Circuitry for correcting non-linearity of an analog-to-digital converter. A non-linearity correction system for an analog-to-digital converter (ADC) includes coefficient storage, coefficient transformation circuitry, and correction circuitry. The coefficient storage is encoded with a first set of coefficients for correcting non-linearity of the ADC at a first sampling rate. The coefficient transformation circuitry is coupled to the coefficient storage. The coefficient transformation circuitry is configured to generate a second set of coefficients for correcting non-linearity of the ADC at a different sampling rate. The correction circuitry is configured to apply the second set of coefficients to correct non-linearity in output of the ADC while the ADC is operating at the different sampling rate.

Circuitry for correcting non-linearity of an analog-to-digital converter. A non-linearity correction system for an analog-to-digital converter (ADC) includes coefficient storage, coefficient transformation circuitry, and correction circuitry. The coefficient storage is encoded with a first set of coefficients for correcting non-linearity of the ADC at a first sampling rate. The coefficient transformation circuitry is coupled to the coefficient storage. The coefficient transformation circuitry is configured to generate a second set of coefficients for correcting non-linearity of the ADC at a different sampling rate. The correction circuitry is configured to apply the second set of coefficients to correct non-linearity in output of the ADC while the ADC is operating at the different sampling rate.

A successive approximation register analog to digital converter (SAR ADC) is provided in which impact of dielectric absorption is reduced with a correction circuit configured to adjust a present digital code value signal based at least in part upon a previous digital code value signal, an acquisition time and temperature.

Various techniques that can provide a capability to background calibrate ADC linearity error, e.g., due to capacitor mismatch drift and other parameter drift, during normal ADC operation in which analog-to-digital signal conversions are ongoing. A method can include grouping capacitors of an ADC into multiple clusters and calibrating under an arbitrary signal condition. To quickly converge the calibration result, the same arbitrary signal can be converted twice, and the capacitor(s) being calibrated can be modulated after first conversion. The difference between the results of the first and second conversions can contain the error information that can be used for calibration, and the signal component can be removed by this process. These techniques can provide improved linearity at 20-bit level and beyond.

Methods and apparatus for controlling a power supply voltage for a switch driver in a digital-to-analog converter (DAC). An example DAC generally includes a plurality of DAC cells, each DAC cell comprising a current source, a first switch coupled in series with the current source at a first node, and a switch driver having an output coupled to a control input of the first switch; and calibration circuitry having a first input coupled to a first DAC cell in the plurality of DAC cells and having an output coupled to at least one of the plurality of DAC cells, the calibration circuitry being configured to sense a voltage of the first node in the first DAC cell and to control the power supply voltage for the switch driver in the at least one of the plurality of DAC cells, based on the sensed voltage of the first node.

Described herein are systems and methods related to a converter includes a number of unit cells. The unit cells each include a first transistor and a second transistor. The first transistor is coupled in series with an output of the unit cell, and the second transistor is configured to have a capacitive characteristic that reduces a non-linear capacitive characteristic of the first transistor. The converter can be a voltage or current mode digital to analog converter.

According to an embodiment, a digital microphone includes an analog-to-digital converter (ADC) for receiving an analog input signal; a DC blocker component coupled to the ADC; a digital low pass filter coupled to the DC block component; and a nonlinear compensation component coupled to the digital low pass filter for providing a digital output signal.

In accordance with an embodiment, a method for operating a successive approximation ADC comprising a first capacitor array includes measuring a first weight of an MSB-a.sup.th bit of the ADC by applying a first reference voltage to first terminals of capacitors of the first capacitor array corresponding to the MSB-a.sup.th bit, applying a second reference voltage to first terminals of capacitors of the first capacitor array corresponding to significant bits lower than the MSB-a.sup.th bit, applying the first reference voltage to first terminals of a first set of capacitors of the first capacitor array corresponding to significant bits higher than the MSB-a.sup.th bit, and applying the second reference voltage to first terminals of a second set of capacitors of the first capacitor array corresponding to the significant bits higher than the MSB-a.sup.th bit; subsequently, a weight of a capacitance of the capacitors corresponding to the MSB-a.sup.th bit is successively approximated.

In an example, a system includes an input channel and a voltage to delay converter (V2D) coupled to the input channel. The system also includes a first multiplexer coupled to the V2D and an analog-to-digital converter (ADC) coupled to the first multiplexer. The system includes a second multiplexer coupled to the input channel and an auxiliary ADC coupled to the second multiplexer. The system includes calibration circuitry coupled to an output of the auxiliary ADC, where the calibration circuitry is configured to correct a non-linearity in a signal provided by the input channel. The calibration circuitry is also configured to determine the non-linearity of the signal provided to the ADC relative to the signal provided to the auxiliary ADC.

The present invention discloses a digital-to-analog conversion apparatus having signal calibration mechanism. A DAC circuit includes conversion circuits to generate an output analog signal and an echo-canceling analog signal. An echo transmission circuit performs signal processing on an echo path to generate an echo signal. An echo calibration circuit includes odd and even calibration circuits to perform mapping according to offset tables and perform processing according to response coefficients on odd and even input parts of an input digital signal to generate odd and even calibration parts of an echo-canceling calibration signal. A calibration parameter calculation circuit generates offsets according to an error signal between the echo signal and the echo-canceling calibration signal and path information related to the echo calibration circuit. The echo calibration circuit makes the coefficients converge according to the error signal and pseudo noise transmission path information, and updates the offset tables according to the offset.