A successive approximation register analog-to-digital converter (SAR ADC) circuit comprises N weighted bit capacitors, wherein N is a positive integer greater than one; a sampling circuit configured to sample an input voltage onto the N weighted bit capacitors; and logic circuitry. The logic circuitry is configured to enable sampling of the input voltage onto the N weighted bit capacitors in a high-resolution mode; enable sampling of the input voltage onto NM of the weighted bit capacitors in a low-resolution mode and sampling a common mode voltage onto the most significant M weighted bit capacitors, wherein M is a positive integer greater than zero and less than N; and initiate successive bit trials using the weighted bit capacitors to convert the sampled input voltage to a digital value.

A time-interleaved digital-to-analog converter (DAC) includes a digital processing circuit, a time-domain dynamic element matching (TDEM) circuit, a plurality of DACs, and a combining circuit. The digital processing circuit generates data sequences according to the digital signal. The data sequences include a first data sequence and a second data sequence. The TDEM circuit swaps a portion of the first data sequence with a portion of the second data sequence to generate a first adjusted data sequence and a second adjusted data sequence. The DACs include a first DAC and a second DAC. The first DAC has a first DAC cell that operates in response to the first adjusted data sequence. The second DAC has a second DAC cell that operates in response to the second adjusted data sequence. The combining circuit generates the analog signal by combining analog outputs of the DACs.

A digital-to-analog converter (DAC) is described having a digital input, an analogue output, and two capacitors. The DAC has a controller. The controller is configured to generate a switching sequence including at least two switch cycles dependent on the input value received on the digital input. If the input value corresponds to an odd number, in a first switch cycle during a switch cycle first phase, the controller switchably couples a reference voltage to a first terminal and a ground voltage to a second terminal of one of the two capacitors, and switchably couples a ground voltage to a first terminal and the reference voltage to a second terminal of the other of the two capacitors. During a switch cycle second phase, the controller switchably couples a ground voltage to the first terminal and the analogue output to the second terminal of both capacitors.

A first successive approximation register analog-to-digital converter according an embodiment of the present disclosure includes an N-bit (N represents an integer greater than or equal to 5) capacitive digital-to-analog converter including a plurality of capacitive elements. A plurality of first capacitive elements of the plurality of capacitive elements is capacitive elements that have total capacity corresponding to total capacity of a plurality of the capacitive elements corresponding to a whole or a portion of first to (N1)-th bits, and do not correspond to the first to (N1)-th bits.

A digital-to-analog conversion circuit is used for converting a first digital input into a first analog output, and includes a segmentation circuit, a plurality of multi-bit dynamic element matching digital-to-analog converters (DEM DACs), and a combination circuit. The segmentation circuit applies segmentation to the first digital input to generate a plurality of code segments. The multi-bit DEM DACs convert the code segments into a plurality of DAC outputs, respectively, wherein the multi-bit DEM DACs include at least a first multi-bit DEM DAC and a second multi-bit DEM DAC, and the first multi-bit DEM DAC and the second multi-bit DEM DAC employ different DEM techniques. The combination circuit combines the DAC outputs to generate the first analog output.

A circuit for digital-to-analog conversion using a plurality of 3-level cells includes a circuit for digital-to-analog conversion using a plurality of 3-level cells mutually independently providing positive electricity, providing negative electricity, or floating. The circuit including a preprocess circuit and a shift circuit. The preprocess circuit is configured to receive thermometer code data generated from signed binary data and generate a shift count for shifting a cell pointer pointing to one of the plurality of 3-level cells for dynamic element matching (DEM) from the thermometer code data. The shift circuit is configured to store the cell pointer and shift the stored cell pointer according to the shift count. The shifted cell pointer is shifted in proportion to an absolute value of the binary data in a direction depending on a sign of the binary data.

A Sigma-Delta (-) analog-to-digital converter (ADC) and operation method thereof are provided. The - ADC includes a - modulator, a dynamic element matching (DEM) circuit and a control circuit. An input terminal of the - modulator is configured to receive an analog signal. The - modulator is configured to convert the analog signal into a digital signal based on a feedback signal. The DEM circuit is coupled to the - modulator to receive the digital signal. The DEM circuit is configured to perform a DEM algorithm on the digital signal to generate a feedback signal, and provide the feedback signal to the - modulator. The control circuit listens to the digital signal to detect a mute period. The control circuit disables the DEM circuit during the mute period to suspend a progress of the DEM algorithm.

A digital-to-analog converter (DAC) is described having a digital input, an analogue output, and two capacitors. The DAC has a controller. The controller is configured to generate a switching sequence including at least two switch cycles dependent on the input value received on the digital input. If the input value corresponds to an odd number, in a first switch cycle during a switch cycle first phase, the controller switchably couples a reference voltage to a first terminal and a ground voltage to a second terminal of one of the two capacitors, and switchably couples a ground voltage to a first terminal and the reference voltage to a second terminal of the other of the two capacitors. During a switch cycle second phase, the controller switchably couples a ground voltage to the first terminal and the analogue output to the second terminal of both capacitors.

A method includes receiving samples of digital to analog converter (DAC), partitioning the samples to unit-DACs based upon previous partitions of inputs to the unit-DACs to cancel out integrated non-linearities of outputs of the DAC caused by the gain mismatches of the unit-DACs, including partitioning samples of DAC input to the unit-DACs through a recursive nth order partitioning algorithm. The algorithm includes, for each DAC input, determining a first partition of the DAC input that would cancel an (n1)th order previously integrated non-linearity, adding an equivalent DAC input of the first partition to the DAC input to obtain a total DAC input, using a first order application of the total DAC input to the inputs of the unit-DACs to yield a second partition of DAC input, summing the first and second partitions generate a final partition, and, based on the final partition, computing non-linearity remainders at each order of integration.

An analog-to-digital converter (ADC) and a method are disclosed. The ADC has a quantizer. The quantizer comprises a linear-feedback shift register (LFSR), a decoder configured to provide a plurality of switch control signals at a plurality of decoder outputs, respectively, the plurality of switch control signals responsive to a LFSR value of the LFSR output; an electrical reference, the electrical reference having a plurality of reference outputs, the electrical reference configured to provide a plurality of reference levels at the plurality of reference outputs, respectively; a first switch providing a first switch output and a second switch output; and a comparator, the comparator having a signal input, a first reference input, and a second reference input, the first reference input connected to the first switch output, and the second reference input connected to the second switch output.