First conductive layer is connected to an impurity region which is a source region or an emitter region. A first conductive layer having an emitter pad and a second conductive layer having a Kelvin emitter pad and a relay pad are separated. A plane occupied area of the Kelvin emitter pad is smaller than a plane occupied area of the emitter pad.

A light emitting device including a first LED stack, a second LED stack disposed on the first LED stack, a third LED stack disposed on the second LED stack, and a common electrode electrically connected to a first conductivity type semiconductor layer of each of the first, second, and third LED stacks, in which the common electrode includes a step in at least one of the first, second and third LED stacks.

A semiconductor memory device including a substrate, first pad layers and a second pad layer on the substrate, a pattern structure including first openings on the first pad layers and a second opening on the second pad layer, and having first and second regions, gate electrodes on the pattern structure and each including a pad region, channel structures penetrating through the gate electrodes in the first region, gate contact plugs electrically connected to the gate electrodes through the pad region of each of the gate electrodes and extending in a vertical direction to penetrate the first openings and connected to the first pad layers, a source contact plug, extending in the vertical direction penetrating the second opening and connected to the second pad layer, and a source connection patter under the pattern structure and in contact with the source contact plug and the second pad layer may be provided.

An interconnection structure of a semiconductor chip may include an interconnection via, a lower pad, a conductive bump, and an upper pad. The interconnection via may be arranged in the semiconductor chip. The lower pad may be arranged on a lower end of the interconnection via exposed through a lower surface of the semiconductor chip. The conductive bump may be arranged on the lower pad. The upper pad may be arranged on an upper end of the interconnection via exposed through an upper surface of the semiconductor chip. The upper pad may have a width wider than a width of the interconnection via and narrower than a width of the lower pad. Thus, an electrical short between the conductive bumps may not be generated in the interconnection structure having a thin thickness.

A light-emitting panel, a method making same, and a display panel are disclosed in the present disclosure. The light-emitting panel includes a light-emitting board which includes a substrate; a first metal layer disposed on the substrate; a gate insulating layer covering the first metal layer; and a second metal layer on a side of the gate insulating layer away from the first metal layer. The second metal layer includes a connection portion located in the bonding area of the light-emitting board, and a conductive protection layer formed by chemical plating is disposed on a surface of the connection portion.

A display device includes a display area and a non-display area which is adjacent to the display area, a pad in the non-display area and connected to the display area, and an insulating layer on the pad. A portion of the pad is exposed outside of the insulating layer to define an exposed portion of the pad, the insulating layer includes a first portion having a first thickness and a second portion having a second thickness which is less than the first thickness, and the second portion of the insulating layer is between the exposed portion of the pad and the first portion of the insulating layer.

A semiconductor package includes main pad structures and dummy pad structures between a first semiconductor chip and a second semiconductor chip. The main pad structures include first main pad structures apart from one another on the first semiconductor chip and second main pad structures placed apart from one another on the second semiconductor chip and bonded to the first main pad structures. The dummy pad structures include first dummy pad structures including first dummy pads apart from one another on the first semiconductor chip and first dummy capping layers on the first dummy pads, and second dummy pad structures including second dummy pads apart from one another on the second semiconductor chip and second dummy capping layers on the second dummy pads. The first dummy capping layers of the first dummy pad structures are not bonded to the second dummy capping layers of the second dummy pad structures.

A display apparatus is disclosed that includes a substrate, a display element, a transistor, and a pad. The substrate includes a display area and a peripheral area. The display element is disposed on the display area. The transistor is electrically connected to the display element. The pad is disposed on the peripheral area and having a multilayered structure. The pad includes a pad metal layer, a first pad protective layer disposed on the pad metal layer, and a second pad protective layer interposed between the pad metal layer and the first pad protective layer. The second pad protective layer includes a different material from the first pad protective layer. The transistor includes a semiconductor layer disposed on the substrate, a gate electrode disposed on a gate insulating layer that covers the semiconductor layer, and a connection electrode arranged on an interlayer insulating layer covering the gate electrode. The connection electrode has the same multilayered structure as the multilayered structure of the pad, and the connection electrode is connected to the semiconductor layer.

A display includes a wiring pad and a dummy pad on a first substrate. A first planarization layer is disposed on the wiring pad and the dummy pad. A first pad electrode layer is connected to the wiring pad and a second pad electrode layer is connected to the dummy pad. The first and second pad electrode layers are disposed on the first planarization layer. A first insulating layer covers the first and second pad electrode layers. A first pad electrode upper layer is disposed on the first pad electrode layer. A second pad electrode upper layer is disposed on the second pad electrode layer. The wiring pad, the first pad electrode layer, and the first pad electrode upper layer are electrically connected. The dummy pad, the second pad electrode layer, and the second pad electrode upper layer are electrically connected.

Provided is a semiconductor package including: a first substrate having a first electrode pad and a first protective layer in which a cavity is formed; a first bump pad arranged in the cavity and connected to the first electrode pad; a second substrate facing the first substrate and having a second bump pad; and a bump structure in contact with the first bump pad and the second bump pad, wherein the first electrode pad has a trapezoidal shape, and the first bump pad has a flat upper surface and an inclined side surface extending along a side surface of the first electrode pad.