H03M1/0665

Digital sensor assembly with selective dynamic element matching

The present disclosure relates generally to digital microphone and other sensor assemblies including a transducer, a delta-sigma analog-to-digital converter (ADC), a dynamic element matching (DELM) entity configured to compensate for nonlinearity resulting from variation among digital-to-analog conversion (DAC) elements of the ADC, and a control circuit configured to enable and disable the DELM based on a magnitude of a digital signal generated by the ADC.

Double data rate (DDR) quad switched multibit digital to analog converter and continuous time sigma-delta modulator

A quad signal generator circuit generates four 2.sup.N-1 bit control signals in response to a 2.sup.N-1 bit thermometer coded signal. A digital-to-analog converter (DAC) circuit has 2.sup.N-1 unit DAC elements, with each unit DAC element including four switching circuits controlled by corresponding bits of the four 2.sup.N-1 bit control signals. Outputs of the 2.sup.N-1 unit DAC elements are summed to generate an analog output signal. The quad signal generator circuit controls a time delay applied to clock signals relative to the 2.sup.N-1 bit thermometer coded signal and a time delay applied to the 2.sup.N-1 bit thermometer coded signal relative to the delayed clock signals in logically generating the four 2.sup.N-1 bit control signals. The analog output signal may be a feedback signal in a sigma-delta analog-to-digital converter (ADC) circuit that includes a multi-bit quantization circuit operating to quantize a filtered loop signal to generate the 2.sup.N-1 bit thermometer coded signal.

SYSTEM AND METHOD FOR DYNAMIC ELEMENT MATCHING FOR DELTA SIGMA CONVERTERS

Systems and methods for improving the efficiency of a rotational dynamic element matching (DEM) for Delta Sigma converters. In some implementations, the systems and methods are provided a for reducing intersymbol interference (ISI) of a Delta Sigma converter. A delta sigma converter architecture can include multiple I-DACs, and the output from each I-DAC can vary from the other I-DACs. Techniques are disclosed for decreasing mismatch among multiple I-DACs while improving efficiency of rotational dynamic element matching.

Quad switched multibit digital to analog converter and continuous time sigma-delta modulator

A quad signal generator circuit generates four 2.sup.N−1 bit control signals in response to a sampling clock and a 2.sup.N−1 bit thermometer coded signal. A digital-to-analog converter (DAC) circuit has 2.sup.N−1 unit resistor elements, with each unit resistor element including four switching circuits controlled by corresponding bits of the four 2.sup.N−1 bit control signals. Outputs of the 2.sup.N−1 unit resistor elements are summed to generate an analog output signal. The quad signal generator circuit controls generation of the four 2.sup.N−1 bit control signals such that all logic states of bits of the four 2.sup.N−1 bit control signals remain constant for at least a duration of one cycle of the sampling clock. The analog output signal may be a feedback signal in a sigma-delta analog-to-digital converter (ADC) circuit that includes a multi-bit quantization circuit operating to quantize a filtered loop signal to generate the 2.sup.N−1 bit thermometer coded signal.

ANALOG-TO-DIGITAL CONVERTER ERROR SHAPING CIRCUIT AND SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CONVERTER

Disclosed are an analog-to-digital converter error shaping circuit and a successive approximation analog-to-digital converter. The analog-to-digital converter error shaping circuit includes a decentralized capacitor array, a data weighted average module, a mismatch error shaping module, a control logic generation circuit, a digital filter and a decimator. The decentralized capacitor array includes two symmetrically arranged capacitor array units, each capacitor array unit includes a first sub-capacitor array of a high segment bit and a second sub-capacitor array of a low segment bit. The data weighted average module is configured to eliminate correlation between the first sub-capacitor array and an input signal, and the mismatch error shaping module is configured to eliminate correlation between the second sub-capacitor array and the input signal.

First order memory-less dynamic element matching technique

A quantizer generates a thermometer coded signal from an analog voltage signal. Data weighted averaging (DWA) of the thermometer coded signal is accomplished by controlling the operation of a crossbar switch controlled by a switch control signal to generate an output DWA signal. The output DWA signal is latched to generate a latched output DWA signal which is processed along with bits of the thermometer coded input signal in feedback loop to generate the switch control signal. The latching of the output DWA signal is performed in an input register of a digital-to-analog converter which operates to convert the latched output DWA signal to a feedback analog voltage from which the analog voltage signal is generated. The switch control signal specifies a bit location for a beginning logic transition of the output DWA signal cycle based on detection of an ending logic transition of the latched DWA signal.

QUAD SWITCHED MULTIBIT DIGITAL TO ANALOG CONVERTER AND CONTINUOUS TIME SIGMA-DELTA MODULATOR
20210184691 · 2021-06-17 · ·

A quad signal generator circuit generates four 2.sup.N−1 bit control signals in response to a sampling clock and a 2.sup.N−1 bit thermometer coded signal. A digital-to-analog converter (DAC) circuit has 2.sup.N−1 unit resistor elements, with each unit resistor element including four switching circuits controlled by corresponding bits of the four 2.sup.N−1 bit control signals. Outputs of the 2.sup.N−1 unit resistor elements are summed to generate an analog output signal. The quad signal generator circuit controls generation of the four 2.sup.N−1 bit control signals such that all logic states of bits of the four 2.sup.N−1 bit control signals remain constant for at least a duration of one cycle of the sampling clock. The analog output signal may be a feedback signal in a sigma-delta analog-to-digital converter (ADC) circuit that includes a multi-bit quantization circuit operating to quantize a filtered loop signal to generate the 2.sup.N−1 bit thermometer coded signal.

FIRST ORDER MEMORY-LESS DYNAMIC ELEMENT MATCHING TECHNIQUE

A quantizer generates a thermometer coded signal from an analog voltage signal. Data weighted averaging (DWA) of the thermometer coded signal is accomplished by controlling the operation of a crossbar switch controlled by a switch control signal to generate an output DWA signal. The output DWA signal is latched to generate a latched output DWA signal which is processed along with bits of the thermometer coded input signal in feedback loop to generate the switch control signal. The latching of the output DWA signal is performed in an input register of a digital-to-analog converter which operates to convert the latched output DWA signal to a feedback analog voltage from which the analog voltage signal is generated. The switch control signal specifies a bit location for a beginning logic transition of the output DWA signal cycle based on detection of an ending logic transition of the latched DWA signal.

Time-interleaved digital-to-analog converter with time-domain dynamic element matching and associated method
10958284 · 2021-03-23 · ·

A time-interleaved digital-to-analog converter (DAC) includes a digital processing circuit, a time-domain dynamic element matching (TDEM) circuit, a plurality of DACs, and a combining circuit. The digital processing circuit generates data sequences according to the digital signal. The data sequences include a first data sequence and a second data sequence. The TDEM circuit swaps a portion of the first data sequence with a portion of the second data sequence to generate a first adjusted data sequence and a second adjusted data sequence. The DACs include a first DAC and a second DAC. The first DAC has a first DAC cell that operates in response to the first adjusted data sequence. The second DAC has a second DAC cell that operates in response to the second adjusted data sequence. The combining circuit generates the analog signal by combining analog outputs of the DACs.

Digital-to-analog converter, transmitter, base station and mobile device

A digital-to-analog converter is provided. The digital-to-analog converter comprises an input configured to receiving a first digital control code for controlling a plurality of digital-to-analog converter cells. Further, the digital-to-analog converter comprises a code converter circuit configured to converter the first digital control code to a second digital control code. Further, the digital-to-analog converter comprises a shift code generation circuit configured to generate a shift code based on a code difference between the first digital control code and a third digital control code. The digital-to-analog converter additionally comprises a bit-shifter circuit configured to bit-shift the second digital control code based on the shift code in order to obtain a modified second digital control code. The digital-to-analog converter comprises a cell activation circuit configured to selectively activate one or more of the plurality of digital-to-analog converter cells based on the modified second digital control code. Each activated digital-to-analog converter cell is configured to output a respective cell output signal. Further, the digital-to-analog converter comprises an output configured to output an analog output signal based on the cell output signals.