In one embodiment, a field programmable gate array (FPGA) includes: at least one programmable logic circuit to execute a function programmed with a bitstream; a self-test circuit to execute a self-test at a first voltage, the self-test and the first voltage programmed with first metadata associated with the bitstream, the self-test including at least one critical path length of the function; and a power controller to identify an operating voltage for the at least one programmable logic circuit based at least in part on the execution of the self-test at the first voltage.

Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.

An integrated circuit is provided, including a first latch circuit, a second latch circuit, and a clock circuit. The first latch circuit transmits multiple data signals to the second latch circuit through multiple first conductive lines disposed on a front side of the integrated circuit. The clock circuit transmits a first clock signal and a second clock signal to the first latch circuit and the second latch circuit through multiple second conductive lines disposed on a backside, opposite of the front side, of the integrated circuit.

An integrated circuit is provided, including a first latch circuit, a second latch circuit, and a clock circuit. The first latch circuit transmits multiple data signals to the second latch circuit through multiple first conductive lines disposed on a front side of the integrated circuit. The clock circuit transmits a first clock signal and a second clock signal to the first latch circuit and the second latch circuit through multiple second conductive lines disposed on a backside, opposite of the front side, of the integrated circuit.

A method for execution by one or more processing modules to configure a programmable drive-sense unit (DSU) includes determining one or more load sensing objectives based on sensing a load using the DSU that is configured to drive and simultaneously to sense the load via a single line. The method further includes determining one or more data processing objectives associated with sensing the load. The method further includes determining desired characteristics for the output data associated with sensing the load. The method further includes determining operational parameters for the DSU based on one or more of the load sensing objectives, the data processing objectives, and the desired characteristics for the output data. The method further includes configuring the DSU based on the operational parameters to achieve the one or more load sensing objectives.

A method for execution by one or more processing modules to configure a programmable drive-sense unit (DSU) includes determining one or more load sensing objectives based on sensing a load using the DSU that is configured to drive and simultaneously to sense the load via a single line. The method further includes determining one or more data processing objectives associated with sensing the load. The method further includes determining desired characteristics for the output data associated with sensing the load. The method further includes determining operational parameters for the DSU based on one or more of the load sensing objectives, the data processing objectives, and the desired characteristics for the output data. The method further includes configuring the DSU based on the operational parameters to achieve the one or more load sensing objectives.

A semiconductor device, able to be selectively configured to perform one or more user defined logic functions, includes a semiconductor die and a selectable power regulator. The semiconductor die, in one aspect, includes a first region and a second region. The first region is operatable to perform a first set of logic functions based on a first power domain having a first voltage. The second region is configured to perform a second set of logic functions based on a second power domain having a second voltage. The selectable power regulator, in one embodiment, provides the second voltage for facilitating the second power domain in the second region of the semiconductor die in response to at least one enabling input from the first region of the semiconductor die.

A semiconductor device, able to be selectively configured to perform one or more user defined logic functions, includes a semiconductor die and a selectable power regulator. The semiconductor die, in one aspect, includes a first region and a second region. The first region is operatable to perform a first set of logic functions based on a first power domain having a first voltage. The second region is configured to perform a second set of logic functions based on a second power domain having a second voltage. The selectable power regulator, in one embodiment, provides the second voltage for facilitating the second power domain in the second region of the semiconductor die in response to at least one enabling input from the first region of the semiconductor die.

A leakage compensation dynamic register, a data operation unit, a chip, a hash board, and a computing apparatus. The leakage compensation dynamic register comprises: an input terminal, an output terminal, a clock signal terminal, and an analog switch unit; a data latch unit for latching the data under control of the clock signal; and an output drive unit for inverting and outputting the data received from the data latch unit, the analog switch unit, the data latch unit, and the output drive unit being sequentially connected in series between the input terminal and the output terminal, and the analog switch unit and the data latch unit having a node therebetween, wherein the leakage compensation dynamic register further comprises a leakage compensation unit electrically connected between the node and the output terminal.

A leakage compensation dynamic register, a data operation unit, a chip, a hash board, and a computing apparatus. The leakage compensation dynamic register comprises: an input terminal, an output terminal, a clock signal terminal, and an analog switch unit; a data latch unit for latching the data under control of the clock signal; and an output drive unit for inverting and outputting the data received from the data latch unit, the analog switch unit, the data latch unit, and the output drive unit being sequentially connected in series between the input terminal and the output terminal, and the analog switch unit and the data latch unit having a node therebetween, wherein the leakage compensation dynamic register further comprises a leakage compensation unit electrically connected between the node and the output terminal.