Patent classifications
H01L2224/05124
METHODS FOR MEASURING A MAGNETIC CORE LAYER PROFILE IN AN INTEGRATED CIRCUIT
An inductive structure may be manufactured with in-situ characterization of dimensions by forming a metal line on a top surface of a semiconductor die, forming a passivation dielectric layer over the metal line, measuring a height profile of a top surface of the passivation dielectric layer as a function of a lateral displacement, forming a magnetic material plate over the passivation dielectric layer, measuring a height profile of a top surface of the magnetic material plate as a function of the lateral displacement, and determining a thickness profile of the magnetic material plate by subtracting the height profile of the top surface of the passivation dielectric layer from the height profile of the top surface of the magnetic material plate. An inductive structure including the magnetic material plate and the metal line is formed.
DISPLAY DEVICE
A display device includes a first planarization film including an opening, a reflective film provided on an inclined surface inside the opening in the first planarization film, an LED chip surrounded by the reflective film and provided inside the opening, and a second planarization film provided on the first planarization film, surrounding the LED chip, and filling the opening, wherein a height from an upper end of the inclined surface of the first planarization film to an interface with air in the second planarization film is 20 μm or less.
Display panel, manufacturing method of display panel, and display device
A display panel, a manufacturing method thereof, and a display device are disclosed. The display panel includes: a base substrate, provided with a terminal and a terminal protection layer pattern; the terminal protection layer pattern includes a first shielding region and a first opening region, an orthographic projection of the first shielding region on the base substrate and an orthographic projection of the terminal on the base substrate have an overlapping region, the overlapping region is located at an edge of the orthographic projection of the terminal on the base substrate, and an orthographic projection of the first opening region on the base substrate is located in the orthographic projection of the terminal on the base substrate.
DISPLAY DEVICE
A display device includes a scan write line configured to receive a scan write signal, a scan initialization line configured to receive a scan initialization signal, a sweep signal line configured to receive a sweep signal, a first data line configured to receive a first data voltage, a second data line configured to receive a second data voltage, and a subpixel connected to the scan write line, the scan initialization line, the sweep signal line, the first data line, and the second data line. The subpixel includes a light-emitting element, a first pixel driver including a first transistor configured to generate a control current according to the first data voltage of the first data line, and a second pixel driver including an eighth transistor configured to generate a driving current applied to the light-emitting element according to the second data voltage.
Terminal configuration and semiconductor device
There is provided a terminal that includes a first conductive layer; a wiring layer on the first conductive layer; a second conductive layer on the wiring layer; and a conductive bonding layer which is in contact with a bottom surface and a side surface of the first conductive layer, a side surface of the wiring layer, a portion of a side surface of the second conductive layer, and a portion of a bottom surface of the second conductive layer, wherein an end portion of the second conductive layer protrudes from an end portion of the first conductive layer and an end portion of the wiring layer, and wherein the conductive bonding layer is in contact with a bottom surface of the end portion of the second conductive layer.
Terminal configuration and semiconductor device
There is provided a terminal that includes a first conductive layer; a wiring layer on the first conductive layer; a second conductive layer on the wiring layer; and a conductive bonding layer which is in contact with a bottom surface and a side surface of the first conductive layer, a side surface of the wiring layer, a portion of a side surface of the second conductive layer, and a portion of a bottom surface of the second conductive layer, wherein an end portion of the second conductive layer protrudes from an end portion of the first conductive layer and an end portion of the wiring layer, and wherein the conductive bonding layer is in contact with a bottom surface of the end portion of the second conductive layer.
SEMICONDUCTOR DEVICE
In a semiconductor device, a first wiring member is electrically connected to a first main electrode on a first surface of a semiconductor element, and a second wiring member is electrically connected to a second main electrode on a second surface of the semiconductor element. An encapsulating body encapsulates at least a part of each of the first and second wiring members, the semiconductor element and a bonding wire. The semiconductor element has a protective film on the first surface of the semiconductor substrate, and the pad has an exposed surface exposed from an opening of the protective film. The exposed surface includes a connection area to which the bonding wire is connected, and a peripheral area on a periphery of the connection area. The peripheral area has a surface that defines an angle of 90 degrees or less relative to a surface of the connection area.
SEMICONDUCTOR PACKAGES
A semiconductor package includes: a first semiconductor chip; a second semiconductor chip; and a bonding structure at an interface between the first and second semiconductor chips. The bonding structure includes: a first bonding insulating layer on the first semiconductor chip; a first connection pad in a first pad opening formed in the first bonding insulating layer, the first connection pad including a first pad layer, a first interface layer including a copper oxide, and a first capping layer; a second bonding insulating layer on the second semiconductor chip; and a second connection pad in a second pad opening formed in the second bonding insulating layer, the second connection pad including a second pad layer, a second interface layer including a copper oxide, and a second capping layer. The first and second capping layers include copper monocrystal layers having a (111) orientation.
DISPLAY DEVICE
A display device includes a substrate including a pad area, a first conductive pattern disposed in the pad area on the substrate, an insulating layer disposed on the first conductive pattern and overlapping the first conductive pattern, second conductive patterns disposed on the insulating layer, spaced apart from each other, and contacting the first conductive pattern through contact holes formed in the insulating layer, and a third conductive pattern disposed on the second conductive patterns and contacting the insulating layer.
Semiconductor device structure having protection caps on conductive lines
A semiconductor device structure is provided. The semiconductor device structure includes a first conductive line over a substrate. The semiconductor device structure includes a first protection cap over the first conductive line. The semiconductor device structure includes a first photosensitive dielectric layer over the substrate, the first conductive line, and the first protection cap. The semiconductor device structure includes a conductive via structure passing through the first photosensitive dielectric layer and connected to the first protection cap. The semiconductor device structure includes a second conductive line over the conductive via structure and the first photosensitive dielectric layer. The semiconductor device structure includes a second protection cap over the second conductive line. The semiconductor device structure includes a second photosensitive dielectric layer over the first photosensitive dielectric layer, the second conductive line, and the second protection cap.