An integrated circuit includes peripheral conductive pads interconnected by a peripheral conductive track within an integrated circuit chip. The integrated circuit chip further includes internal conductive pads interconnected by an internal conductive track within the integrated circuit chip. A conductive bonding wire external to the integrated circuit chip connects the one peripheral conductive pad to one internal conductive pad. A package encapsulates the integrated circuit chip and the conductive bonding wire.

A multi-chip package includes two electronic components bonded to each other via electrical contacts on corresponding faces of the components that are directly opposite each other. The components are encapsulated in a volume of molding material that includes a upper and lower sets of redistribution layers disposed on upper and lower surfaces of the volume of molding material that include electrical interconnects. The package includes one or more through-package interconnects that pass through the molding material. A first through-package interconnect couples an electrically conductive interconnect in a first redistribution layer to an electrically conductive interconnect in a second redistribution layer on an opposite side of the volume of molding material from the first redistribution layer, or it couples the interconnect to one of the components within the volume of molding material.

A semiconductor package includes a substrate including an insulating layer and a plurality of first pads on the insulating layer; a semiconductor chip including a plurality of second pads electrically connected to at least a portion of the plurality of first pads, the plurality of second pads overlapping the at least a portion of the plurality of first pads in a first direction; and a plurality of bumps on one surface of the substrate or one surface of the semiconductor chip, each of which has at least a portion having a melting point lower than a melting point of each of the plurality of first pads and a melting point of each of the plurality of second pads, wherein the plurality of bumps include a plurality of first bumps electrically connected to at least a portion of the plurality of first pads or at least a portion of the plurality of second pads, and at least one second bump having a permeability higher than a permeability of each of the plurality of first bumps.

An integrated circuit (IC) package and assembly includes a stacked arrangement of one or more IC die to leverage additional functionality in a standard package width. Active IC die and high voltage IC capacitors may be stacked in various arrangements to minimize the footprint and width of the IC package. The die are interconnected with each other and a lead frame with wire bonds, silicon vias or other interconnections. Various bond pad configurations are used to interconnect the die. The stacked arrangement of the IC die reduces the width of the supporting lead frame and reduces the overall footprint of the IC package.