A photoelectric conversion device includes a light receiving circuit configured to convert light into an electrical signal, a first hold circuit configured to hold a data signal which represents the electrical signal, a second hold circuit configured to hold a noise signal read out from the light receiving circuit in a reset state, a first resistive element to which a voltage corresponding to a difference between the data signal held by the first hold circuit and the noise signal held by the second hold circuit is applied, an A/D converter configured to convert an analog current flowing in the first resistive element into digital data, a second resistive element, and a temperature detection circuit configured to generate, based on a current flowing in the second resistive element, an analog output corresponding to an internal temperature of the photoelectric conversion device.

Facilitating minimization of non-linearity effects of a delay of a capacitance-to-voltage (C2V) converter on an output of a gyroscope is presented herein. A sense output signal of a sense mass of the gyroscope and a drive output signal of a drive mass of the gyroscope are electronically coupled to respective analog-to-digital converter (ADC) inputs of bandpass sigma-delta ADCs of the gyroscope. The bandpass sigma-delta ADCs include respective C2V converters that are electronically coupled, via respective feedback loops, to the respective ADC inputs to facilitate reductions of respective propagation delays of the bandpass sigma-delta ADCs. Respective ADC outputs of the bandpass sigma-delta ADCs are electronically coupled to demodulator inputs of a demodulator of the gyroscope that transforms the sense output into an output of the MEMS gyroscope representing an external stimulus that has been applied to the sense mass.

An apparatus comprises a delta-sigma analog-to-digital converter (ADC) and baseband processing circuitry. The delta-sigma ADC includes a plurality of integrator stages connected in series, including a first integrator stage operatively coupled to an input of the delta-sigma ADC; a main quantizer circuit including a main ADC circuit and a main digital-to-analog converter (DAC) circuit, wherein an input to the main ADC circuit is operatively coupled to the plurality of integrator stages; and a first feedback circuit path operatively coupled from an output of the first integrator stage to the input of the delta-sigma ADC, wherein the first feedback circuit path is configured to subtract an output voltage of the first integrator stage from the input of the delta-sigma ADC. The baseband circuitry is configured to activate the first feedback circuit path when detecting that the input voltage increases to cause distortion in the delta-sigma ADC.

The disclosure is directed to low-power high-resolution analog-to-digital converter (ADCs) circuits implemented with a delta-sigma modulators (DSMs). The DSM includes a single-bit, self-oscillating digital to analog converter (SB-DAC) and a dual-slope integrating quantizer that may replace an N-bit quantizer found in a conventional DSM. The integrating quantizer of this disclosure oscillates after quantization because the SB-DAC in the feedback path directly closes the DSM loop. The integrating quantizer circuit includes a switch at the input and two phases per sample cycle. During the first phase the switch sends an input analog signal to an integrator. During the second phase, the switch sends the feedback signal from the output of the self-oscillating SB-DAC to the integrator. The input to the SB-DAC may be output from a clocked comparator.

During a sampling phase, an analog front end circuit connects input of a first sampling capacitor to an analog input signal and input of a second sampling capacitor to a reference signal, and connects first and second hold capacitors to ground. During a partial tracking phase, input of the first sampling capacitor is connected to the reference voltage and the input of the second sampling capacitor is connected to the analog input signal. The first hold capacitor is connected to a first output of a gain amplifier and the second hold capacitor to a second output of the gain amplifier. Output of the first sampling capacitor is coupled to a first input of an amplifier and output of the second sampling capacitor is coupled to a second input of the amplifier.

In accordance with an embodiment, a circuit includes a current digital-to-analog converter (DAC) having a current switching network coupled to a current DAC output, a first cascode current source coupled between a first supply node and the current switching network, a second cascode current source between a second supply node and the current switching network, and a shorting switch coupled between a first cascode node of the first cascode current source, and a second cascode node of the second cascode current source.

A voltage-controlled oscillator-based delta-sigma analog-to-digital converter (VCO-based ΔΣ ADC) includes a VCO-based quantizer that includes delay elements to provide VCO outputs based on an analog input signal and combining logic to combine the VCO outputs so as to provide quantized outputs. Detection logic detects saturation of the VCO-based quantizer based on the quantized outputs and at least a portion of the VCO outputs. The VCO-based ΔΣ ADC also includes correction logic to modify the quantized outputs and provide modified quantized outputs in response to the detection logic detecting the saturation of the VCO-based quantizer and to provide the quantized outputs unmodified in the absence of saturation being detected.

An analog/digital converter (ADC) includes an analog stage with at least one first sigma-delta modulator and includes a digital stage with at least one second sigma-delta modulator. The analog stage is configured for outputting a digital signal to the digital stage that is indicative of a noise contribution of the at least one first sigma-delta modulator. The analog stage and the digital stage may be arranged in a multi-stage noise shaping architecture (MASH) architecture.

Radio-frequency (RF) receivers having bandpass sigma-delta analog sigma analog-to-digital converters (ADC) designed to digitize signals in the RF domain are described. Such bandpass ADCs utilize one or more of the following techniques to enhance noise immunity and reduce power consumption: generation of in-phase (I) and quadrature (Q) paths in the digital domain, n.sup.th order resonant bandpass filtering with n>1, and signal sub-sampling in an i.sup.th Nyquist zone with i>1. Compared to RF receivers in which the I and Q paths are generated in the analog domain, these RF receivers exhibit higher IRRs because they are not susceptible to in-phase/quadrature (IQ) mismatch. Using n.sup.th order resonant bandpass filtering with n>1 attenuates unwanted image tones. The bandpass ADC-based RF receivers described herein exhibit enhanced immunity to noise, achieving for example image rejection ratios (IRR) in excess of 95 dB.

A circuit includes a transconductance stage having first and second outputs. The circuit also includes a comparator having first and second inputs. The first input is coupled to the first output, and the second input is coupled to the second output. The comparator includes first through fifth transistors and a pair of cross-coupled transistors. The pair of cross-coupled transistors is coupled to the second current terminals of the first and second transistors. The second current terminal of the third transistor is coupled to the second current terminal of the first transistor, and the first current terminals of the first, second, and third transistors are coupled together. The second current terminals of the fourth and fifth transistors are coupled together and to the control input of the third transistor.