H03K3/356121

Fused voltage level shifting latch

Some embodiments include apparatus and methods using an input stage and an output stage of a circuit. The input stage operates to receive an input signal and a clock signal and to provide an internal signal at an internal node based at least in part on the input signal. The input signal has levels in a first voltage range. The internal signal has levels in a second voltage range greater than the first voltage range. The output stage operates to receive the internal signal, the clock signal, and an additional signal generated based on the input signal. The output stage provides an output signal based at least in part on the input signal and the additional signal. The output signal has a third voltage range greater than the first voltage range.

Level-shifting transparent window sense amplifier
10734040 · 2020-08-04 · ·

Techniques are disclosed relating to level-shifting circuitry and time borrowing across voltage domains. In some embodiments, sense amplifier circuitry generates, based on an input signal at a first voltage level, an output signal at a second, different voltage level. Pulse circuitry may generate a pulse signal in response to an active clock edge of a clock signal that is input to the sense amplifier circuitry. Initial resolution circuitry may drive the output signal of the sense amplifier circuitry to match the value of the input signal during the pulse signal. Secondary resolution circuitry may maintain a current value of the output signal after expiration of the pulse signal. This may allow the input signal to change during the pulse, e.g., to enable time borrowing by upstream circuitry.

HIGH-SPEED DECISION DEVICE
20200213073 · 2020-07-02 ·

The invention relates to a high-speed decision device that comprises a first branch and a second branch that are connected in parallel between a power supply end and a clock signal input end; wherein the first branch is used for providing a normal-phase input end, and the second branch is used for providing an inverted-phase input end; a first adjusting point and a second adjusting point are arranged; and an adjusting branch is arranged between the first adjusting point and the second adjusting point, and the adjusting branch is used for adjusting the response speed when the clock signal changes. The benefit of the invention is that the response time of the circuit is further improved, the resolution of the high-speed decision device is improved, and the clock and data recovery performance of the high-speed decision device is further improved.

Cell of transmission gate free circuit and integrated circuit layout including the same

A semiconductor standard cell of a flip-flop circuit includes semiconductor fins extending substantially parallel to each other along a first direction, electrically conductive wirings disposed on a first level and extending substantially parallel to each other along the first direction, and gate electrode layers extending substantially parallel to a second direction substantially perpendicular to the first direction and formed on a second level different from the first level. The flip-flop circuit includes transistors made of the semiconductor fins and the gate electrode layers, receives a data input signal, stores the data input signal, and outputs a data output signal indicative of the stored data in response to a clock signal, the clock signal is the only clock signal received by the semiconductor standard cell, and the data input signal, the clock signal, and the data output signal are transmitted among the transistors through at least the electrically conductive wirings.

TIPLESS TRANSISTORS, SHORT-TIP TRANSISTORS, AND METHODS AND CIRCUITS THEREFOR
20200152626 · 2020-05-14 · ·

An integrated circuit can include a plurality of first transistors formed in a substrate and having gate lengths of less than one micron and at least one tipless transistor formed in the substrate and having a source-drain path coupled between a circuit node and a first power supply voltage. In addition or alternatively, an integrated circuit can include minimum feature size transistors; a signal driving circuit comprising a first transistor of a first conductivity type having a source-drain path coupled between a first power supply node and an output node, and a second transistor of a second conductivity type having a source-drain path coupled between a second power supply node and the output node, and a gate coupled to a gate of the first transistor, wherein the first or second transistor is a tipless transistor.

Flip-flop and semiconductor system including the same

A flip-flop generates a first feedback signal using a signal generated inside the flip-flop. The flip-flop includes a first stage circuit, a second stage circuit and a third stage circuit. The first stage circuit receives a first data signal and a clock signal and generates a first internal signal through a first node. The second stage circuit receives the first internal signal, the clock signal, and the first feedback signal and generates a second internal signal through a second node. The third stage circuit generates a second data signal by latching the second internal signal when the clock signal is at a first level, using the second internal signal and the clock signal. The second stage circuit cuts off at least one first current path between the second node and a power supply, based on the first feedback signal, when the clock signal is at a second level.

Soft error-resilient latch

A latch is provided. The latch includes a plurality of storage nodes including a plurality of data storage nodes configured to store a data bit having one of two states and a plurality of complementary data storage nodes configured to store a complement of the data bit. The latch includes a plurality of supply voltage multi-dependency stages respectively corresponding to the plurality of storage nodes. Each supply voltage multi-dependency stage has an output coupled to a storage node and at least two control inputs respectively coupled to at least two other storage nodes of the plurality of storage nodes. The supply voltage multi-dependency stage is configured to cause a state of the data bit stored in the storage node to change from a first state to a second state in response a change in both states of two data bits respectively stored in the at least two other storage nodes.

Tipless transistors, short-tip transistors, and methods and circuits therefor
10573644 · 2020-02-25 · ·

An integrated circuit can include a plurality of first transistors formed in a substrate and having gate lengths of less than one micron and at least one tipless transistor formed in the substrate and having a source-drain path coupled between a circuit node and a first power supply voltage. In addition or alternatively, an integrated circuit can include minimum feature size transistors; a signal driving circuit comprising a first transistor of a first conductivity type having a source-drain path coupled between a first power supply node and an output node, and a second transistor of a second conductivity type having a source-drain path coupled between a second power supply node and the output node, and a gate coupled to a gate of the first transistor, wherein the first or second transistor is a tipless transistor.

SOFT ERROR-RESILIENT LATCH
20200007129 · 2020-01-02 ·

A latch is provided. The latch includes a plurality of storage nodes including a plurality of data storage nodes configured to store a data bit having one of two states and a plurality of complementary data storage nodes configured to store a complement of the data bit. The latch includes a plurality of supply voltage multi-dependency stages respectively corresponding to the plurality of storage nodes. Each supply voltage multi-dependency stage has an output coupled to a storage node and at least two control inputs respectively coupled to at least two other storage nodes of the plurality of storage nodes. The supply voltage multi-dependency stage is configured to cause a state of the data bit stored in the storage node to change from a first state to a second state in response a change in both states of two data bits respectively stored in the at least two other storage nodes.

Multi-bit flip-flop circuit with reduced area and reduced wire complexity

A multi-bit flip-flop includes a first bit flip-flop and a second bit flip-flop. The first bit flip-flop includes an input multiplexer that receives a first and second data bits, and outputs one of the first and second data bits as a third data bit; a first transmission circuit; a first latch; a second transmission circuit; and a second latch that outputs a first output data bit. The second bit flip-flop includes an input multiplexer that receives a fourth data bit and the first output data bit, and outputs one of the fourth data bit and the first output data bit as a fifth data bit; a first transmission circuit, a first latch, a second transmission circuit, and a second latch that outputs a second output data bit. The first output data bit is provided from the first bit flip-flop to the second bit flip-flop along an external wire.