Patent classifications
H03F3/45219
INPUT STAGE FOR AN LVDS RECEIVER CIRCUIT
An input stage for an LVDS receiver circuit is provided, which includes at least one supply voltage connection as well as a first and a second stage input to be acted upon by a differential input signal pair. The input stage further includes a first and a second differential stage, the stage inputs being directly connected to one input each of the first differential stage and indirectly, via one level-shifting circuit each, to one input each of the second differential stage. According to the present invention, the first and the second differential stage are connected to the supply voltage connection via one transistor each of a third differential stage, the control input of one of these transistors being connected to a measuring path connecting the stage inputs to one another, with the control input of the other transistor being connected to an apparatus/device (arrangement) for providing a reference voltage.
Operational amplifier
An operational amplifier includes a first output transistor and a second output transistor connected in series between two power nodes, the second output transistor having a semiconductor type opposite to the first output transistor, the first output transistor and the second output transistor being electrically coupled at an output node, and gates of the first output transistor and the second output transistor being connected to a first drive node and a second drive node respectively; and a decoupling capacitor circuit electrically connected between the first drive node and the second drive node.
OUTPUT BUFFER AND DATA DRIVER CIRCUIT INCLUDING THE SAME
This disclosure relates to an output buffer including an input stage configured to monitor a difference between an input voltage and an output voltage, a current summing stage configured to generate amplified currents and control voltages according to the difference between the input voltage and the output voltage monitored by the input stage, an output stage configured to perform a pull-up operation or a pull-down operation according to the control voltages output from the current summing stage to generate the output voltage at an output terminal, and a slew boost circuit configured to perform a slew boost operation of adjusting some currents among currents provided from the current summing stage to the input stage according to the difference between the input voltage and the output voltage by monitoring the difference between the input voltage and the output voltage and selectively perform the slew boost operation by monitoring the control voltages.
Input stage for an LVDS receiver circuit
An input stage for an LVDS receiver circuit is provided, which includes at least one supply voltage connection as well as a first and a second stage input to be acted upon by a differential input signal pair. The input stage further includes a first and a second differential stage, the stage inputs being directly connected to one input each of the first differential stage and indirectly, via one level-shifting circuit each, to one input each of the second differential stage. According to the present invention, the first and the second differential stage are connected to the supply voltage connection via one transistor each of a third differential stage, the control input of one of these transistors being connected to a measuring path connecting the stage inputs to one another, with the control input of the other transistor being connected to an apparatus/device (arrangement) for providing a reference voltage.
Operational amplifier using single-stage amplifier with slew-rate enhancement and associated method
An operational amplifier includes a single-stage amplifier and a current controller. The single-stage amplifier receives an input signal, and amplifies the input signal to generate an output signal, wherein the single-stage amplifier includes a voltage controlled current source circuit that operates in response to a bias voltage input. The current controller receives the input signal, and generates the bias voltage input according to the input signal.
Reducing supply to ground current
An apparatus to prevent supply-to-ground current in a comparator is disclosed. The apparatus includes circuitry to determine if first and second output nodes of the comparator have respectively reached first and second logic levels, and circuitry responsive to a determination that the voltage at the first and second output nodes of the comparator has reached the first and second logic levels, to generate a signal. In addition, the apparatus includes circuitry to supply the signal to a transistor, the signal to turn off the transistor and prevent the flow of supply-to-ground current through the comparator.
Amplifier circuit
A first embodiment is directed to a circuit including a positive biasing circuit with a drive PMOS for biasing in subthreshold, a negative biasing circuit with a drive NMOS for biasing in subthreshold, and an amplification circuit coupled to the biasing circuits. The amplification circuit includes a first stage with a first boosting stage, a second stage with a second boosting stage, and a resistive element coupled between the first and second stages. A second embodiment is directed to a folded cascode operational amplifier wherein a value of the resistive element is selected to place at least one of a drive MOS in subthreshold. A third embodiment is directed to an integrated circuit with a resistive area neighboring a first boosting area and a second boosting area, the resistive area including a resistive element directly connected to a drive PMOS and a drive NMOS.
Amplifier circuit and circuit system using the same
An amplifier circuit has an output stage, a first current source, a second current source, a third current source, a fourth current source, and a voltage clamping voltage. The output stage has a first P-type transistor and a first N-type transistor. The voltage clamping circuit receives a first bias voltage and a second bias voltage, and has a first end and a second end. When a second input current is positive current and the input current is a negative current or a zero current, the first end provides a first clamping voltage greater than the first bias voltage to a gate of the first P-type transistor. When the first input current is positive and the second input current is a negative current or zero current, the second end provides a second clamping voltage lower than the second bias voltage to a gate of the first N-type transistor.
Operational amplifier
Disclosed herein is an operational amplifier including a non-inverting input terminal, an inverting input terminal, a P-type metal oxide semiconductor input differential pair, a first input tail current source, an N-type metal oxide semiconductor input differential pair, a second input tail current source, an output stage, a first correction circuit, and a second correction circuit. The first correction circuit and the second correction circuit operate over an operation region of the P-type metal oxide semiconductor input differential pair, an operation region of the N-type metal oxide semiconductor input differential pair, and a transition region in which both the P-type metal oxide semiconductor input differential pair and the N-type metal oxide semiconductor input differential pair operate.
AMPLIFIER CIRCUIT
A first embodiment is directed to a circuit including a positive biasing circuit with a drive PMOS for biasing in subthreshold, a negative biasing circuit with a drive NMOS for biasing in subthreshold, and an amplification circuit coupled to the biasing circuits. The amplification circuit includes a first stage with a first boosting stage, a second stage with a second boosting stage, and a resistive element coupled between the first and second stages. A second embodiment is directed to a folded cascode operational amplifier wherein a value of the resistive element is selected to place at least one of a drive MOS in subthreshold. A third embodiment is directed to an integrated circuit with a resistive area neighboring a first boosting area and a second boosting area, the resistive area including a resistive element directly connected to a drive PMOS and a drive NMOS.