Patent classifications
H01L2224/1161
Printed structures with electrical contact having reflowable polymer core
A printed structure comprises a device comprising device electrical contacts disposed on a common side of the device and a substrate non-native to the device comprising substrate electrical contacts disposed on a surface of the substrate. At least one of the substrate electrical contacts has a rounded shape. The device electrical contacts are in physical and electrical contact with corresponding substrate electrical contacts. The substrate electrical contacts can comprise a polymer core coated with a patterned contact electrical conductor on a surface of the polymer core. A method of making polymer cores comprising patterning a polymer on the substrate and reflowing the patterned polymer to form one or more rounded shapes of the polymer and coating and then patterning the one or more rounded shapes with a conductive material.
STRUCTURES AND METHODS FOR ELECTRICALLY CONNECTING PRINTED HORIZONTAL DEVICES
A printed structure comprises a device comprising device electrical contacts disposed on a common side of the device and a substrate non-native to the device comprising substrate electrical contacts disposed on a surface of the substrate. At least one of the substrate electrical contacts has a rounded shape. The device electrical contacts are in physical and electrical contact with corresponding substrate electrical contacts. The substrate electrical contacts can comprise a polymer core coated with a patterned contact electrical conductor on a surface of the polymer core. A method of making polymer cores comprising patterning a polymer on the substrate and reflowing the patterned polymer to form one or more rounded shapes of the polymer and coating and then patterning the one or more rounded shapes with a conductive material.
STRUCTURES AND METHODS FOR ELECTRICALLY CONNECTING PRINTED HORIZONTAL DEVICES
A printed structure comprises a device comprising device electrical contacts disposed on a common side of the device and a substrate non-native to the device comprising substrate electrical contacts disposed on a surface of the substrate. At least one of the substrate electrical contacts has a rounded shape. The device electrical contacts are in physical and electrical contact with corresponding substrate electrical contacts. The substrate electrical contacts can comprise a polymer core coated with a patterned contact electrical conductor on a surface of the polymer core. A method of making polymer cores comprising patterning a polymer on the substrate and reflowing the patterned polymer to form one or more rounded shapes of the polymer and coating and then patterning the one or more rounded shapes with a conductive material.
Chiplets with connection posts
A component includes a plurality of electrical connections on a process side opposed to a back side of the component. Each electrical connection includes an electrically conductive multi-layer connection post protruding from the process side. A printed structure includes a destination substrate and one or more components. The destination substrate has two or more electrical contacts and each connection post is in contact with, extends into, or extends through an electrical contact of the destination substrate to electrically connect the electrical contacts to the connection posts. The connection posts or electrical contacts are deformed. Two or more connection posts can be electrically connected to a common electrical contact.
Micro-fabricated, stress-engineered members formed on passivation layer of integrated circuit
A release layer is formed on a surface of an integrated circuit wafer. The surface is passivated and includes metal contact materials. A stress-engineered film having an intrinsic stress profile is deposited over the release layer. The stress-engineered film is patterned and the release layer is undercut etched so that a released portion of the patterned stress-engineered film is released from the surface while leaving an anchor portion fixed to the surface. The intrinsic stress profile in the stress-engineered film biases the released portion away from the surface. The released portion is placed entirely within an area defined by the metal contact material.
SEAL RING STRUCTURES AND METHODS OF FORMING SAME
Some embodiments relate to a three-dimensional (3D) integrated circuit (IC). The 3D IC includes a first IC die comprising a first semiconductor substrate, and a first interconnect structure over the first semiconductor substrate. The 3D IC also includes a second IC die comprising a second semiconductor substrate, and a second interconnect structure that separates the second semiconductor substrate from the first interconnect structure. A seal ring structure separates the first interconnect structure from the second interconnect structure and perimetrically surrounds a gas reservoir between the first IC die and second IC die. The seal ring structure includes a sidewall gas-vent opening structure configured to allow gas to pass between the gas reservoir and an ambient environment surrounding the 3D IC.
SEAL RING STRUCTURES AND METHODS OF FORMING SAME
Some embodiments relate to a three-dimensional (3D) integrated circuit (IC). The 3D IC includes a first IC die comprising a first semiconductor substrate, and a first interconnect structure over the first semiconductor substrate. The 3D IC also includes a second IC die comprising a second semiconductor substrate, and a second interconnect structure that separates the second semiconductor substrate from the first interconnect structure. A seal ring structure separates the first interconnect structure from the second interconnect structure and perimetrically surrounds a gas reservoir between the first IC die and second IC die. The seal ring structure includes a sidewall gas-vent opening structure configured to allow gas to pass between the gas reservoir and an ambient environment surrounding the 3D IC.
Wireless communication technology, apparatuses, and methods
- Erkan Alpman ,
- Arnaud Lucres Amadjikpe ,
- Omer Asaf ,
- Kameran Azadet ,
- Rotem Banin ,
- Miroslav Baryakh ,
- Anat Bazov ,
- Stefano Brenna ,
- Bryan K. Casper ,
- Anandaroop Chakrabarti ,
- Gregory Chance ,
- Debabani CHOUDHURY ,
- Emanuel Cohen ,
- CLAUDIO DA SILVA ,
- Sidharth Dalmia ,
- Saeid Daneshgar Asl ,
- Kaushik Dasgupta ,
- Kunal Datta ,
- Brandon Davis ,
- Ofir Degani ,
- Amr M. Fahim ,
- Amit Freiman ,
- Michael Genossar ,
- Eran Gerson ,
- Eyal Goldberger ,
- Eshel Gordon ,
- Meir Gordon ,
- Josef Hagn ,
- Shinwon Kang ,
- Te Yu Kao ,
- Noam Kogan ,
- Mikko S. Komulainen ,
- Igal Yehuda Kushnir ,
- Saku Lahti ,
- Mikko M. Lampinen ,
- Naftali Landsberg ,
- Wook Bong Lee ,
- Run Levinger ,
- Albert Molina ,
- Resti Montoya Moreno ,
- Tawfiq Musah ,
- Nathan G. Narevsky ,
- Hosein Nikopour ,
- Oner Orhan ,
- Georgios Palaskas ,
- Stefano PELLERANO ,
- Ron Pongratz ,
- Ashoke Ravi ,
- Shmuel Ravid ,
- Peter Andrew Sagazio ,
- Eren Sasoglu ,
- Lior Shakedd ,
- Gadi Shor ,
- Baljit Singh ,
- Menashe Soffer ,
- Ra'anan Sover ,
- Shilpa Talwar ,
- Nebil Tanzi ,
- Moshe Teplitsky ,
- Chintan S. Thakkar ,
- Jayprakash Thakur ,
- Avi Tsarfati ,
- Yossi TSFATI ,
- Marian Verhelst ,
- Nir Weisman ,
- Shuhei Yamada ,
- Ana M. Yepes ,
- Duncan Kitchin
Millimeter wave (mmWave) technology, apparatuses, and methods that relate to transceivers, receivers, and antenna structures for wireless communications are described. The various aspects include co-located millimeter wave (mmWave) and near-field communication (NFC) antennas, scalable phased array radio transceiver architecture (SPARTA), phased array distributed communication system with MIMO support and phase noise synchronization over a single coax cable, communicating RF signals over cable (RFoC) in a distributed phased array communication system, clock noise leakage reduction, IF-to-RF companion chip for backwards and forwards compatibility and modularity, on-package matching networks, 5G scalable receiver (Rx) architecture, among others.
Wireless communication technology, apparatuses, and methods
- Erkan Alpman ,
- Arnaud Lucres Amadjikpe ,
- Omer Asaf ,
- Kameran Azadet ,
- Rotem Banin ,
- Miroslav Baryakh ,
- Anat Bazov ,
- Stefano Brenna ,
- Bryan K. Casper ,
- Anandaroop Chakrabarti ,
- Gregory Chance ,
- Debabani CHOUDHURY ,
- Emanuel Cohen ,
- CLAUDIO DA SILVA ,
- Sidharth Dalmia ,
- Saeid Daneshgar Asl ,
- Kaushik Dasgupta ,
- Kunal Datta ,
- Brandon Davis ,
- Ofir Degani ,
- Amr M. Fahim ,
- Amit Freiman ,
- Michael Genossar ,
- Eran Gerson ,
- Eyal Goldberger ,
- Eshel Gordon ,
- Meir Gordon ,
- Josef Hagn ,
- Shinwon Kang ,
- Te Yu Kao ,
- Noam Kogan ,
- Mikko S. Komulainen ,
- Igal Yehuda Kushnir ,
- Saku Lahti ,
- Mikko M. Lampinen ,
- Naftali Landsberg ,
- Wook Bong Lee ,
- Run Levinger ,
- Albert Molina ,
- Resti Montoya Moreno ,
- Tawfiq Musah ,
- Nathan G. Narevsky ,
- Hosein Nikopour ,
- Oner Orhan ,
- Georgios Palaskas ,
- Stefano PELLERANO ,
- Ron Pongratz ,
- Ashoke Ravi ,
- Shmuel Ravid ,
- Peter Andrew Sagazio ,
- Eren Sasoglu ,
- Lior Shakedd ,
- Gadi Shor ,
- Baljit Singh ,
- Menashe Soffer ,
- Ra'anan Sover ,
- Shilpa Talwar ,
- Nebil Tanzi ,
- Moshe Teplitsky ,
- Chintan S. Thakkar ,
- Jayprakash Thakur ,
- Avi Tsarfati ,
- Yossi TSFATI ,
- Marian Verhelst ,
- Nir Weisman ,
- Shuhei Yamada ,
- Ana M. Yepes ,
- Duncan Kitchin
Millimeter wave (mmWave) technology, apparatuses, and methods that relate to transceivers, receivers, and antenna structures for wireless communications are described. The various aspects include co-located millimeter wave (mmWave) and near-field communication (NFC) antennas, scalable phased array radio transceiver architecture (SPARTA), phased array distributed communication system with MIMO support and phase noise synchronization over a single coax cable, communicating RF signals over cable (RFoC) in a distributed phased array communication system, clock noise leakage reduction, IF-to-RF companion chip for backwards and forwards compatibility and modularity, on-package matching networks, 5G scalable receiver (Rx) architecture, among others.
MULTI-FACED MOLDED SEMICONDUCTOR PACKAGE AND RELATED METHODS
Implementations of a method of forming a semiconductor package may include forming electrical contacts on a first side of a wafer, applying a photoresist layer to the first side of the wafer, patterning the photoresist layer, and etching notches into the first side of the wafer using the photoresist layer. The method may include applying a first mold compound into the notches and over the first side of the wafer, grinding a second side of the wafer opposite the first side of the wafer to the notches formed in the first side of the wafer, applying one of a second mold compound and a laminate resin to a second side of the wafer, and singulating the wafer into semiconductor packages. Six sides of a die included in each semiconductor package may be covered by one of the first mold compound, the second mold compound, and the laminate resin.