A circuit, method, and system are disclosed for sampling a signal. The system includes a sampler circuit configured to sample input signals when a clock signal is at a first voltage level to produce sampled signals, a detection circuit that is coupled to the sampler circuit, and a feedback circuit that receives an output signal and generates the clock signal. The detection circuit pre-charges the sampled signals when the clock signal is at a second voltage level and, using threshold adjusted inverters, detects voltage levels of each sampled signal to produce detected voltage levels, where a threshold voltage of the threshold adjusted inverters is entirely outside of a transition voltage range of the sampler circuit. In response to one of the detected voltage levels transitioning from the second level to the first level, the detection circuit transitions the output signal from the first voltage level to the second voltage level.

A circuit, method, and system are disclosed for sampling a signal. The system includes a sampler circuit configured to sample input signals when a clock signal is at a first level to produce sampled signals, a detection circuit that is coupled to the sampler circuit, and a feedback circuit that receives an output signal and generates the clock signal. The detection circuit pre-charges the sampled signals when the clock signal is at a second level and, using threshold adjusted inverters, detects voltage levels of each sampled signal to produce detected voltage level signals, where a threshold voltage of the threshold adjusted inverters is entirely outside of a transition voltage range of the sampler circuit. In response to one of the detected voltage level signals transitioning from the second level to the first level, the detection circuit transitions the output signal from the first level to the second level.

Provided is a semiconductor circuit which includes a first circuit configured to determine a voltage level of a feedback node based on a voltage level of input data, a voltage level of a latch input node, and a voltage level of a clock signal, a second circuit configured to pre-charge the latch input node based on the voltage level of the clock signal, a third circuit configured to pull down the latch input node based on the voltage level of the feedback node and the voltage level of the clock signal, a latch configured to output output data based on the voltage level of the clock signal and the voltage level of the latch input node, and a control circuit included in at least one of the first to third circuits and the latch and configured to receive the control signal.

A method and a sense amplifier flip-flop (SAFF) for fixing setup time violations in an integrated circuit (IC) design. The SAFF includes a master latch coupled to a slave latch, wherein the master latch includes a sense amplifier and the SAFF is configured with an equal number of p-type metal oxide semiconductor (PMOS) transistors and n-type metal oxide semiconductor (NMOS) transistors to reduce block area of an integrated circuit (IC). The method includes receiving a clock signal, receiving a data signal, applying the data signal to the sense amplifier when the clock signal is at a low level, wherein a portion of the sense amplifier is responsive to the inverted clock signal, storing a value of the data signal in the slave latch when the clock signal transitions from the low level to the high level, and providing an output signal from the slave latch.

A decision feedback equalizer (DFE) comprises two charge-steering (CS) input latches driven by complementary -rate clocks, two pairs of CS primary latches, and two pairs of taps. The primary latches are driven by -rate clocks. In a first aspect, each one of the input latches and the primary latches includes a respective differential pair of n-channel output transistors, and each tap includes a respective differential pair of p-channel input transistors. In a second aspect, each one of the input latches and the primary latches includes a respective differential pair of p-channel input transistors, and each tap includes a respective differential pair of n-channel output transistors. In some implementations, no element of any one of the taps is driven by any -rate clock. In some implementations, every switch of at least one of the taps is driven by one of the -rate clocks.

An object is to provide a level shift circuit that operates stably. A semiconductor device includes a level shift circuit including first to fourth transistors and a buffer circuit. One of a source and a drain (S/D) of the first transistor is connected to one of a source and a drain of the second transistor. The other of the source and the drain of the second transistor is connected to one of a source and a drain of the third transistor. A gate of the first transistor and a gate of the fourth transistor are connected to the other of the source and the drain of the second transistor and the one of the source and the drain of the third transistor. A gate of the third transistor is connected to a wiring to which an input signal is input. An input terminal of the buffer circuit is connected to one of a source and a drain of the fourth transistor. An output terminal of the buffer circuit is connected to a gate of the second transistor and a wiring to which an output signal is output.

A comparator is described. The comparator may be used in several applications, including in digital-to-analog converters (ADC). The comparator may comprise a high-speed amplifier, a low-noise amplifier, a controller and a bi-stable circuit. The high-speed amplifier may be activated during a first period, for example when the comparator tends to exhibit a slow response. During this period, the comparator may sacrifice the noise performance. The low-noise amplifier may be activated during a second period, for example when the difference between the signals appearing as inputs to the comparator is small. The low-noise amplifier may have a gain that is large enough to limit decision errors. The bi-stable circuit, which may be implemented using a latch, may be configured to output a signal equal to one of the supply voltages, in response to receiving the input signal from one of the stages.

An object is to provide a level shift circuit that operates stably. A semiconductor device includes a level shift circuit including first to fourth transistors and a buffer circuit. One of a source and a drain (S/D) of the first transistor is connected to one of a source and a drain of the second transistor. The other of the source and the drain of the second transistor is connected to one of a source and a drain of the third transistor. A gate of the first transistor and a gate of the fourth transistor are connected to the other of the source and the drain of the second transistor and the one of the source and the drain of the third transistor. A gate of the third transistor is connected to a wiring to which an input signal is input. An input terminal of the buffer circuit is connected to one of a source and a drain of the fourth transistor. An output terminal of the buffer circuit is connected to a gate of the second transistor and a wiring to which an output signal is output.

An Analog to Digital (ADC) is provided, where the ADC may include a sample and hold circuitry to sample an analog input signal, and a summation block to iteratively generate a subtraction signal. The subtraction signal may be based on a difference between the analog input signal and a feedback signal. The ADC may further include a common input stage to receive the subtraction signal, and a plurality of comparison and latch circuitries arranged in parallel, where individual ones of the plurality of parallel comparison and latch circuitries may sequentially receive an output of the common input stage.

An electronic latch circuit, a 4-phase signal generator, a multi-stage frequency divider and a poly-phase signal generator are disclosed. The electronic latch circuit comprises an output circuit comprising a first output and a second output. The electronic latch circuit further comprises an input circuit comprising a first input, a second input and a clock signal input. The electronic latch circuit is configured to change state based on the input signals' level at the inputs of the input circuit and a present state of the output circuit. The 4-phase signal generator is built with two electronic latch circuits. The multi-stage frequency dividers and poly-phase signal generators comprise a plurality of the electronic latch circuits and 4-phase signal generators.