hard mask overlies the outer peripheral nanopillars in the array and extends outwards to cover the remainder of the well mouth. An aperture in the hard mask exposes the nanopillars disposed inwardly of the outer peripheral nanopillars. The hard mask planarizes the structure, avoiding formation of large topological features at the periphery of the array of nanopillars, thus facilitating integration of the structure into a semiconductor product. At least some of the outer peripheral nanopillars may be in pores of anodic oxide. There are also disclosed semiconductor products incorporating such nanowire array structures and methods of their fabrication.

A semiconductor structure includes a device area that includes a first structure in a first layer having a top surface above a top surface of the first layer, and a second structure in a second layer on top of the first layer, where the first structure is pinned in the second structure; an overlay metrology area for optically evaluating an overlay error between the second and first structure, including: a third structure in the first layer, having a top surface above the top surface of the first layer, a fourth structure in the second layer, where the combination of the third and fourth structures mimics the combination of the first structure and the second structures, and a fifth structure in the first layer, for use as a reference structure.

The present disclosure provides embodiments of bipolar junction transistor (BJT) structures. A BJT according to the present disclosure includes a first epitaxial feature disposed over a well region, a second epitaxial feature disposed over the well region, a vertical stack of channel members each extending lengthwise between the first epitaxial feature and the second epitaxial feature, a gate structure wrapping around each of the vertical stack of channel members, a first electrode coupled to the well region, an emitter electrode disposed over and coupled to the first epitaxial feature, and a second electrode disposed over and coupled to the second epitaxial feature.