A package structure includes a lead frame, an insulator, a plurality of conductive vias, a patterned metal layer, and a chip. The lead frame includes a plurality of contacts. The insulator covers the lead frame. The conductive vias are disposed on the insulator and connected to the contacts. The patterned metal layer covers an outer surface of the insulator and includes a groove and a circuit portion. The circuit portion is connected to and covers the conductive vias and contacts. The groove surrounds the circuit portion such that the circuit portion is electrically insulated from the rest of the patterned metal layer. A surface of the insulator exposed by the groove is lower than the outer surface. The chip is disposed on the insulator and electrically connected to the circuit portion.

A package structure includes a lead frame, an insulator, a plurality of conductive vias, a patterned metal layer, and a chip. The lead frame includes a plurality of contacts. The insulator covers the lead frame. The conductive vias are disposed on the insulator and connected to the contacts. The patterned metal layer covers an outer surface of the insulator and includes a groove and a circuit portion. The circuit portion is connected to and covers the conductive vias and contacts. The groove surrounds the circuit portion such that the circuit portion is electrically insulated from the rest of the patterned metal layer. A surface of the insulator exposed by the groove is lower than the outer surface. The chip is disposed on the insulator and electrically connected to the circuit portion.

A package structure includes a lead frame, an insulator, a plurality of conductive vias, a patterned metal layer, and a chip. The lead frame includes a plurality of contacts. The insulator covers the lead frame. The conductive vias are disposed on the insulator and connected to the contacts. The patterned metal layer covers an outer surface of the insulator and includes a groove and a circuit portion. The circuit portion is connected to and covers the conductive vias and contacts. The groove surrounds the circuit portion such that the circuit portion is electrically insulated from the rest of the patterned metal layer. A surface of the insulator exposed by the groove is lower than the outer surface. The chip is disposed on the insulator and electrically connected to the circuit portion.

A package structure includes a lead frame, an insulator, a plurality of conductive vias, a patterned metal layer, and a chip. The lead frame includes a plurality of contacts. The insulator covers the lead frame. The conductive vias are disposed on the insulator and connected to the contacts. The patterned metal layer covers an outer surface of the insulator and includes a groove and a circuit portion. The circuit portion is connected to and covers the conductive vias and contacts. The groove surrounds the circuit portion such that the circuit portion is electrically insulated from the rest of the patterned metal layer. A surface of the insulator exposed by the groove is lower than the outer surface. The chip is disposed on the insulator and electrically connected to the circuit portion.

A package structure and method of forming the same includes: a first package including: a first die; a via adjacent the first die; a molding compound encapsulating the via and at least laterally encapsulating the first die around a perimeter of the first die; and a first redistribution structure extending over the first die and the molding compound; a first integrated passive device (IPD) attached to the first redistribution structure, the first IPD disposed proximate the perimeter of the first die; a second IPD attached to the first redistribution structure, the second IPD disposed distal the perimeter of the first die; and an underfill disposed between the first IPD and the first redistribution structure, the second IPD being free of the underfill.

A package structure and method of forming the same includes: a first package including: a first die; a via adjacent the first die; a molding compound encapsulating the via and at least laterally encapsulating the first die around a perimeter of the first die; and a first redistribution structure extending over the first die and the molding compound; a first integrated passive device (IPD) attached to the first redistribution structure, the first IPD disposed proximate the perimeter of the first die; a second IPD attached to the first redistribution structure, the second IPD disposed distal the perimeter of the first die; and an underfill disposed between the first IPD and the first redistribution structure, the second IPD being free of the underfill.

A package structure and method of forming the same includes: a first package including: a first die; a via adjacent the first die; a molding compound encapsulating the via and at least laterally encapsulating the first die around a perimeter of the first die; and a first redistribution structure extending over the first die and the molding compound; a first integrated passive device (IPD) attached to the first redistribution structure, the first IPD disposed proximate the perimeter of the first die; a second IPD attached to the first redistribution structure, the second IPD disposed distal the perimeter of the first die; and an underfill disposed between the first IPD and the first redistribution structure, the second IPD being free of the underfill.

A package structure and method of forming the same includes: a first package including: a first die; a via adjacent the first die; a molding compound encapsulating the via and at least laterally encapsulating the first die around a perimeter of the first die; and a first redistribution structure extending over the first die and the molding compound; a first integrated passive device (IPD) attached to the first redistribution structure, the first IPD disposed proximate the perimeter of the first die; a second IPD attached to the first redistribution structure, the second IPD disposed distal the perimeter of the first die; and an underfill disposed between the first IPD and the first redistribution structure, the second IPD being free of the underfill.

A method of forming a package and a package are provided. The method includes placing a main die and a dummy die side by side on a carrier substrate. The method also includes forming a molding material along sidewalls of the main die and the dummy die. The method also includes forming a redistribution layer comprising a plurality of vias and conductive lines over the main die and the dummy die, where the plurality of vias and the conductive lines are electrically connected to connectors of the main die. The method also includes removing the carrier substrate.

A method of forming a package and a package are provided. The method includes placing a main die and a dummy die side by side on a carrier substrate. The method also includes forming a molding material along sidewalls of the main die and the dummy die. The method also includes forming a redistribution layer comprising a plurality of vias and conductive lines over the main die and the dummy die, where the plurality of vias and the conductive lines are electrically connected to connectors of the main die. The method also includes removing the carrier substrate.