Technology for a memory device having memory dies flip-chip bonded to one or more interposers that are mounted to a system board is disclosed. The memory device may be an SSD and the system board may be an M.2 board. A memory controller die may be bonded to one of the interposer boards. In one aspect, the memory controller die is flip-chip bonded to the interposer board. In one aspect, a heat sink is attached to a top surface of the flip-chip bonded controller die and to top surfaces of a group of the memory dies. Neither the memory dies nor the interposers are covered with a mold compound. Performance of the memory device is improved by, for example, lower inductance and improved heat dissipation.

Microelectronic integrated circuit package structures include a solder joint structure having a first portion on a die and a second portion on a substrate. The first portion comprises a first metal. An inner portion of the second portion comprises a second metal, and an outer portion of the second portion comprises an intermetallic compound (IMC) of the first and second metals.

In an embodiment, a device includes: a back-side redistribution structure including: a metallization pattern on a first dielectric layer; and a second dielectric layer on the metallization pattern; a through via extending through the first dielectric layer to contact the metallization pattern; an integrated circuit die adjacent the through via on the first dielectric layer; a molding compound on the first dielectric layer, the molding compound encapsulating the through via and the integrated circuit die; a conductive connector extending through the second dielectric layer to contact the metallization pattern, the conductive connector being electrically connected to the through via; and an intermetallic compound at the interface of the conductive connector and the metallization pattern, the intermetallic compound extending only partially into the metallization pattern.

Methods of manufacturing semiconductor packages. Implementations may include: providing a substrate with a first side, a second side, and a thickness; forming a plurality of pads on the first side of the substrate; and applying die attach material to the plurality of pads. The method may include bonding a wafer including a plurality of semiconductor die to the substrate at one or more die pads included in each die. The method may also include singulating the plurality of semiconductor die, overmolding the plurality of semiconductor die and the first side of the substrate with an overmold material, and removing the substrate to expose the plurality of pads and to form a plurality of semiconductor packages coupled together through the overmold material. The method also may include singulating the plurality of semiconductor packages to separate them.

A method of manufacturing, a carrier, and a semiconductor package are provided. The method involves depositing a plurality of conductive vias, applying a molding material over the lead frame, grinding the molding material to expose the plurality of conductive vias, and depositing a metalized pattern over the molding material. The carrier is manufacture by this method and the semiconductor package is formed based on the carrier.

A substrate for semiconductor elements includes a terminal part including a first surface, a second surface opposite to the first surface, and side surfaces joining the first surface and the second surface, and a resin part covering the side surfaces and exposing the first surface of the terminal part. The resin part has a multi-layer structure including a first resin and a second resin, and the first resin is provided in contact with the side surfaces of the terminal part. The first resin and the second resin include a filler, and an amount of the filler included in the first resin is smaller than an amount of the filler included in the second resin.

Forming the chip attachment system includes obtaining a chip having a bump core on a die. The method also includes obtaining an intermediate structure having a transfer pad on a substrate. The method further includes transferring the transfer pad from the substrate to the bump core such that the transfer pad becomes a solder layer on the bump core.

A micro light emitting diode (LED) chip includes: a first semiconductor layer doped with an N-type dopant; a second semiconductor layer provided at a lower surface of the first semiconductor layer, and doped with a P-type dopant; an active layer provided between the first semiconductor layer and the second semiconductor layer, and configured to emit light; and an electrode pad provided at a lower surface of the second semiconductor layer, wherein the electrode pad may include a groove structure having a depth that increases from an edge of the electrode pad towards a center of the electrode pad.

According to principles as taught herein, a leadframe array for a semiconductor die is prepared having locations to receive solder balls. Solder balls are then applied to the leadframe array, after which the leadframe array and solder ball combination is placed in a first mold and encased in a first molding compound. After the molding compound is cured, a layer of molding compound is removed to expose the solder balls. After this, a semiconductor die is electrically connected to the exposed solder balls. The combined semiconductor die and leadframe are placed in a second mold, and a second molding compound injected. The second molding compound flows around the semiconductor die and leadframe combination, fully enclosing the electrical connections between the leadframe and the semiconductor die, making the final package a twice-molded configuration. After this, the twice-molded semiconductor package array is cut at the appropriate locations to singulate the packages into individual products.

According to principles as taught herein, a leadframe array for a semiconductor die is prepared having locations to receive solder balls. Solder balls are then applied to the leadframe array, after which the leadframe array and solder ball combination is placed in a first mold and encased in a first molding compound. After the molding compound is cured, a layer of molding compound is removed to expose the solder balls. After this, a semiconductor die is electrically connected to the exposed solder balls. The combined semiconductor die and leadframe are placed in a second mold, and a second molding compound injected. The second molding compound flows around the semiconductor die and leadframe combination, fully enclosing the electrical connections between the leadframe and the semiconductor die, making the final package a twice-molded configuration. After this, the twice-molded semiconductor package array is cut at the appropriate locations to singulate the packages into individual products.