An integrated circuit device includes a substrate, and a unit cell on the substrate. The unit cell defines a unit cell area including at least two discrete devices. The unit cell includes a routing layer configured to route a signal and a voltage to the at least two discrete devices, the routing layer including a signal line and a voltage line extending in a first direction, and the signal line and the voltage line spaced apart from each other in a second direction, and a metal line stack including metal lines stacked between the unit cell area and the routing layer in the first direction. A plurality of contact vias are each configured to connect at least two adjacent ones of the signal line, the voltage line, the metal lines and the at least two discrete devices, in a third direction.

Provided are an integrated circuit including a first standard cell including a first metal layer including a plurality of tracks respectively extending in a first horizontal direction and spaced apart from each other in a second horizontal direction, a jog pattern that includes a conductive pattern formed on a track selected from the plurality of tracks, and a connection pattern formed off the plurality of tracks, a plurality of gate lines respectively extending in the second horizontal direction, and a gate contact configured to connect a gate line selected from the plurality of gate lines to the first metal layer to connect the connection pattern to the selected gate line, and a method for fabricating the same.

An integrated circuit including a plurality of stacked metal layers and a method of manufacturing the integrated circuit are provided. The method includes: providing a plurality of standard cells, each of which includes cell patterns respectively formed on the plurality of metal layers; and forming, on a particular metal layer among the plurality of metal layers which includes patterns extending in a first direction that are respectively formed on a plurality of tracks that are spaced apart from each other in a second direction, an additional pattern between adjacent patterns formed on a particular track of the plurality of tracks based on an interval between the adjacent patterns exceeding a reference value.

Semiconductor devices may include standard cells arranged in a first direction and a second direction intersecting the first direction. Both the first and second directions may be parallel to an upper surface of the substrate. Each of the standard cells may include semiconductor elements. The semiconductor device may also include filler cells between two standard cells, and each of the filler cells may include a filler active region and a filler contact connected to the filler active region and may extend in the first direction. The semiconductor device may further include a lower wiring pattern electrically connected to at least one of the semiconductor elements and may extend into at least one of the filler cells in the second direction, and the filler contacts may include wiring filler contacts lower than the lower wiring pattern and connected to at least one of the lower wiring pattern.

A method of forming an integrated circuit includes placing a first cell layout design of the integrated circuit on a layout design, and manufacturing the integrated circuit based on the layout design. Placing the first cell layout design includes placing a first active region layout pattern adjacent to a first cell boundary, placing a second active region layout pattern adjacent to a second cell boundary, and placing a first set of active region layout patterns between the first and second active region layout patterns, according to a first set of guidelines. The first set of guidelines includes selecting transistors of a first type with a first driving strength and transistors of a second type with a second driving strength. In some embodiments, the first, second and first set of active region layout patterns extend in the first direction, and are on a first layout level.

A cell layout implemented in an integrated circuit (IC) includes a first plurality of independent power posts in a first metal layer. Each independent power post of the plurality of independent power posts provides a power connection to one device of a plurality of devices within the cell layout. A source or drain of each device of the plurality of devices is connected to one independent power post of the plurality of independent power posts. The IC further includes a plurality of independent power straps in a second metal layer that is different from the first metal layer. Each independent power strap of the plurality of independent power straps spans across and connects to multiple independent power posts of the first plurality of independent power posts.

An integrated circuit includes first and second active regions extending in a first direction, a first gate line extending in a second direction substantially perpendicular to the first direction and crossing the first and second active regions, and a first contact jumper including a first conductive pattern intersecting the first gate line above the first active region and a second conductive pattern extending in the second direction above the first gate line and connected to the first conductive pattern.

The present disclosure relates to a semiconductor device and a manufacturing method, and more particularly to forming via rail and deep via structures to reduce parasitic capacitances in standard cell structures. Via rail structures are formed in a level different from the conductive lines. The via rail structure can reduce the number of conductive lines and provide larger separations between conductive lines that are on the same interconnect level and thus reduce parasitic capacitance between conductive lines.

A MOS IC may include a first contact interconnect in a first standard cell that extends in a first direction and contacts a first MOS transistor source and a voltage source. Still further, the MOS IC may include a first double diffusion break extending along a first boundary in the first direction of the first standard cell and a second standard cell. The MOS IC may also include a second contact interconnect extending over a portion of the first double diffusion break. In an aspect, the second contact interconnect may be within both the first standard cell and the second standard cell and coupled to the voltage source. Additionally, the MOS IC may include a third contact interconnect extending in a second direction orthogonal to the first direction and couples the first contact interconnect and the second contact interconnect together.

An integrated circuit includes at least one first conductive feature and at least one second conductive feature. The second conductive feature has at least one extension portion, and the extension portion of the second conductive feature is protruded from the projection of the first conductive feature on the second conductive feature. The integrated circuit further includes at least one third conductive feature, and at least one first conductive via electrically connecting the third conductive feature and the extension portion of the second conductive feature.