A semiconductor module includes: a dissipating metal plate including a recess provided on an upper surface; an insulating substrate provided on a bottom surface of the recess and including a circuit pattern; a semiconductor device provided on the insulating substrate and connected to the circuit pattern; a case bonded to a peripheral portion on the upper surface of the dissipating metal plate and surrounding the insulating substrate and the semiconductor device; a case electrode provided on the case; a wire connecting the semiconductor device and the case electrode; and a sealant provided in the case and sealing the insulating substrate, the semiconductor device, and the wire, wherein a sidewall of the recess has a taper.

An object of the present disclosure is to facilitate thermal design in a semiconductor device in which MOSFETs and SBDs are connected in antiparallel. The semiconductor device includes a MOSFET chip provided on a first pattern, whose drain electrode and source electrode are electrically connected to the first pattern and a second pattern, respectively, an SBD chip provided on a third pattern, whose cathode electrode and anode electrode are electrically connected to the third pattern and fourth pattern, respectively, a drain main terminal connected to the first pattern, a source main terminal connected to the second pattern, a cathode main terminal connected to the third pattern, and an anode main terminal connected to the fourth pattern. At least one of between the drain main terminal and the cathode main terminal and between the source main terminal and the anode main terminal is not electrically connected.

The present invention provides a semiconductor device and a power converter having improved moisture resistance reliability. The semiconductor device of the present invention includes: a metal base substrate which includes a first insulating layer provided on a metal base, a support conductor provided on the first insulating layer, and a second insulating layer provided on a side surface of the support conductor; a semiconductor element bonded to the support conductor; a case provided outside the second insulating layer; an external terminal attached to the case; and a sealing member filled in a region surrounded by the support conductor, the second insulating layer and the case.

The semiconductor device includes a semiconductor element, a first conductive member, a second conductive member, an insulating member, a first main terminal, and a second main terminal. The first main terminal and the second main terminal, respectively, extend from the first conductive member and the second conductive member. The first main terminal and the second main terminal, respectively, have a first projecting portion and a second projecting portion projecting outside of the insulating member. The first projecting portion and the second projecting portion, respectively, have a first facing portion and a second facing portion at which plate surfaces of the first and second projecting portions face each other across a gap, and a first non-facing portion and a second non-facing portion at which the plate surfaces of the first and second projecting portions do not face each other.

In a described example, an apparatus includes a transistor formed on a semiconductor substrate, the transistor including: a transistor gate and an extended drain between the transistor gate and a transistor drain contact; a transistor source contact coupled to a source contact probe pad; a first dielectric layer covering the semiconductor substrate and the transistor gate; a source field plate on the first dielectric layer and coupled to a source field plate probe pad spaced from and electrically isolated from the source contact probe pad; and the source field plate capacitively coupled through the first dielectric layer to a first portion of the extended drain.

A wire bonding method includes bringing a capillary and a wire inserted through the capillary into pressure contact with a bonding point of a lead placed on an XY stage to bond the wire to the lead, including moving the XY stage in a state in which the capillary is in pressure contact with the lead to move the capillary along a movement locus including a plurality of arc portions.

In described examples, a method for encapsulating a semiconductor device includes the steps of immersing a layer of the semiconductor device in a liquid encapsulation material, irradiating portions of the liquid encapsulation material to polymerize the liquid encapsulation material, and moving the semiconductor device further from a surface of the liquid encapsulation material proximate to the layer. Immersing the semiconductor device is performed to cover a layer of the device in the liquid encapsulation material. Targeted locations of the liquid encapsulation material covering the layer are irradiated to form solid encapsulation material. The semiconductor device is moved from a surface of the liquid encapsulation material so that a new layer of the semiconductor device and/or of the solid encapsulation material can be covered by the liquid encapsulation material. The irradiating and moving steps are then repeated until a three dimensional structure on the semiconductor device is formed using the solid encapsulation material.

A package is disclosed. In one example, the package comprises a carrier, an electronic component mounted on the carrier, and an encapsulant encapsulating at least part of the electronic component and only part of the carrier so that another exposed part of the carrier is exposed with regard to the encapsulant. The exposed part of the carrier comprises an electric connection structure and a corrosion protection structure. One of the electric connection structure and the corrosion protection structure is selectively formed on only a sub-portion of the other one of the electric connection structure and the corrosion protection structure outside of the encapsulant.

Provided is a semiconductor package including: at least one first substrate including at least one first substrate terminal extended therefrom; at least one second substrate joined to the upper surface of the first substrate using ultrasonic welding; at least one semiconductor chip joined to the upper surface of the second substrate; a package housing covering the at least one semiconductor chip and an area of the second substrate, where ultrasonic welding is performed; and terminals separated from the first substrate, electrically connected to the at least one semiconductor chip through electric signals, and at least one of them is exposed to the outside of the package housing, wherein a thickness of the terminals formed inside the package housing is same as or smaller than a thickness of the first substrate and the second substrate includes at least one embossing groove on the upper surface thereof.

A semiconductor device package includes a first and a second input lead and a plurality of uniform transistor-based components, the plurality of uniform transistor-based components comprising a first subset of the uniform transistor-based components coupled to the first input lead and a second subset of the uniform transistor-based components coupled to the second input lead. The first subset and the second subset are arranged in an asymmetric configuration with respect to one another.