H01L2027/11853

Input/output (I/O) devices with greater source/drain proximity than non-I/O devices

A semiconductor device includes a first FinFET device and a second FinFET device. The first FinFET device includes a first gate, a first source, and a first drain. The first FinFET device has a first source/drain proximity. The second FinFET device includes a second gate, a second source, and a second drain. The second FinFET device has a second source/drain proximity that is smaller than the first source/drain proximity. In some embodiments, \the first FinFET device is an Input/Output (I/O) device, and the second FinFET device is a non-I/O device such as a core device. In some embodiments, the greater source/drain proximity of the first FinFET device is due to an extra spacer of the first FinFET device that does not exist for the second FinFET device.

PROGRAMMABLE, SELF ASSEMBLING PATCHED NANOPARTICLES, AND ASSOCIATED DEVICES, SYSTEMS AND METHODS
20180208456 · 2018-07-26 · ·

The present invention generally relates to nanofabrication and, in some embodiments, to methods of synthesizing selectively binding patched nanoparticles and the devices that can be made from them. In some embodiments, the invention relates to methods of assembling arbitrarily shaped structures from patched nanocubes and the devices and uses that follow. For example, nanocube building blocks may be patched by stamping their faces with a selectively binding chemical species (e.g. DNA, antibody-antigen pairs, etc.), or by using self-assembly to attach to the nanocubes multiple selectively binding patch species whose immiscibility can be preprogrammed. Arbitrarily shaped structures can then be designed and assembled by deciding which faces will be bonded to each other in some target structure and combining nanocubes that have selectively binding patches on those faces. Other aspects of the invention are also directed to methods of making such nanocubes or other nanoparticles, methods of forming such nanocubes.

Cross-coupled transistor circuit defined on two gate electrode tracks

A first PMOS transistor is defined by a gate electrode extending along a first gate electrode track. A first NMOS transistor is defined by a gate electrode extending along a second gate electrode track. A second PMOS transistor is defined by a gate electrode extending along the second gate electrode track. A second NMOS transistor is defined by a gate electrode extending along the first gate electrode track. The gate electrodes of the first PMOS transistor and the first NMOS transistor are electrically connected to a first gate node. The gate electrodes of the second PMOS transistor and the second NMOS transistor are electrically connected to a second gate node. Each of the first PMOS transistor, the first NMOS transistor, the second PMOS transistor, and the second NMOS transistor has a respective diffusion terminal electrically connected to a common output node.

MULTIPLE VIA STRUCTURE FOR HIGH PERFORMANCE STANDARD CELLS

A MOS device of an IC includes pMOS and nMOS transistors. The MOS device further includes a first M.sub.x layer interconnect extending in a first direction and coupling the pMOS and nMOS transistor drains together, and a second M.sub.x layer interconnect extending in the first direction and coupling the pMOS and nMOS transistor drains together. The first and second M.sub.x layer interconnects are parallel. The MOS device further includes a first M.sub.x+1 layer interconnect extending in a second direction orthogonal to the first direction. The first M.sub.x+1 layer interconnect is coupled to the first M.sub.x layer interconnect and the second M.sub.x layer interconnect. The MOS device further includes a second M.sub.x+1 layer interconnect extending in the second direction. The second M.sub.x+1 layer interconnect is coupled to the first M.sub.x layer interconnect and the second M.sub.x layer interconnect. The second M.sub.x+1 layer interconnect is parallel to the first M.sub.x+1 layer interconnect.

Semiconductor Chip Including Integrated Circuit Having Cross-Coupled Transistor Configuration and Method for Manufacturing the Same
20180175061 · 2018-06-21 ·

A first conductive structure forms gate electrodes of a first transistor of a first transistor type and a first transistor of a second transistor type. A second conductive structure forms a gate electrode of a second transistor of the first transistor type. A third conductive structure forms a gate electrode of a second transistor of the second transistor type. A fourth conductive structure forms a gate electrode of a third transistor of the first transistor type. A fifth conductive structure forms a gate electrode of a third transistor of the second transistor type. A sixth conductive structure forms gate electrodes of a fourth transistor of the first transistor type and a fourth transistor of the second transistor type. The second and third transistors of the first transistor type and the second and third transistors of the second transistor type are electrically connected to form a cross-coupled transistor configuration.

HIGH PERFORMANCE SEMICONDUCTOR DEVICES USING MULTI-BRIDGE-CHANNEL FIELD EFFECT TRANSISTORS
20240387552 · 2024-11-21 ·

A semiconductor device includes: an active pattern extending on a substrate in a first direction; first to fourth channel structures stacked, in order, on one region of the active pattern; first to fourth gate structure respectively crossing the first to fourth channel structures, and extending in a second direction; first to fourth source/drain patterns, respectively, connected to both ends of the first to fourth channel structures; a plurality of upper contact vias electrically connecting each of a plurality of upper wiring lines to at least one of the first to fourth source/drain patterns; a plurality of lower wiring lines disposed on a lower surface of the substrate; and a plurality of lower contact vias penetrating through the substrate and electrically connecting each of the plurality of lower wiring lines to at least one of the first to fourth source/drain patterns.

Semiconductor chip including integrated circuit having cross-coupled transistor configuration and method for manufacturing the same

A first conductive structure forms gate electrodes of a first transistor of a first transistor type and a first transistor of a second transistor type. A second conductive structure forms a gate electrode of a second transistor of the first transistor type. A third conductive structure forms a gate electrode of a second transistor of the second transistor type. A fourth conductive structure forms a gate electrode of a third transistor of the first transistor type. A fifth conductive structure forms a gate electrode of a third transistor of the second transistor type. A sixth conductive structure forms gate electrodes of a fourth transistor of the first transistor type and a fourth transistor of the second transistor type. The second and third transistors of the first transistor type and the second and third transistors of the second transistor type are electrically connected to form a cross-coupled transistor configuration.