A digital-to-analog converter and an operation method thereof are provided. The digital-to-analog converter includes a current source module, a decoder, a change indicator, and a random number generator. The decoder is coupled to the current source module and receives a digital input signal. The change indicator is coupled to the decoder and provides an indication signal to the decoder. The random number generator is coupled to the change indicator and provides a random number signal to the change indicator. The change indicator generates an indication signal according to the random number signal, and the decoder generates a control signal to the current source module according to the digital input signal and the indication signal, so that the current source module generates an analog output signal corresponding to the digital input signal according to the control signal.

The present disclosure relates generally to digital microphone and other sensor assemblies including a transducer and a delta-sigma analog-to-digital converter (ADC) with digital-to-analog converter (DAC) element mismatch shaping and more particularly to sensor assemblies and electrical circuits therefor including a dynamic element matching (DELM) entity configured to select DAC elements based on data weighted averaging (DWA) and a randomized non-negative shift.

A circuit 100 is described comprising (i) a first digital-to-analog converter 110, (ii) a second digital-to-analog converter 111, (iii) a plurality of unit elements 120, and (iv) switching circuitry 130. The switching circuitry 130 is adapted so that in a first switching state 231, a set of unit elements 221 of the plurality of unit elements 120 forms part of the first digital-to-analog converter 110, and in a second switching state 232, the set of unit elements 221 forms part of the second digital-to-analog converter 111. Furthermore, a corresponding method of operating a circuit 100 is described.

Disclosed are a readout circuit, a signal quantizing method, a signal quantizing device, and a computer device. The readout circuit includes: a signal sampler, including a plurality of channels; a plurality of integrators, connected to the plurality of channels and having a one-to-one relationship with the plurality of channels; a signal processor, including a first operational amplifier, a sampling input of the first operational amplifier being connected to outputs of the plurality of integrators, respectively; and an analog-digital converter. An input of the analog-digital converter is connected to an output of the first operational amplifier.

An image sensing system and methods for operating the same are disclosed. An image sensing system includes a plurality of pixel circuits, a multiplexer configured to select one of the pixel circuit and provide analog pixel data without sampling, and a successive approximation register (SAR) analog-to-digital converter (ADC) configured to convert the analog pixel data into digital data. The SAR ADC includes a capacitive digital-to-analog converter (CDAC) configured to convert contents of the SAR into a corresponding analog signal for comparison, by a comparator, with the analog pixel data. The CDAC includes a two-dimensional array of circuit elements. A control circuit in the image sensing system is configured to cause random ones of the circuit elements of the CDAC to be selected for generation of the corresponding analog signal and add a dithering signal so a CDAC output and shuffle a multiplexer switch sequence to improve fixed pattern noise.

A pixel circuit and method for operating the same is disclosed. The circuit includes a first driver circuit coupled to receive an analog pixel data, transfer signal and reset signal. The circuit further includes a source follower transistor having a source terminal coupled to a column node, and a gate terminal coupled to the first driver circuit. The circuit further includes a second driver circuit coupled to receive the transfer signal and the reset signal. The second driver circuit is capacitively coupled to the column node through a first capacitor.

A system comprises an input shuffling circuit and digital-to-analog conversion circuitry. The input shuffling circuit comprises a data input, a data output, and a control input. The input shuffling circuit is operable to receive, via the data input, an N-bit binary value, where N is an integer. The input shuffling circuit is operable to route each of the N bits of the N-bit binary word to one or more of M bits of the data output to generate an M-bit value, where M=2.sup.N, and the routing is based on a control value applied to the control input. The input shuffling circuit can be configured either in a dynamic element matching (DEM) mode or a regular binary to thermometer mode. The digital-to-analog conversion circuitry is operable to convert the M-bit value to a corresponding analog voltage and/or current. M different values of the control value may result in M different routings of the N bits of the binary word.

An apparatus comprising M time-interleaved analog to digital converters (ADC) that sample an input signal at M sampling phases, wherein M is equal to or greater than 4. A phase control circuit adjusts at least M1 sampling phases of the M sampling phases. The phase control circuit comprises M1 phase error detector circuits. Each phase error detector circuit detects a corresponding phase error for a corresponding sampling phase of the M1 sampling phases based on a sample captured at a sampling phase of the M sampling phases immediately preceding the corresponding sampling phase and a sample captured at a sampling phase of the M sampling phases immediately subsequent to the corresponding sampling phase.

An analog front end (AFE) system for substantially eliminating quantization error or noise can combine an input of an integrator circuit in the AFE system with an input of the digital-to-analog converter (DAC) circuit in the feedback loop of the AFE system. By combining the input of the integrator with the input of the DAC circuit in the feedback loop, the in-band quantization noise of the filter can be substantially eliminated, thereby improving measurement accuracy.

A TI ADC circuit (30) comprises a plurality of L analog inputs (32-1, 32-2, 32-3) and a plurality of L digital outputs (34-1, 34-2, 34-3). The i:th analog input (32-i) is for receiving an i:th analog input signal. The i:th digital output (34-i) is for outputting an i:th digital output signal, which is a digital representation of the i:th analog input signal. TI ADC circuit (30) comprises a set (90) of sub ADCs (100-1-100-K). The TI ADC circuit (30) is configured to generate one sample of each of the L digital output signals per conversion cycle. Each sub ADC (100-1-100-K) is configured to generate a digital output sample in M conversion cycles, wherein M is an integer >1. The number K of sub ADCs in the set (90) of sub ADCs (100-1-100-K) exceeds L.Math.M. TI ADC circuit (30) comprises a control circuit (120) configured to select, for each input sample of each of the L analog input signals, which available sub ADC (100-1100-K) in the set (90) of sub ADCs that should operate on that input sample, such that at least some of the sub ADCs (100-1-100-K), over time, operate on input samples of each of the L analog input signals.