A semiconductor device includes: a die pad having a conductive property; a semiconductor chip; a back surface electrode formed on a back surface of the semiconductor chip; an Ag bonding material containing 50 to 85% Ag and bonding the back surface electrode and the die pad; a terminal connected to the semiconductor chip; and sealing resin having an insulating property and covering the die pad, the semiconductor chip, the Ag bonding material, and a part of the terminal, wherein a distal end of the terminal protruding from the sealing resin includes a substrate bonding surface, a metal burr protrudes from a peripheral portion on a lower surface of the back surface electrode contacting the Ag bonding material, and a thickness of the Ag bonding material is larger than a height in an up-down direction of the metal burr by 2 .Math.m or more.

A lead frame used to assemble a semiconductor device, such as a smart card, has a first major surface including exposed leads and a second major surface including a die receiving area and one or more connection pads surrounding the die receiving area. The connection pads enable electrical connection of an Integrated Circuit (IC) die to the exposed leads. A molding tape sized and shaped like the lead frame is adhered to and covers the second major surface of the lead frame. The molding tape has a die receiving area cut-out that exposes the die receiving area and the connection pads on the second major surface of the lead frame and forms a cavity for receiving an encapsulant. The cut-out has an elevated sidewall for retaining the encapsulant within the cavity.

A semiconductor module includes a semiconductor die, an encapsulation encapsulating the die, and first and second power contacts electrically coupled to the die. The power contacts each include an external part exposed from the encapsulation and an overlapping part. The power contacts are configured to carry respective first and second currents. A current flow of the first current in the external part of the first power contact points into or out of the semiconductor module. A current flow of the second current in the external part of the second power contact points in the opposite direction of the first current flow. The overlapping parts overlap such that the current flows point in the same direction in the overlapping parts. The overlapping parts include overlapping slots configured to accept a current sensor element for measuring a combined current in the overlapping parts.

Semiconductor packages and methods for manufacturing are disclosed. In one example, a method for manufacturing a semiconductor package includes providing an electrically conductive chip carrier including a mounting surface and a protrusion extending out of the mounting surface. At least one semiconductor chip is arranged on the mounting surface. The method further includes encapsulating the protrusion and the at least one semiconductor chip in an encapsulation material, wherein surfaces of the protrusion and the at least one semiconductor chip facing away from the mounting surface remain uncovered by the encapsulation material. An electrical redistribution layer is formed over the surfaces of the protrusion and the at least one semiconductor chip facing away from the mounting surface. The electrical redistribution layer provides an electrical connection between the protrusion and the at least one semiconductor chip.

According to a first aspect of the present invention there is provided a quad-flat-no-leads (QFN) packaged semiconductor device having a QFN bottom surface and QFN side faces, wherein the QFN side faces each comprise an upper portion and a recessed lower portion, the QFN packaged semiconductor device comprising: a die pad within or on the QFN bottom surface; a plurality of I/O terminals spaced apart from the die pad and around a periphery of the bottom surface, each having a bottom face extending from an inner end to a peripheral end, an exposed side face on a QFN side face and extending above the recessed lower portion of the QFN side face; wherein the QFN bottom surface includes at least one trench therein, parallel to a one of the QFN side faces and exposing at least a part of a side face of the inner end of the I/O terminals. The trench may provide for additional surface area, and provide a stronger solder joint when the QFN packaged semiconductor device is soldered to a substrate or circuit board.

A method of forming a semiconductor package includes providing a panel, providing one or more metal layers on an upper surface of the panel, forming a die pad and bond pads from the one or more metal layers, the die pad being adjacent to and spaced apart from the bond pads, attaching a die to the die pad, forming electrical connections between the die and the bond pads, encapsulating the die and the electrical connections with an electrically insulating mold compound, removing portions of the panel, and exposing the die pad and the bond pads after encapsulating the die.

A semiconductor device includes: a first semiconductor element; a second semiconductor element; a first insulating base member adhesively bonded to the first semiconductor element; a first wiring connected to a first electrode of the first semiconductor element, and disposed on the first insulating base member; a second insulating base member adhesively bonded to the second semiconductor element, a second wiring connected to a third electrode of the second semiconductor element, and disposed on the second insulating base member; a first wiring member connected to a second electrode of the first semiconductor element; a second wiring member electrically connected to the first wiring and a fourth electrode of the second semiconductor element; and a third wiring member connected to the second wiring. A current flows in a first direction in the first wiring member, and flows in a second direction opposite to the first direction in the third wiring member.

An electronic component package includes: a sealing resin layer; a metal member buried therein and including a die bond portion and a terminal electrode portion located outside the die bond portion; a ceramic substrate buried in the sealing resin layer; and an electronic component disposed on the die bond portion. When viewed in plan, the die bond portion and the ceramic substrate are partially overlapped to be in contact with each other, and the terminal electrode portion and the ceramic substrate are partially overlapped to be in contact with each other. The electronic component is electrically connected to the terminal electrode portion. The metal member includes a first plating layer and a second plating layer, and the average crystal grain diameter of the first plating layer is smaller than the average crystal grain diameter of the second plating layer.

A leadless semiconductor package includes a plurality of internal gull wing leads forming a concave region and an IC die disposed in the concave region and having a plurality of conductive bumps at a first surface connected to corresponding proximal sections of the internal gull wing leads. Distal ends of the internal gull wing leads form surface mount pads at a mounting surface of the leadless semiconductor package for mounting the package to a circuit board. Packaging encapsulant extends between the mounting surface and an opposing surface of the package and encapsulates the first surface of the IC die and the proximal ends of the internal gull wing lead structures. In some implementations, the mounting surface further includes a second surface of the IC die opposite the first surface and thus a thermally conductive material may be disposed between the second surface of the IC die and the circuit board.

A method includes providing a lead frame with a central metal plate and a plurality of leads extending away from the central metal plate, the central metal plate including an upper surface that includes a first mesa that is elevated from recessed regions, mounting a semiconductor die on the upper surface of central metal plate such that a lower surface of the semiconductor die is at least partially disposed on the first mesa, forming electrical interconnections between terminals of the semiconductor die and the leads, forming an encapsulant body on the central metal plate such that the semiconductor die is encapsulated by the encapsulant body and such that the leads protrude out from edge sides of the encapsulant body, and thinning the central metal plate from a rear surface of the central metal plate so as to isolate the first mesa at a lower surface of the encapsulant body.