An amplifier includes: a first input transistor connected to a first input, a first output, and a power source or a ground, a second input transistor connected to a second input, a second output, and the power source or the ground; a first replica transistor connected to the first input, a detection node, and the power source or the ground; a second replica transistor connected to the second input, the detection node, and the power source or the ground; and a bias transistor connected to a bias voltage, the detection node, and the power source or the ground.

A differential amplifier is provided. The differential amplifier includes: a differential input circuit, adjusting a second current and a third current flowing into the differential input circuit according to a first input voltage, a second input voltage, and a first current; a first current source circuit, generating the first current according to a first reference voltage; a current-mirror circuit, generating a fifth current according to a fourth current; a second current source circuit, generating a sixth current and a seventh current according to a second reference voltage; and an impedance circuit, coupled to the current-mirror circuit and a ground terminal, the differential amplifier having a low output voltage error.

A stabilization technique is disclosed that suppresses or inhibits glitching behavior on automated test equipment (ATE) during mode transitions. Adjustable stabilizing circuitry can be coupled to at least one of a force voltage circuit or a force current circuit is forcing voltage or current to a device under test (DUT). The adjustable stabilizing circuitry can be adjustably configurable in response to whether at least one of a current clamp or a voltage clamp is in an active clamping mode. In this manner, unwanted glitching behavior associated with mode changes can be reduced or suppressed.

The present invention includes a current integrator for an organic light-emitting diode (OLED) panel. The current integrator includes an operational amplifier, which includes an output stage. The output stage, coupled to an output terminal of the current integrator, includes a first output transistor, a second output transistor, a first stack transistor and a second stack transistor. The first stack transistor is coupled between the first output transistor and the output terminal. The second stack transistor is coupled between the second output transistor and the output terminal.

A decision feedback equalizer circuit includes first and second equalizers implemented in parallel. Each equalizer includes: an adder; and a comparator configured to alternatingly perform refreshing and sampling for a differential signal output from the adder. The comparator includes: a differential amplifier configured to output a differential signal having same values in a refresh period, and output a differential signal corresponding to the differential signal output from the adder in a sampling period; and a latch circuit configured to perform a decision operation based on a comparison between two signals that form the differential signal output from the differential amplifier, and to latch a decision result. The adder in the first equalizer controls the differential signal based on the decision in the second equalizer, and the adder in the second equalizer controls the differential signal based on the decision in the first equalizer.

A circuit arrangement, including: a circuit configured to synthesize a resistor having a resistance value having a variation in time equivalent to a resistance variation of a sensor resistor applied with a resistance bias voltage and a resistance current bias, wherein the circuit includes: an amplifier comprising an input transistor; a bias current generator comprising a control node coupled to an output of the input transistor, wherein the bias current generator is configured to generate a bias current flowing in the input transistor; and a further current generator configured to generate a current at least proportional to the resistance bias current and coupled to the output of the input transistor, wherein the resistance bias voltage is applied to an input of the amplifier, and wherein a transconductance of the input transistor is at least proportional to the resistance of the sensor resistor.

A circuit includes a first transconductance stage having an output. The circuit further includes an output transconductance stage, and a first source-degenerated transistor having a first control input and first and second current terminals. The first control input is coupled to the output of the first transconductance stage. The circuit also includes a second transistor having a second control input and third and fourth current terminals. The third current terminal is coupled to the second current terminal and to the output transconductance stage.

A variable gain amplifier includes a first transistor group which is connected to an input terminal and an output terminal, and which amplifies a signal from the input terminal to output the amplified signal to the output terminal; a second transistor group connected to the input terminal; a third transistor group connected to the output terminal; and a controller configured to control the first transistor group, the second transistor group, and the third transistor group so that a total number of the number of transistors to be turned on in the first transistor group and the second transistor group is kept at a constant value, and total numbers of transistors to be turned on in the first transistor group and in the third transistor group are the same.

A stabilization technique is disclosed that suppresses or inhibits glitching behavior on automated test equipment (ATE) during mode transitions. Adjustable stabilizing circuitry can be coupled to at least one of a force voltage circuit or a force current circuit is forcing voltage or current to a device under test (DUT). The adjustable stabilizing circuitry can be adjustably configurable in response to whether at least one of a current clamp or a voltage clamp is in an active clamping mode. In this manner, unwanted glitching behavior associated with mode changes can be reduced or suppressed.

A differential input stage of a circuit includes a first transistor, a second transistor, a third transistor, and a fourth transistor. Drains of the first and third transistors couple together at a first node, and drains of the second and fourth transistors couple together at a second node. A first slew boost circuit includes a fifth transistor and a first current mirror. A gate of the fifth transistor couples to the second node. A source of the fifth transistor couples to the first node. The first current mirror couples to the fifth transistor and to the second node. A second slew boost circuit includes a sixth transistor and a second current mirror. A gate of the sixth transistor couples to the first node. A source of the sixth transistor couples to the second node. The second current mirror couples to the sixth transistor and to the first node.