A semiconductor device comprises: a substrate including first and second buried source/drain layers; a first nano sheet stack including first nano sheets stacked in a direction vertical to the substrate; a second nano sheet stack including second nano sheets stacked in a direction vertical to the substrate; an isolation wall disposed between the first nano sheet stack and the second nano sheet stack; first gate covering portions of the first nano sheet stack and extending in a direction vertical to the substrate; second gate covering portions of the second nano sheet stack and extending in a direction vertical to the substrate; first common source/drain layers connected to end portions of the first nano sheets and to the first buried source/drain layers; and second common source/drain layers connected to end portions of the second nano sheets and to the second buried source/drain layers.

Vertical transistors and methods of manufacturing vertical transistors are disclosed. The method can include forming a stack of layers include a first layer stack of a first transistor structure including at least three layers of a conductive material separated by one or more layers of at least one dielectric material. The stack of layers can include a second layer stack of a second transistor structure including at least three layers of a conductive material separated by one or more layers of at least one dielectric material, the second layer stack associated with a second transistor structure. The first and second transistor structures are separated by one or more dielectric materials. The method can include forming a channel opening in the stack. The method includes selectively forming a first channel structure within the channel opening and selectively forming a second channel structure within the channel opening.

A method includes forming a p-well and an n-well in a substrate. The method further includes forming a stack of interleaving first semiconductor layers and second semiconductor layers over the p-well and the n-well, the first semiconductor layers having a first thickness and the second semiconductor layers having a second thickness different than the first thickness. The method further includes annealing the stack of interleaving semiconductor layers. The method further includes patterning the stack to form fin-shaped structures including a first fin-shaped structure over the n-well and a second fin-shaped structure over the p-well. The method further includes etching to remove the second semiconductor layers from the first and second fin-shaped structures, where the first semiconductor layers have a different thickness within each of the first and second fin-shaped structures after the etching. The method further includes forming a metal gate over the first and second fin-shaped structures.

A forksheet transistor device includes a dual dielectric pillar that includes a first dielectric and a second dielectric that is different from the first dielectric. The dual dielectric pillar physically separates pFET elements from nFET elements. For example, the first dielectric physically separates a pFET gate from a nFET gate while the second dielectric physically separates a pFET source/drain region from a nFET source drain region. When it is advantageous to electrically connect the pFET gate and the nFET gate, the first dielectric may be etched selective to the second dielectric to form a gate connector trench within the dual dielectric pillar. Subsequently, an electrically conductive gate connector strap may be formed within the gate connector trench to electrically connect the pFET gate and the nFET gate.

A semiconductor device includes: a substrate including first and second regions, first and second active patterns in the first and second regions, respectively; first source/drain patterns and a first channel pattern including first semiconductor patterns; second source/drain patterns and a second channel pattern including second semiconductor patterns; first and second gate electrodes on the first and second channel patterns, respectively; and a first gate dielectric layer and a second gate dielectric layer. The first gate dielectric layer includes a first interface layer between the first channel pattern and the first gate electrode, and a first high-k dielectric layer. The second gate dielectric layer includes a second interface layer and a second high-k dielectric layer between the second channel pattern and the second gate electrode. A thickness of the first high-k dielectric layer is greater than that of the second high-k dielectric layer. A thickness of the first semiconductor pattern is less than that of the second semiconductor pattern

Embodiments of this disclosure relate to methods for removing a dummy material from under a superlattice structure. In some embodiments, after removing the dummy material, it is replaced with a bottom dielectric isolation layer beneath the superlattice structure.

Semiconductor devices having improved gate electrode structures and methods of forming the same are disclosed. In an embodiment, a semiconductor device includes a gate structure over a semiconductor substrate, the gate structure including a high-k dielectric layer; an n-type work function layer over the high-k dielectric layer; an anti-reaction layer over the n-type work function layer, the anti-reaction layer including a dielectric material; a p-type work function layer over the anti-reaction layer, the p-type work function layer covering top surfaces of the anti-reaction layer; and a conductive cap layer over the p-type work function layer.

Multi-gate devices and methods for fabricating such are disclosed herein. An exemplary method includes forming a gate dielectric layer around first channel layers in a p-type gate region and around second channel layers in an n-type gate region. Sacrificial features are formed between the second channel layers in the n-type gate region. A p-type work function layer is formed over the gate dielectric layer in the p-type gate region and the n-type gate region. After removing the p-type work function layer from the n-type gate region, the sacrificial features are removed from between the second channel layers in the n-type gate region. An n-type work function layer is formed over the gate dielectric layer in the n-type gate region. A metal fill layer is formed over the p-type work function layer in the p-type gate region and the n-type work function layer in the n-type gate region.

A semiconductor device may include a substrate, an n-channel field-effect transistor positioned on the substrate, and a p-channel field-effect transistor positioned on the substrate. The n-channel field-effect transistor may include an n-type silicide source portion, an n-type silicide drain portion, and a first n-type channel region. The first n-type channel region may be positioned between the n-type silicide source portion and the n-type silicide drain portion and may directly contact each of the n-type silicide source portion and the n-type silicide drain portion.

A semiconductor device includes a substrate, a first semiconductor fin, a second semiconductor fin, an n-type epitaxy structure, a p-type epitaxy structure, and a plurality of dielectric fin sidewall structures. The first semiconductor fin is disposed on the substrate. The second semiconductor fin is disposed on the substrate and adjacent to the first semiconductor fin. The n-type epitaxy structure is disposed on the first semiconductor fin. The p-type epitaxy structure is disposed on the second semiconductor fin and separated from the n-type epitaxy structure. The dielectric fin sidewall structures are disposed on opposite sides of at least one of the n-type epitaxy structure and the p-type epitaxy structure.