H01L2224/48233

Substrate for system in package (SIP) devices
10204890 · 2019-02-12 · ·

Methods, systems, and devices for enabling the use of a special, generic, or standard substrate for similar system SIP assemblies are disclosed. The required customization, which is defined by a system's interconnecting scheme, is done during package assembly by creating appropriate connections using wire bonds on pads that are placed on the substrate and intentionally left open for purpose of customization. The wire bond links can be changed as required for a given system design.

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING THROUGH SILICON PLUGS

A method of making a semiconductor device is provided including forming a first opening and a second opening in a first surface of a substrate. A conductive material is formed in the first opening and in the second opening and over the first surface in the first region of the substrate between the openings. A thickness of the substrate may be reduced from a second surface of the substrate, opposite the first surface, to a third surface opposite the first surface which exposes the conductive material in the first opening and the conductive material in the second opening. A light emitting diode (LED) device is connected to the third surface of the substrate.

Circuit package with internal and external shielding

A module includes a circuit package, which includes first and second electronic components on a substrate, internal and external shields, and a molded compound. The first electronic component includes a first die substrate with first electronic circuitry that generates electromagnetic radiation. The second electronic component includes a second die substrate with second electronic circuitry. The internal shield is electrically connected to ground and substantially covers a surface of the second die substrate facing away from the substrate, the internal shield being configured to shield the second electronic circuitry from the electromagnetic radiation generated by the first electronic circuitry. The molded compound is disposed over the substrate and the first and second electronic components, and the external shield is disposed on at least one outer surface of the circuit package and electrically connected to ground. The external shield is configured to protect the circuit package from external electromagnetic radiation and environmental stress.

Direct bonded copper power module with elevated common source inductance

A direct bonded copper (DBC) power module with elevated common source inductance is adapted for use as a half bridge in an electric drive for an electric vehicle. Etching patterns on the DBC substrates provide indented notches for concentrating magnetic flux in the power loops. Etched gate traces form gate loops with coil windings disposed within or overlapping the notches in order to enhanced the common source inductance for each switching transistor (such as an IGBT). Switching loss is reduced and fuel economy is improved for the electric vehicle with minimal impact on packaging size and at no additional cost.

Method of manufacturing a semiconductor device including through silicon plugs

A method of making a semiconductor device is provided including forming a first opening and a second opening in a first surface of a substrate. A conductive material is formed in the first opening and in the second opening and over the first surface in the first region of the substrate between the openings. A thickness of the substrate may be reduced from a second surface of the substrate, opposite the first surface, to a third surface opposite the first surface which exposes the conductive material in the first opening and the conductive material in the second opening. A light emitting diode (LED) device is connected to the third surface of the substrate.

High voltage polymer dielectric capacitor isolation device

An electronic isolation device is formed on a monolithic substrate and includes a plurality of passive isolation components. The isolation components are formed in three metal levels. The first metal level is separated from the monolithic substrate by an inorganic PMD layer. The second metal level is separated from the first metal level by a layer of silicon dioxide. The third metal level is separated from the second metal level by at least 20 microns of polyimide or PBO. The isolation components include bondpads on the third metal level for connections to other devices. A dielectric layer is formed over the third metal level, exposing the bondpads. The isolation device contains no transistors.

CIRCUIT PACKAGE WITH INTERNAL AND EXTERNAL SHIELDING

A module includes a circuit package, which includes first and second electronic components on a substrate, internal and external shields, and a molded compound. The first electronic component includes a first die substrate with first electronic circuitry that generates electromagnetic radiation. The second electronic component includes a second die substrate with second electronic circuitry. The internal shield is electrically connected to ground and substantially covers a surface of the second die substrate facing away from the substrate, the internal shield being configured to shield the second electronic circuitry from the electromagnetic radiation generated by the first electronic circuitry. The molded compound is disposed over the substrate and the first and second electronic components, and the external shield is disposed on at least one outer surface of the circuit package and electrically connected to ground. The external shield is configured to protect the circuit package from external electromagnetic radiation and environmental stress.

Semiconductor device, semiconductor chip, and method of manufacturing semiconductor device
09633969 · 2017-04-25 · ·

A semiconductor device includes a semiconductor chip including first to fourth pads, and first and second switches. The first switch includes first and second nodes coupled to the first and second pads and sends from the second node a current larger than a threshold flowing in from the first node. The second switch includes third and fourth nodes coupled to the third and fourth pads and sends from the fourth node a current larger than a threshold flowing in from the third node. The third and fourth nodes are not coupled to any nodes of high and low potentials of any circuit which receives the potentials to operate. A first wire is coupled to the first pad and the first conductor, and a second wire is coupled to the second pad and the second conductor.

SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
20170077060 · 2017-03-16 ·

A semiconductor device includes a semiconductor chip including first to fourth pads, and first and second switches. The first switch includes first and second nodes coupled to the first and second pads and sends from the second node a current larger than a threshold flowing in from the first node. The second switch includes third and fourth nodes coupled to the third and fourth pads and sends from the fourth node a current larger than a threshold larger flowing in from the third node. The third and fourth nodes are not coupled to any nodes of high and low potentials of any circuit which receives the potentials to operate. A first wire is coupled to the first pad and the first conductor, and a second wire is coupled to the second pad and the second conductor.