Patent classifications
H01L2224/1141
Metal bonding pads for packaging applications
Methods and semiconductor devices for bonding a first semiconductor device to a second semiconductor device include forming metal pads including a textured microstructure having a columnar grain structure at substantially the same angular direction from the top surface to the bottom surface. The textured crystalline microstructures enables the use of low temperatures and low pressures to effect bonding of the metal pads. Also described are methods of packaging and semiconductor devices.
Metal bonding pads for packaging applications
Methods and semiconductor devices for bonding a first semiconductor device to a second semiconductor device include forming metal pads including a textured microstructure having a columnar grain structure at substantially the same angular direction from the top surface to the bottom surface. The textured crystalline microstructures enables the use of low temperatures and low pressures to effect bonding of the metal pads. Also described are methods of packaging and semiconductor devices.
Methods for Making Multi-Die Package With Bridge Layer
A device is provided. The device includes a bridge layer over a first substrate. A first connector electrically connecting the bridge layer to the first substrate. A first die is coupled to the bridge layer and the first substrate, and a second die is coupled to the bridge layer.
Methods for Making Multi-Die Package With Bridge Layer
A device is provided. The device includes a bridge layer over a first substrate. A first connector electrically connecting the bridge layer to the first substrate. A first die is coupled to the bridge layer and the first substrate, and a second die is coupled to the bridge layer.
Multiple sized bump bonds
A semiconductor structure and methods for the creation of solder bumps configured to carry a signal and solder bumps configured for ground planes and/or mechanical connections as well as methods for increasing reliability of a chip package generally include formation of multiple sized bump bonds on under bump metallization patterns and/or pads of the same dimension. The signal carrying solder bumps are larger in terms of diameter and bump height than solder bumps configured for ground plane and/or mechanical connections.
Multiple sized bump bonds
A semiconductor structure and methods for the creation of solder bumps configured to carry a signal and solder bumps configured for ground planes and/or mechanical connections as well as methods for increasing reliability of a chip package generally include formation of multiple sized bump bonds on under bump metallization patterns and/or pads of the same dimension. The signal carrying solder bumps are larger in terms of diameter and bump height than solder bumps configured for ground plane and/or mechanical connections.
Engineered polymer-based electronic materials
A composition for use in an electronic assembly process, the composition comprising a filler dispersed in an organic medium, wherein: the organic medium comprises a polymer; the filler comprises one or more of graphene, functionalized graphene, graphene oxide, a polyhedral oligomeric silsesquioxane, graphite, a 2D material, aluminum oxide, zinc oxide, aluminum nitride, boron nitride, silver, nano fibers, carbon fibers, diamond, carbon nanotubes, silicon dioxide and metal-coated particles, and the composition comprises from 0.001 to 40 wt. % of the filler based on the total weight of the composition.
Engineered polymer-based electronic materials
A composition for use in an electronic assembly process, the composition comprising a filler dispersed in an organic medium, wherein: the organic medium comprises a polymer; the filler comprises one or more of graphene, functionalized graphene, graphene oxide, a polyhedral oligomeric silsesquioxane, graphite, a 2D material, aluminum oxide, zinc oxide, aluminum nitride, boron nitride, silver, nano fibers, carbon fibers, diamond, carbon nanotubes, silicon dioxide and metal-coated particles, and the composition comprises from 0.001 to 40 wt. % of the filler based on the total weight of the composition.
ARRANGEMENT METHOD AND ARRANGEMENT STRUCTURE OF CONDUCTIVE MATERIAL, AND LED DISPLAY THEREOF
An arrangement method of conductive material, and an LED display thereof are provided. The arrangement method of conductive material includes: providing a substrate with an upper surface having a non-solder pad area and a plurality of solder pad areas; forming a conductive layer on the upper surface of the substrate to cover the non-solder pad area and the plurality of solder pad areas; heating the conductive material to melt the conductive material; and dividing the molten conductive material into the plurality of solder pad areas to respectively form a plurality of conductors.
ARRANGEMENT METHOD AND ARRANGEMENT STRUCTURE OF CONDUCTIVE MATERIAL, AND LED DISPLAY THEREOF
An arrangement method of conductive material, and an LED display thereof are provided. The arrangement method of conductive material includes: providing a substrate with an upper surface having a non-solder pad area and a plurality of solder pad areas; forming a conductive layer on the upper surface of the substrate to cover the non-solder pad area and the plurality of solder pad areas; heating the conductive material to melt the conductive material; and dividing the molten conductive material into the plurality of solder pad areas to respectively form a plurality of conductors.