Systems and methods are disclosed for a noise-shaping successive approximation register (SAR) analog-to-digital-converter (ADC) using Sampled Analog Technology (SAT) filter techniques for filter construction. A SAR ADC includes an SAR for receiving an analog input signal and outputting a digital decision, a digital-to-analog converter and logic circuitry for converting the digital decision of the SAR to a present analog residue for a present conversion cycle, a filter for processing a previous analog residue from a previous conversion cycle, and for feeding a processed previous analog residue back to the SAR, a summer for summing the processed previous analog residue from the filter and the present analog residue, and generating a summer output, and a comparator for comparing the summer output and a first reference signal and generating a comparator output. The filter includes a capacitor array for filtering the previous analog residue to generate the processed previous analog residue.

A signal processing apparatus has a multi-bit quantizer and a processing circuit. The multi-bit quantizer determines and outputs code segments of a multi-bit output code sequentially. The code segments include a first code segment and a second code segment. The processing circuit generates digital outputs according to the code segments, respectively. The digital outputs include a first digital output derived from a first code segment and a second digital output derived from a second code segment. A first transfer function between the first digital output and the first code segment is different from a second transfer function between the second digital output and the second code segment.

A quantizer includes: a quantizer capacitor having a first end and a second end; an input calculator that receives input voltages, sums the input voltages, and outputs the summed result to the first end of the quantizer capacitor; a scaler that receives reference voltages and a scale code, generates a scale voltage from the reference voltages depending on the scale code, and outputs the scale voltage to the second end of the quantizer capacitor; and a latch that stores an output voltage of the first end of the quantizer capacitor.

Disclosed is a successive approximation register (SAR) quantizer and a continuous-time sigma-delta modulator (CTSDM) using the SAR quantizer. The SAR quantizer is capable of generating M highly-significant bits as a digital output signal, and generating L lowly-significant bit(s) for the execution of noise shaping operation. Therefore, the SAR quantizer and the CTSDM can reduce the demand for the circuit area of a digital-to-analog converter and lower the delay of a critical path, so as to improve the performance and cut the cost.

The present invention provides a continuous-time delta-sigma modulator comprising two ADCs. One of the ADC is configured to generate MSBs of an output signal of the continuous-time delta-sigma modulator, and the other ADC is configured to generate LSBs of the output signal. In addition, the two ADCs sample an output of a loop filter at different times, but the MSBs and LSBs are feedback to the loop filter simultaneously.

An analog-to-digital conversion (ADC) system includes a transconductance amplifier, loop filter, quantizer, logic circuit, and digital-to-analog converter (DAC). The transconductance amplifier is configured to generate a current signal in response to an audio signal. The loop filter is connected to the transconductance amplifier and configured to generate a filtered signal based on the current signal. The quantizer is configured to generate a digital representation of the filtered signal. The logic circuit is configured to generate control signals based on the digital representation. The DAC is coupled to the loop filter's and the transconductance amplifier's output. The DAC includes three-level unit elements, where each unit element is configured to provide one of two signal levels or no signal to the loop filter in response to control signals from the logic circuit. Such an ADC system may allow for a high dynamic range while maintaining low power consumption and low noise.

Shortening any of the operational phases of a noise-shaping successive approximation register (SAR) analog-to-digital converter (ADC), including the acquisition phase, the bit trial phase, and the residue charge transfer phase, can result in higher power, and it can be difficult to achieve high speed at low power.

Using various techniques described, the acquisition, bit-trial, and residue charge transfer phases of two or more digital-to-analog converter (DAC) circuits of an ADC circuit can be time-interleaved. The use of two or more DAC circuits can increase or maximize the time available for the acquisition, bit-trial, and residue charge transfer phases.

A sample and hold (S/H) circuit includes a capacitor coupling a sample node to a first voltage and an input line carrying a signal from an input. The S/H circuit also can include one or more transistors coupling the input line to the sample node. The S/H circuit also can include a switch coupled to one or more sources or drains of the one or more transistors and to a second voltage. The S/H circuit also can include a hold circuit coupled to the switch and to one or more gates of the one or more transistors, the hold circuit configured to open, during a sample period, the input line between the input and the sample node.

An analog-to-digital converter includes: a sample/hold circuit, which samples an analog signal, and outputs a first voltage; a digital-to-analog conversion circuit, which converts a digital signal to output a second voltage; an amplifier, which amplifies the first voltage and the second voltage; a noise shaping filter, which integrates a residual voltage corresponding to a difference between the amplified first voltage and the amplified second voltage, and generates a first integration voltage and a second integration voltage; a comparator, which compares a sum of the amplified first voltage, the first integration voltage, and the second integration voltage with the amplified second voltage; and a SAR logic, which outputs the digital signal according to a comparison result of the comparator, and controls the digital-to-analog conversion circuit.

A low-pass and band-pass delta-sigma (??) analog-to-digital converter (ADC) device for sensor interface is disclosed. The device includes a first stage comprising a low-resolution passive integrator-based noise-shaping successive approximation register (SAR) ADC and a second stage comprising a voltage-controlled oscillator (VCO)-ADC.