The present application provides a vector quantization digital-to-analog conversion circuit, for converting a digital signal to an analog signal, characterized by includes a vector quantization circuit, configured to receive the digital signal and generate a vector quantization signal; a data weighted averaging circuit, coupled to the vector quantization circuit, including a plurality of data weighted averaging sub-circuits, configured to receive the vector quantization signal to generate a plurality of data weighted averaging signals; and a digital-to-analog conversion circuit, coupled to the data weighted averaging circuit, including a plurality of digital-to-analog conversion sub-circuits, configured to receive the data weighted averaging signal to generate the analog signal.

A delta-sigma modulator may include a loop filter having a loop filter input configured to receive an input signal and generate an intermediate signal responsive to the input signal and a near-zero asymmetric quantizer configured to quantize the intermediate signal into a quantized output signal which is fed back as an input to the loop filter such that the quantized output signal has a plurality of quantization levels, wherein the plurality of quantization levels are asymmetric to zero.

The present application provides a vector quantization digital-to-analog conversion circuit, for converting a digital signal to an analog signal, characterized by comprises a vector quantization circuit, configured to receive the digital signal and generate a vector quantization signal; a data weighted averaging circuit, coupled to the vector quantization circuit, comprising a plurality of data weighted averaging sub-circuits, configured to receive the vector quantization signal to generate a plurality of data weighted averaging signals; and a digital-to-analog conversion circuit, coupled to the data weighted averaging circuit, comprising a plurality of digital-to-analog conversion sub-circuits, configured to receive the data weighted averaging signal to generate the analog signal.

A digital-to-analog conversion circuit is used for converting a first digital input into a first analog output, and includes a segmentation circuit, a plurality of multi-bit dynamic element matching digital-to-analog converters (DEM DACs), and a combination circuit. The segmentation circuit applies segmentation to the first digital input to generate a plurality of code segments. The multi-bit DEM DACs convert the code segments into a plurality of DAC outputs, respectively, wherein the multi-bit DEM DACs include at least a first multi-bit DEM DAC and a second multi-bit DEM DAC, and the first multi-bit DEM DAC and the second multi-bit DEM DAC employ different DEM techniques. The combination circuit combines the DAC outputs to generate the first analog output.

A DAC, for use in an iADC, is configured for converting a multi-bit word to an analog feedback signal. The DAC comprises a MMS logic block. It further comprises a plurality of output elements configured to generate respective analog portions based on a selection vector and a signal combiner for combining the analog portions to the analog feedback signal. In the MMS logic block switching blocks are arranged cascaded. Each switching block receives at least a portion of the multi-bit word, splits the portion into two sub-portions and forwards them to one subsequent switching block or to one output element. A weight factor is adjusted by multiplying it with the difference of the two sub-portions. A weight accumulator accumulates successive adjusted weight factors, wherein the way of splitting the portion of a further multi-bit word is determined based on the sign of the weight accumulator.

The application provides a vector quantization digital-to-analog conversion circuit, applied to an oversampling converter, characterized that the vector quantization digital-to-analog conversion circuit includes a vector quantization circuit, configured to generate a vector quantization signal, a data weighted averaging circuit, coupled to the vector quantization circuit, including a plurality of data weighted averaging sub-circuits, configured to receive the vector quantization signal to generate a plurality of data weighted averaging signals; and a digital-to-analog conversion circuit, coupled to the data weighted averaging circuit, including a plurality of digital-to-analog conversion sub-circuits, configured to receive the data weighted averaging signal to generate the analog signal.

A time-interleaved analog to digital converter includes first and second capacitor array circuits, first and second transfer circuits, a fine converter circuitry, and an encoder circuit. The capacitor array circuits sample an input signal and generate first residues according to first quantization signals. The first and second transfer circuits transfer first and second residues respectively. The fine converter circuitry performs a noise shaping signal conversion on the first and second residues to generate a second quantization signal. A turn-on time of the corresponding first transfer circuit is determined based on the coarse conversion corresponding to a first capacitor array circuit and the noise shaping signal conversion corresponding to a second capacitor array circuit to selectively bring forward a start time of the noise shaping signal conversion. The encoder circuit generates a digital output according to the first and the second quantization signals.

A low-pass and band-pass delta-sigma (??) analog-to-digital converter (ADC) device for sensor interface is disclosed. The device includes a first stage comprising a low-resolution passive integrator-based noise-shaping successive approximation register (SAR) ADC and a second stage comprising a voltage-controlled oscillator (VCO)-ADC.

A digital noise coupling circuit includes: an analog-to-digital converter (ADC) configured to convert a quantization error, generated in a process of converting a first analog signal into a first digital signal, into a first digital error signal; a delay cell comprising delay elements configured to delay a transmission of the first digital error signal based on a clock signal; and a digital-to-analog (DA) conversion circuit configured to perform, in an analog domain, noise shaping on the first digital error signal that is delayed and transmitted from the delay cell.

Disclosed herein is a ramp circuit for an analogue to digital converter, ADC. The ramp circuit includes a ramp unit configured to provide a ramp signal usable for sampling an analogue signal. The ramp circuit also includes a hold unit connected to the ramp unit, the hold unit is configured to hold a reference voltage for resetting the ramp signal between subsequent samplings of the analogue signal.