A power switch circuit comprises a first level shifter configured to turn on a first switching element configured to receive a supply voltage from an external voltage supply pad in response to a program operation of a one-time programmable (OTP) memory cell array, a second level shifter configured to turn on a second switching element and provide the supply voltage to the OTP memory cell array in response to the program operation, a third level shifter configured to turn on a third switching element and provide an internally generated power voltage to the OTP memory cell array in response to a read operation of the OTP memory cell array, and an Electro-Static Discharge (ESD) protection circuit configured to turn off the first switching element in response to a flow of ESD voltage from the voltage supply pad.

A driving circuit including a detection circuit, a first control circuit, a second control circuit, and a driving transistor is provided. The detection circuit is coupled between a first power terminal and a second power terminal and generates a detection signal according to the voltages of the first and second power terminals. The first control circuit generates a first control signal according to the detection signal. The second control circuit generates a second control signal according to the detection signal. The driving transistor is coupled between an input-output pad and the second power terminal. When the detection signal is at a first level, the driving transistor is turned on according to the first control signal. When the detection signal is at a second level, the driving transistor is configured to operate according to the second control signal. The first level is different from the second level.

A method of manufacturing a semiconductor die includes: forming a power HEMT (high-electron-mobility transistor) in a III-nitride semiconductor substrate, the power HEMT having a gate, a source and a drain; monolithically integrating a first gate driver HEMT with the power HEMT in the III-nitride semiconductor substrate, the first gate driver HEMT having a gate, a source and a drain and logically forming part of a driver; and electrically connecting the first gate driver HEMT to the gate of the power HEMT so that the first gate driver HEMT is operable to turn the power HEMT off or on responsive to an externally-generated control signal received from the driver or other device.

A half bridge GaN circuit is disclosed. The circuit includes a low side power switch configured to be selectively conductive according to one or more input signals, a high side power switch configured to be selectively conductive according to the one or more input signals, and a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals. The high side power switch controller includes a capacitor, and a logic circuit, wherein the capacitor is configured to capacitively couple a signal based on the input signals to the logic circuit, and the logic circuit is configured to control the conductivity of the high sigh power switch based on the capacitively coupled signal.

Some embodiments include apparatus and methods using a first transistor coupled between a node and a supply node, a second transistor coupled between the node and a ground node, an electrostatic discharge (ESD) protection unit including a diode coupled between the node and an additional node, and a transistor coupled between the additional node and the supply node.

A half bridge GaN circuit is disclosed. The circuit includes a low side power switch configured to be selectively conductive according to one or more input signals, a high side power switch configured to be selectively conductive according to the one or more input signals, and a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals. The high side power switch controller includes a capacitor, and a logic circuit, wherein the capacitor is configured to capacitively couple a signal based on the input signals to the logic circuit, and the logic circuit is configured to control the conductivity of the high sigh power switch based on the capacitively coupled signal.

A transistor includes a substrate of a first conductivity type. An epitaxial layer of the first conductivity type is formed at a top surface of the substrate. A first region of the first conductivity type is formed as a well in the epitaxial layer. A second region of a second conductivity type is formed as a well in the epitaxial layer adjacent to the first region and the second conductivity type is opposite of the first conductivity type. A third region of the second conductivity type is formed in the first region and a portion of the first region forms a channel region between the third region and the second region. An emitter region of the first conductivity type is formed in the second region. A gate dielectric is formed over the channel region, and a gate electrode is formed on gate dielectric with the gate electrode overlapping at least a portion of second region and the third region.

Electrostatic discharge protection circuitry includes a transistor pass-gate coupled between potential source of electrostatic discharge-driven current (ESD current) and an input node of a circuit block is configured provide a sufficiently resistive current path between a first current terminal and a second current terminal of the pass gate such that, when an amount of charge sufficient to cause an ESD event accumulates at the potential ESD current source, a sufficient voltage drop occurs across the pass gate such that devices coupled to the input node of the circuit block are protected from experiencing a voltage drop across them that is above a predetermined threshold voltage.

A trigger circuit for controlling a electrostatic discharge (ESD), protection switch is provided. The present disclosure further relates to a high-voltage trigger circuit for use in eFuse (electronic fuse), load switch or ideal diode applications, or in any other application with a large n-channel FET between two pins. The trigger circuit ensures that the ESD protection gate can be left floating after the ESD event.

A half bridge GaN circuit is disclosed. The circuit includes a low side power switch configured to be selectively conductive according to one or more input signals, a high side power switch configured to be selectively conductive according to the one or more input signals, and a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals. The high side power switch controller includes a capacitor, and a logic circuit, wherein the capacitor is configured to capacitively couple a signal based on the input signals to the logic circuit, and the logic circuit is configured to control the conductivity of the high sigh power switch based on the capacitively coupled signal.