An integrated circuit isolation product includes a first integrated circuit die. The first integrated circuit die includes a first terminal and a second terminal adjacent to the first terminal. The first terminal and the second terminal are configured as a differential pair of terminals configured to communicate a differential signal across an isolation barrier. The first integrated circuit die includes at least one additional terminal adjacent to the differential pair of terminals. The at least one additional terminal is disposed symmetrically with respect to the differential pair of terminals. The first terminal may have a first parasitic capacitance and the second terminal may have a second parasitic capacitance. The first parasitic capacitance may be substantially the same as the second parasitic capacitance. The at least one additional terminal may be disposed symmetrically with respect to a line of symmetry for the differential pair of terminals.

According to an aspect of the present invention, an electronic system (499) operative on a millimeter signal comprises an integrated circuit (401) comprising a first solder ball (420A) and a second solder ball (420B) respectively coupled to a positive and a negative signal interface points (412 and 413) of a differential millimeter signal on a die (410) housed in the integrated circuit (401), wherein the first and the second solder balls (420A and 420B) are positioned one behind other from an edge of the integrated circuit (401) and a three-path coplanar waveguide (CPW) comprising a center path (495B) and a two adjacent paths (495A and 495C) formed on a printed circuit board (PCB) (490) such that the center path (495B) is coupled to the first solder ball that is in front and the two adjacent paths coupled to the second solder ball that is behind the first solder ball.

A semiconductor device includes a semiconductor chip including a first circuit and a wiring substrate over which the semiconductor chip is mounted. The wiring substrate includes input signal wires transmitting an input signal to the semiconductor chip, output signal wires transmitting an output signal from the semiconductor chip, and first conductor planes supplied with a reference potential. When a wire cross-sectional area is defined as the cross-sectional area of each wire in a direction orthogonal to a direction in which the wire extends, the wire cross-sectional area of each input signal wire is smaller than the wire cross-sectional area of each output signal wire. In the thickness direction of the wiring substrate, each input signal wire is interposed between second conductor planes and third conductor planes each supplied with the reference potential. Between the output signal wires and the input signal wires, the third conductor planes are disposed.

In conventional panel level packaging, the BGA pad itself can occupy more space on the final connection layer leaving less space to route traces and vias. To address this and other issues, connection pads such as the BGA pad can be split to allow for more efficient routing on the final connection layer.

In accordance with embodiments disclosed herein, there is provided a high density triple diamond stripline interconnect. An interconnect includes a first reference layer, a second reference layer disposed below the first reference layer, and a dielectric disposed between the first reference layer and the second reference layer. The interconnect further includes a first pair of conductors including a first conductor and a second conductor that are in a broadside-facing orientation within the dielectric below the first reference layer and above the second reference layer. The interconnect further includes a second pair of conductors including a third conductor and a fourth conductor that are in an edge-facing orientation within the dielectric below the first conductor and above the second conductor.

A transmission circuit includes a first semiconductor device, a second semiconductor device, a first signal line, a second signal line, a third signal line, and a ground line. A differential signal is composed of a first signal and a second signal. The first signal line is configured to connect the first semiconductor device and the second semiconductor device and used to transmit the first signal. The second signal line is configured to connect the first semiconductor device and the second semiconductor device and used to transmit the second signal. The second signal line, the first signal line, the ground line, and the third signal line are disposed in this order. A distance between the first signal line and the ground line is larger than a distance between the first signal line and the second signal line.

In one embodiment, a system comprises: a plurality of aggressor bus lines; and a plurality of differential pair bus lines that are located in relatively parallel close proximity to the plurality of aggressor bus lines, wherein at least two of the plurality of differential pair bus lines change location with respect to each other at a point that has a cancelling affect on cross talk from the plurality of aggressor bus lines, wherein the change includes cross over routing. The plurality of differential pair bus lines can convey differential clock signals. The routing of the plurality of differential pair bus lines is substantially parallel to one another before and after the change.

A high peak bandwidth I/O channel embedded within a multilayer surface interface that forms the bus circuitry electrically interfacing the output or input port on a first semiconductor die with the input or output port on a second semiconductor die.

Apparatuses, systems and methods associated with electrical routing layout of printed circuit boards and integrated circuit substrates are disclosed herein. In embodiments, an apparatus includes a first electrically conductive path that extends through a region, wherein the first electrically conductive path includes a first pad located at a surface of the region, a first via that extends through the region, and a first trace that extends in a first direction. The apparatus further includes a second electrically conductive path that extends through the region, wherein the second electrically conductive path includes a second pad located at the surface and adjacent to the first pad, a second via that extends through the region, and a second trace that extends in a second direction. Other embodiments may be described and/or claimed.

According to one embodiment, a semiconductor device includes a board, a sealing portion, a controller, a semiconductor chip, and solder balls. The board includes a first surface and a second surface opposite to the first surface. The controller and the semiconductor chip are covered with the sealing portion. The solder balls are on the second surface of the board. The solder balls include a plurality of solder ball sets each corresponding to a pair of differential input and differential output signals, and the plurality of solder ball sets are arranged substantially parallel to a side of the board.