A data register unit, a SAR ADC and an electronic device are disclosed. The data register unit comprises: a first high-speed flip-flop; a second high-speed flip-flop; and a third logic gate, wherein the first high-speed flip-flop and the second high-speed flip-flop comprise a high-speed flip-flop circuit respectively, which comprises: a first PMOS transistor, a first NMOS transistor, an inverter and a logic gate. The data register unit of the present disclosure is composed of a high-speed flip-flop circuit with a very simple structure and suitable for fast operation. In a further embodiment, the high-speed flip-flop circuit can combine the bit pulse to realize the capacitor switching based on the comparison result. This increases the operation speed of the SAR ADC while significantly reducing the number of transistors required to implement the EMCS logic.

A converter includes a switched capacitor circuit that includes at least one capacitor and a plurality of main switches to provide an output current in response to an input voltage applied to the switched capacitor circuit. The converter further includes one or more bypass transistor switches to selectively provide an additional output current. The converter includes a common controller that controls the plurality of main switches and the one or more bypass transistor switches.

An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) and a comparator having a first input coupled to receive an output voltage of the DAC, a second input, and a comparison output. The ADC also includes successive-approximation-register (SAR) circuitry having an input to receive the comparison output, and an output to provide an uncalibrated digital value. The DAC includes a Most Significant Bits (MSBs) sub-DAC including a set of MSB DAC elements and a Least Significant Bits (LSBs) sub-DAC including a set of LSB DAC elements. The ADC also includes calibration circuitry which receives the uncalibrated digital value and applies one or more calibration values to the uncalibrated digital value to obtain a calibrated digital value. The calibration circuitry obtains a calibration value for each MSB DAC element using the set of LSB DAC elements, the termination element, and at least one of the one or more redundant DAC elements.

A control circuit for a successive approximation register analog-to-digital converter (SAR ADC). The SAR ADC includes a comparator and a switched-capacitor digital-to-analog converter (DAC). The switched-capacitor DAC includes a target capacitor. A first terminal of the target capacitor is coupled to an input terminal of the comparator. A second terminal of the target capacitor is coupled to a first reference voltage through a first switch and coupled to a second reference voltage through a second switch. The control circuit includes a third switch and a buffer circuit. The third switch is coupled between the first reference voltage and the second terminal of the target capacitor. The buffer circuit is coupled to the first switch and the third switch for controlling the first switch and the third switch based on a control signal.

A control circuit for a successive approximation register analog-to-digital converter (SAR ADC). The SAR ADC includes a comparator and a switched-capacitor digital-to-analog converter (DAC). The switched-capacitor DAC includes a target capacitor. A first terminal of the target capacitor is coupled to an input terminal of the comparator. A second terminal of the target capacitor is coupled to a first reference voltage through a first switch and coupled to a second reference voltage through a second switch. The control circuit includes a third switch and a buffer circuit. The third switch is coupled between the first reference voltage and the second terminal of the target capacitor. The buffer circuit is coupled to the first switch and the third switch for controlling the first switch and the third switch based on a control signal.

The amplifier load current cancellation in a current integrator comprises applying an input current to an operational transconductance amplifier provided with an integration capacitor for current integration, leading an output current of the operational transconductance amplifier through a sensing resistor, thus producing a voltage drop over the sensing resistor, generating a cancellation current dependent on the voltage drop over the sensing resistor, and injecting the cancellation current to the output current, before or after the output current passes the sensing resistor, thus eliminating a dependence of the output current on the input current.

A method is described that is performed by a calibration system. The method includes determining a set of perturbation values for configuring an analog-to-digital converter of the calibration system; generating a set of digital test values for determining the accuracy of the analog-to-digital converter; and applying the set of perturbation values to the set of digital test values to generate a set of modified test values, wherein the set of perturbation values are digital values that are applied to the set of digital test values in the digital domain.

An image sensing system and methods for operating the same are disclosed. An image sensing system includes a plurality of pixel circuits, a multiplexer configured to select one of the pixel circuit and provide analog pixel data without sampling, and a successive approximation register (SAR) analog-to-digital converter (ADC) configured to convert the analog pixel data into digital data. The SAR ADC includes a capacitive digital-to-analog converter (CDAC) configured to convert contents of the SAR into a corresponding analog signal for comparison, by a comparator, with the analog pixel data. The CDAC includes a two-dimensional array of circuit elements. A control circuit in the image sensing system is configured to cause random ones of the circuit elements of the CDAC to be selected for generation of the corresponding analog signal and add a dithering signal so a CDAC output and shuffle a multiplexer switch sequence to improve fixed pattern noise.

Differential electro-mechanical oscillating circuits are described. These circuits may be used in a variety of contexts to produce differential oscillating signals, such as sine waves or square waves. A switched capacitor circuit (SCC) is used to prevent low-frequency locking, whereby the output of the resonator would otherwise lock to a constant value. More specifically, the SCC provides an impedance in parallel to the resonator between the output terminals of oscillating circuit. The SCC is designed so that, at low frequencies, its impedance is lower than the impedance of the resonator. The presence of such an impedance prevents the formation of an open circuit between the output terminals, thus maintaining the oscillating circuit in the oscillation mode. The differential electro-mechanical oscillating circuits described herein may be used to produce clock signals or otherwise to produce periodic reference signals.

Differential electro-mechanical oscillating circuits are described. These circuits may be used in a variety of contexts to produce differential oscillating signals, such as sine waves or square waves. A switched capacitor circuit (SCC) is used to prevent low-frequency locking, whereby the output of the resonator would otherwise lock to a constant value. More specifically, the SCC provides an impedance in parallel to the resonator between the output terminals of oscillating circuit. The SCC is designed so that, at low frequencies, its impedance is lower than the impedance of the resonator. The presence of such an impedance prevents the formation of an open circuit between the output terminals, thus maintaining the oscillating circuit in the oscillation mode. The differential electro-mechanical oscillating circuits described herein may be used to produce clock signals or otherwise to produce periodic reference signals.