A semiconductor package includes a substrate, a first chip structure disposed on the substrate, a second chip structure disposed on the substrate, at least one controller disposed between the first chip structure and the second chip structure, the at least one controller including edge pads disposed on edges opposing each other in a first direction, and center pads disposed between the edge pads, and bonding wire structures. The substrate includes first bonding pads arranged in a second direction, perpendicular to the first direction, and second bonding pads arranged in the second direction in at least one of a space between the first bonding pads and the first chip structure and a space between the first bonding pads and the second chip structure. The bonding wire structures include a first bonding wire structure connecting the edge pads to the first bonding pads, and a second bonding wire structure connecting the center pads to the second bonding pads.

An embedded package structure, a preparation method therefor and a terminal are described. The embedded package structure includes a first dielectric layer. The first dielectric layer includes a first surface and a second surface. The embedded package structure includes a first device embedded in the first dielectric layer. A thermal conductive layer is attached to a surface of the first device that is exposed on the first surface of the first dielectric layer. A first circuit layer is connected to a surface of the first device that is exposed on the second surface. A second dielectric layer and a third dielectric layer are symmetrically disposed on two sides of the first dielectric layer.

To arrange a protective material horizontally with respect to a substrate plane without the protective material coming into contact with wires in a wire-bonded semiconductor package.

The semiconductor package includes a protective material, a substrate, bumps, and a semiconductor chip. The bumps are provided on a chip plane of the semiconductor chip and are connected to the substrate via wires. The semiconductor chip is laminated on the substrate. A support is provided on the chip plane to support the protective material at a position where the height from the chip plane of the semiconductor chip is higher than the bumps.

A package substrate may include first conductive patterns, a first insulation layer and a second insulation layer. The first conductive patterns may be electrically connected with a semiconductor chip. The first insulation layer may be on an upper surface and side surfaces of each of the first conductive patterns. The first insulation layer may include at least one opening under at least one of side surfaces of the semiconductor chip. The second insulation layer may be on a lower surface of each of the first conductive patterns. Thus, a gas generated from the DAF may be readily discharged through the opening. A spreading of a crack, which may be generated at the interface between the side surface of the semiconductor chip and the molding member, toward the conductive patterns of the package substrate may be limited and/or suppressed. Adhesion between the semiconductor chip and the molding member may be reinforced.

Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.

A semiconductor device package having galvanic isolation is provided. The semiconductor device package includes a package substrate having a first inductive coil. A first semiconductor die is attached to a first major surface of the package substrate. The first semiconductor die includes a second inductive coil substantially aligned with the first inductive coil. A second semiconductor die is attached to the first major surface of the package substrate. A wireless communication link between the first semiconductor die and the second semiconductor die is formed by way of the first and second inductive coils.

A semiconductor device package having galvanic isolation is provided. The semiconductor device includes a package substrate having a first inductive coil formed from a first conductive layer and a second inductive coil formed from a second conductive layer. The first conductive layer and the second conductive layer are separated by a non-conductive material. A first semiconductor die is attached to a first major side of the package substrate. The first semiconductor die is conductively interconnected to the first inductive coil. A second semiconductor die is attached to the first major side of the package substrate. A first wireless communication link between the first semiconductor die and the second semiconductor die is formed by way of the first and second inductive coils.

A chip package structure and an electronic equipment may reduce probability of short circuit failure during chip packaging and improve chip reliability. The chip package structure includes: a chip, a substrate, and a lead; the chip is disposed above the substrate; wherein the chip includes a pin pad and a test metal key, and the lead is configured to electrically connect the pin pad and the substrate; the test metal key is disposed in an edge region of the chip that is not under the lead.

For a pressure-sensor assembly, including a carrier substrate having conductor tracks disposed on a first side of the carrier substrate, a pressure-sensor element that is mounted on the first side of the carrier substrate and is electrically contacted via a bonding-wire connection to a conductor track located on the first side of the carrier substrate, as well as a frame part having a full-perimeter frame wall, the frame part being positioned on the first side of the carrier substrate around the pressure-sensor element, and the frame part being filled with a gel covering the pressure-sensor element, it is provided that in addition to the full-perimeter frame wall, the frame part has a base which is positioned on at least one conductor track disposed on the first side of the carrier substrate.

A semiconductor package may include a package substrate, a support structure on the package substrate and having a cavity therein, and at least one first semiconductor chip on the package substrate in the cavity. The support structure may have a first inner sidewall facing the cavity, a first top surface, and a first inclined surface connecting the first inner sidewall and the first top surface. The first inclined surface may be inclined with respect to a top surface of the at least one first semiconductor chip.