Systems, apparatuses, and methods for implementing a low-power single-phase logic gate latch for clock-gating are disclosed. A latch circuit includes shared clocked transistors without including clock inverters. The shared clocked transistors include a P-type clocked transistor and an N-type clocked transistor, with the clock input coupled to the gate of the P-type clocked transistor and to the gate of the N-type clocked transistor. The P-type clocked transistor is coupled between first and second transistor stacks of the latch. The N-type clocked transistor is coupled to a source gate of a first stack N-type transistor gated by a data input and to a source gate of a second stack N-type transistor gated by the inverted data input. The latch has a lower clock pin capacitance than a traditional logic gate latch while also avoiding having clock inverters which reduces dynamic power consumption.

A scan chain architecture with lowered power consumption comprises a multiplexer selecting between a functional input and a test input. The output of the multiplexer is coupled to a low threshold voltage latch and, in test mode, to a standard threshold voltage latch. The low threshold voltage latch and standard threshold voltage latch are configured to store data when a clock input falls, using a master latch functional clock M_F_CLK, master latch test clock M_T_CLK, slave latch functional clock S_F_CLK, and slave latch test clock S_T_CLK. The slave latch has lower power consumption than the master latch.

An apparatus includes a master latch circuit including a first circuit and a second circuit, and a slave latch circuit including a third circuit and a fourth circuit. The first circuit and the second circuit may be coupled to a first shared circuit node, and the third circuit and the fourth circuit may be coupled to a second shared circuit node. The master latch circuit may be configured to store a value of an input signal in response to an assertion of a clock signal. The slave latch circuit may be configured to store an output value of the master latch circuit in response to a de-assertion of the clock signal. The master latch circuit may also be configured to de-couple the first shared circuit node from a ground reference node in response to the de-assertion of the clock signal.

An integrated circuit disclosed here includes a first plurality of cell rows, a second plurality of cell rows, first and second clock inverters, and a plurality of flip-flops. The second plurality of cell rows are arranged abutting the first plurality of cell rows. A first number of fins in the first plurality of cell rows is different from a second number of fins in the second plurality of cell rows. The first and second clock inverters are arranged in the second plurality of cell rows. The plurality of flip-flops are arranged in the first plurality of cell rows and the second plurality of cell rows. The plurality of flip-flops include a first plurality of flip-flops configured to operate in response to the first clock and second clock signals.

A vertical field effect transistor (VFET) cell implementing a VFET circuit over a plurality of gate grids includes: a 1.sup.st circuit including at least one VFET and provided over at least one gate grid; and a 2.sup.nd circuit including at least one VFET and provided over at least one gate grid formed on a left or right side of the 1.sup.st circuit, wherein a gate of the VFET of the 1.sup.st circuit is configured to share a gate signal or a source/drain signal of the VFET of the 2.sup.nd circuit, and the 1.sup.st circuit is an (X−1)-contacted poly pitch (CPP) circuit, which is (X−1) CPP wide, converted from an X-CPP circuit which is X CPP wide and performs a same logic function as the (X−1)-CPP circuit, X being an integer greater than 1.

A flip flop standard cell that includes a data input terminal configured to receive a data signal, clock input terminal configured to receive a clock signal, a data output terminal, and a latch. A bit write circuit is configured to receive a bit write signal. The received data signal is latched and provided at the output terminal in response to the bit write signal and the clock signal. A hold circuit is configured to receive a hold signal, and the received data signal is not latched and provided at the data output terminal in response to the hold signal and the clock signal.

A register with data retention includes a master-slave flip-flop, a balloon latch, and a level shifter. The master-slave flip-flop is supplied by a first power voltage. The balloon latch is supplied by a second power voltage. The second power voltage is independent of the first power voltage. The level shifter provides a voltage conversion between the master-slave flip-flop and the balloon latch. A data is stored in the master-slave flip-flop. When the first power voltage is disabled, the balloon latch is configured to temporarily retain the data.

A method of forming a semiconductor device includes forming active regions, forming S/D regions, forming MD contact structures and forming gate lines resulting in corresponding transistors that define a first time delay circuit having a first input configured to receive a first clock signal and having a first output configured to generate a second clock signal from the first clock signal; and corresponding transistors that define a second time delay circuit having a second input configured to receive the second clock signal and having a second output configured to generate a third clock signal from the first clock signal; forming a first gate via-connector in direct contact with the first gate line atop the first-type active region in the first area; and forming a second gate via-connector in direct contact with the second gate line atop the second-type active region in the second area.

A flip-flop with glitch protection is disclosed. The flip-flop includes a differential amplifier circuit that generates amplifier output signals based on an input data and clock signals and precharges a true data node when a clock signal is inactive. A latch circuit is coupled to the differential amplifier and includes a latch node. Responsive to a current value of the input data signal having a first logic state, the latch node is set at a logic value equivalent to the precharged value during an active phase of the clock signal. Responsive to the current value of the input data signal having a second logic state complementary to the first, during the active phase of the clock signal, the latch circuit causes the latch node to be set to a logic value complementary to the precharged value, using the clock signal and the current value of the input data signal.

A processing circuit includes an input circuit and a follow-up circuit. The input circuit includes a first transistor, a second transistor, and a delay element. The first transistor has a control terminal, a first connection terminal, and a second connection terminal. The control terminal of the first transistor is arranged to receive a data signal. A first connection terminal of the second transistor is coupled to the second connection terminal of the first transistor, and a control terminal of the second transistor is arranged to receive a first non-data signal. The delay element is coupled between the control terminal and the second connection terminal of the first transistor. A data input is received at an input node of the follow-up circuit, and the input node of the follow-up circuit is coupled to the second connection terminal of the second transistor.