Patent classifications
H03K3/356078
Detecting device and semiconductor device
The power of a semiconductor device is reduced. The semiconductor device includes a latch circuit composed of a dynamic circuit. The latch circuit includes a first circuit having a decoding function, a plurality of capacitors, a plurality of clock input terminals, a signal input terminal, a first output terminal, and a second output terminal. In a period during which H is supplied to a first clock signal, the potential of the first capacitor is updated on the basis of the results of decoding performed by the first circuit. In a period during which H is supplied to a second clock signal, the potential of the second capacitor is updated on the basis of the potential of the first capacitor, and the potential of the second capacitor is supplied as a first output signal to the first output terminal. In a period during which H is supplied to a third clock signal, the potential of the third capacitor is updated on the basis of the potential of the second capacitor, and the potential of the third capacitor is supplied as a second output signal to the second output terminal.
CIRCUIT STRUCTURE AND RELATED METHOD FOR RADIATION RESISTANT MEMORY CELL
Embodiments of the disclosure provide a circuit structure and related method to provide a radiation resistant memory cell. A circuit structure may include a first latch having an input node and an output node. A second latch has an input node and an output node, in which the output node of the second latch is coupled to the input node of the first latch, and the input node of the second latch is coupled to the output node of the first latch. A read/write (R/W) circuit includes a plurality of transistors coupling a word line, a bit line, and an inverted bit line to at least two outputs. One of the at least two outputs is coupled to the input node of the first latch and another of the outputs is coupled to the input node of the second latch.
Circuit for improving clock rates in high speed electronic circuits using feedback based flip-flops
A flip-flop circuit for enhancing clock rates in high speed electronic circuits, the flip-flop circuit having an input terminal, an output terminal, and a third terminal that controls the flow of signal from the input terminal to the output terminal, comprising: two latches arranged in a master-slave configuration such that the input terminal of the first latch is also the input terminal of the flip-flop and the output terminal of the second latch is also the output terminal of the flip-flop; and at least one feedback path that adds signal to the input of the flip-flop from one of the outputs of the two latches.
Circuit structure and related method for radiation resistant memory cell
Embodiments of the disclosure provide a circuit structure and related method to provide a radiation resistant memory cell. A circuit structure may include a first latch having an input node and an output node. A second latch has an input node and an output node, in which the output node of the second latch is coupled to the input node of the first latch, and the input node of the second latch is coupled to the output node of the first latch. A read/write (R/W) circuit includes a plurality of transistors coupling a word line, a bit line, and an inverted bit line to at least two outputs. One of the at least two outputs is coupled to the input node of the first latch and another of the outputs is coupled to the input node of the second latch.