H03M1/466

COMPACT, LOW POWER, HIGH RESOLUTION ADC PER PIXEL FOR LARGE AREA PIXEL DETECTORS
20210377477 · 2021-12-02 ·

A compact ADC circuit can include one or more comparators, and a serial DAC (Digital-to-Analog) circuit that provides a signal to the comparator (or comparators). In addition, the ADC circuit can include a serial DAC redistribution sequencer that can provide a plurality of signals as input to the serial DAC circuit and is subject to a redistribution cycle and which receives as input a signal from a data multiplexer whose input connects electronically to an output of the comparator. The circuit can further include an ADC code register that provides an ADC output that connects electronically to the output of the comparator and the input to the data multiplexer. Shared logic circuitry for sharing common logic between pixels can be included, wherein the shared logic circuitry connects electronically to the data multiplexer and the ADC code register, wherein the shared logic circuitry promotes area and power savings for the pixel detector circuit.

ANALOG-TO-DIGITAL CONVERTER CAPABLE OF CANCELLING SAMPLING NOISE
20210376846 · 2021-12-02 ·

The present application discloses an analog-to-digital converter capable of cancelling sampling noise, which comprises: a sampling circuit configured to acquire an analog input signal; a sampling noise cancelling circuit has an input end connected with an output end of the sampling circuit, and is configured to cancel noise generated by the sampling circuit; a comparator has an input end connected with an output end of the sampling noise cancelling circuit, and an output end connected with an input end of a logic circuit, and is configured to compare magnitudes of output signals of the sampling noise cancelling circuit and output a comparison result to the logic circuit; and the logic circuit has an output end connected with the sampling circuit, and is configured to output a digital output signal, and process the comparison result to obtain a control signal by which an output voltage of the sampling circuit is controlled.

HIGH-SPEED SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CONVERTER WITH IMPROVED MISMATCH TOLERANCE

An image sensor may contain an array of imaging pixels. Each pixel column outputs signals that are read out using a successive approximation register (SAR) analog-to-digital converter (ADC). The SAR ADC may include at least first and second input sampling capacitors, a comparator, a capacitive digital-to-analog converter (CDAC), and associated control circuitry. If desired, the SAR ADC may include a bank of more than two input sampling capacitors alternating between sampling and conversion. The first capacitor may be used to sample an input signal while conversion for the second capacitor is taking place. Prior to conversion, an input voltage of the comparator and an output voltage of the CDAC may be initialized. During conversion of the signal on the first capacitor, the first capacitor is embedded within the SAR ADC feedback loop to prevent charge sharing between the input sampling capacitor and the CDAC, thereby mitigating potential capacitor mismatch issues.

SAR ADC with Alternating Low and High Precision Comparators and Uneven Allocation of Redundancy
20220209780 · 2022-06-30 ·

A Successive Approximation Register, SAR, Analog to Digital Converter, ADC, (50) achieves high speed and accuracy by (1) alternating at least some decisions between sets of comparators having different accuracy and noise characteristics, and (2) unevenly allocating redundancy (in the form of LSBs of range) for successive decisions according to the accuracy/noise of the comparator used for the preceding decision. The redundancy allocation is compensated by the addition of decision cycles. Alternating between different comparators removes the comparator reset time (treset) from the critical path, at least for those decision cycles. The uneven allocation of redundancy—specifically, allocating more redundancy to decision cycles immediately following the use of a lower accuracy/higher noise comparators—compensates for the lower accuracy and prevents the need for larger redundancy (relative to the full-scale range of a decision cycle) later in the ADC process.

METAL-OXIDE-SEMICONDUCTOR CAPACITOR BASED PASSIVE AMPLIFIER

A passive amplifier is provided that includes an input sampling switch, a sampling capacitance, and metal-oxide-semiconductor capacitor devices. An input signal may be sampled onto the sampling capacitance by turning on the input sampling switch while the metal-oxide-semiconductor capacitors are activated. After the sampling phase, the metal-oxide-semiconductor capacitors are deactivated to provide a voltage gain. The voltage gain can be conditionally applied depending on the signal level of the sampled input.

Driver for a circuit with a capacitive load

A driver for a circuit with a capacitive load is configured for coupling to a voltage source which provides a DC input voltage, and is configured to generate an output voltage at an output. The driver includes a bidirectional synchronous power converter with a first switch, a second switch, and an inductive device connected to the first and/or second switch. A controller is configured to control the first switch and the second switch. The bidirectional synchronous power converter generates a switching voltage from the input voltage at a switching node and generates the output voltage having an analog voltage waveform with a peak amplitude of at least twice the input voltage.

INDUCTIVE SENSING METHODS, DEVICES AND SYSTEMS

A method can include in a first phase of a sensing operation, controlling at least a first switch to energize a sensor inductance; in a second phase of the sensing operation that follows the first phase, controlling at least a second switch to couple the sensor inductance to a first modulator capacitance to induce a first fly-back current from the sensor inductance, the first fly-back current generating a first modulator voltage at the first modulator capacitance, and in response to the first modulator voltage, controlling at least a third switch to generate a balance current that flows in an opposite direction to the fly-back current at the first modulator node. The first and second phases can be repeated to generate a first modulator voltage at the first modulator capacitance. the modulator voltage can be converted into a digital value representing the sensor inductance. Related devices and systems are also disclosed.

Solid-state imaging element, imaging apparatus, and control method of solid-state imaging element with improved reading speed of pixel signals

It is intended to improve reading speed of pixel signals in a solid-state imaging element provided with an ADC. A plurality of pixels are arrayed in a pixel block. A drive circuit drives the pixel block to output a plurality of pixel signals at the same time. A comparator successively selects the plurality of pixel signals and compares the selected pixel signals and a predetermined reference signal. A control section generates a control signal for updating the predetermined reference signal on the basis of comparison results of the comparator. A reference signal update section updates the predetermined reference signal according to the control signal.

Precision digital to analog conversion in the presence of variable and uncertain fractional bit contributions
11368163 · 2022-06-21 · ·

This disclosure describes systems, methods, and apparatus for a digital-to-analog (DAC) converter, that can be part of a variable capacitor and/or a match network. The DAC can include a digital input, an analog output, N contributors (e.g., switched capacitors), and an interconnect topology connecting the N contributors, generating a sum of their contributions (e.g., sum of capacitances), and providing the sum to the analog output. The N contributors can form a sub-binary sequence when their contributions to the sum are ordered by average contribution. Also, the gap size between a maximum contribution of one contributor, and a minimum contribution of a subsequent contributor, is less than D, where D is less than or equal to two time a maximum contribution of the first or smallest of the N contributors.

Image sensor

It is an object of the present technology to provide an image sensor capable of reducing crosstalk in an AD conversion unit. The image sensor includes: capacitors in an even-numbered column region; and a capacitor in an odd-numbered column region disposed facing the capacitors in the even-numbered column region with different areas.